2 修订历史记录

Changes from May 29, 2014 to September 28, 2018

• 更新了Section 1.1特性Go
• 更新了Section 1.3说明Go
• Added Section 3.1, Related ProductsGo
• Corrected the port number (P4.2) on pin 61 in Figure 4-2, 100-Pin PZ Package (Top View)Go
• Added note to P1.3/ADC10CLK/A3 (pin 8) in Table 4-3, Terminal Functions – PEU PackageGo
• Added typical conditions statements at the beginning of Section 5, SpecificationsGo
• Added SD24_B input pins and AUXVCCx pins to exception list on "Voltage applied to pins" parameter, and added SD24_B input pin limits in "Diode current at pins" parameter in Section 5.1, Absolute Maximum RatingsGo
• Added Section 5.2, ESD RatingsGo
• Added Section 5.7, Thermal Resistance CharacteristicsGo
• Updated notes (1) and (2) and added note (3) in Table 5-1, Wake-up Times From Low-Power Modes and ResetGo
• Changed the TYP value of the C_L,eff parameter with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF in Table 5-2, Crystal Oscillator, XT1, Low-Frequency ModeGo
• Corrected bit name in Test Conditions of R_CHARGE parameter (changed CHCx to AUXCHCx) in Table 5-25, Auxiliary Supplies, Charge Limiting ResistorGo
• Replaced f_Frame parameter with f_LCD, f_FRAME,4mux, and f_FRAME,8mux parameters in Table 5-37, LCD_C, Operating ConditionsGo
• On the V_ID,FS parameter in Table 5-39, SD24_B Power Supply and Recommended Operating Conditions: Changed the MIN value from "V_REF/GAIN" to "–V_REF/GAIN"; Removed "Unipolar mode" test condition (mode is not supported)Go
• Removed ADC10DIV from the formula for the TYP value in the second row of the t_CONVERT parameter in Table 5-48, 10-Bit ADC, Switching Characteristics, because ADC10CLK is after divisionGo
• Changed Test Conditions for all parameters in Table 5-49, 10-Bit ADC Linearity Parameters: Removed "V_REF–"; Changed from "(V_eREF+ – V_eREF–)min ≤ (V_eREF+ – V_eREF–)" to "1.4 V ≤ (V_eREF+ – V_eREF–)"; Changed from "C_VREF+ = 20 pF" to "C_VeREF+ = 20 pF"; Added "C_VeREF+ = 20 pF" to E_I; Added "ADC10SREFx = 11b" to E_T and E_GGo
• Changed from "V_REF–/V_eREF–" to "V_eREF–" in Test Conditions for V_eREF+, V_eREF–, and (V_eREF+ – V_eREF–) parameters in Table 5-50, 10-Bit ADC, External ReferenceGo
• Changed the MIN value of A_VCC(min) with Test Conditions of "REFVSEL = {0} for 1.5 V" from 2.2 V to 1.8 V in Table 5-51, REF Built-In ReferenceGo
• Changed the MAX value of the t_{EN_CMP} parameter with Test Conditions of "CBPWRMD = 10" from 50 µs to 100 µs in Table 5-52, Comparator_BGo
• Corrected the name of the RTC module (changed from RTC_CE to RTC_C) in Figure 6-1, Functional Block Diagram – PEU PackageGo
• Corrected the name of the RTC module (changed from RTC_CE to RTC_C) in Figure 6-2, Functional Block Diagram – PZ PackageGo
• Throughout document, changed all instances of "bootstrap loader" to "bootloader"Go
• Corrected spelling of NMIIFG in Table 6-13, System Module Interrupt Vector RegistersGo
• Deleted mention of counter mode in Section 6.11.22, Real-Time Clock (RTC_C) (feature is not supported in this device)Go
• 已将先前的“开发工具支持”部分替换为“Section 8.3、工具与软件”Go
• 更改了格式并在Section 8.4文档支持 中添加了内容Go