ZHCSF32E February 2016 – December 2019 MSP430FR2310 , MSP430FR2311
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | VCC | MIN | MAX | UNIT | |
---|---|---|---|---|---|---|
tSTE,LEAD | STE lead time, STE active to clock | 2.0 V | 55 | ns | ||
3.0 V | 45 | |||||
tSTE,LAG | STE lag time, last clock to STE inactive | 2.0 V | 20 | ns | ||
3.0 V | 20 | |||||
tSTE,ACC | STE access time, STE active to SOMI data out | 2.0 V | 65 | ns | ||
3.0 V | 40 | |||||
tSTE,DIS | STE disable time, STE inactive to SOMI high impedance | 2.0 V | 40 | ns | ||
3.0 V | 35 | |||||
tSU,SI | SIMO input data setup time | 2.0 V | 8 | ns | ||
3.0 V | 6 | |||||
tHD,SI | SIMO input data hold time | 2.0 V | 12 | ns | ||
3.0 V | 12 | |||||
tVALID,SO | SOMI output data valid time(2) | UCLK edge to SOMI valid,
CL = 20 pF |
2.0 V | 68 | ns | |
3.0 V | 42 | |||||
tHD,SO | SOMI output data hold time (3) | CL = 20 pF | 2.0 V | 5 | ns | |
3.0 V | 5 |
Table 5-19 lists the switching characteristics of the eUSCI (I2C mode).