米6体育平台手机版

ZHCSTL4B October 2023 – May 2024 MSPM0C1103 , MSPM0C1104

PRODUCTION DATA

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)

DYY|16
DDF|8
RUK|20
PW|20
DGS|20
DSG|8

散热焊盘机械数据 (封装 | 引脚)

订购信息

7.11.3 Linearity Parameters

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all linearity parameters are measured using 12-bit resolution mode (unless otherwise noted) ⁽¹⁾

PARAMETER		TEST CONDITIONS	MIN	MAX	UNIT
E_I	Integral linearity error (INL)	VDD reference, 10-bit ⁽²⁾	-1.0	+1.0	LSB
E_I	Integral linearity error (INL)	VDD reference, 12-bit ⁽²⁾	-4.0	+4.0	LSB
E_D	Differential linearity error (DNL)	VDD reference, 10-bit ⁽²⁾	-1.0	+1.0	LSB
E_D	Differential linearity error (DNL)	VDD reference, 12-bit ⁽²⁾	-1.0	+4.0	LSB
E_O	Offset error	VDD reference, 10-bit ⁽²⁾	-3	3	mV
E_O	Offset error	VDD reference, 12-bit ⁽²⁾	-3	3	mV
E_G	Gain error	VDD reference, 10-bit ⁽²⁾	-5	5	LSB
E_G	Gain error	VDD reference, 12-bit ⁽²⁾	-25	25	LSB

(1) Total Unadjusted Error (TUE) can be calculated from E_I, E_O, and E_Gusing the following formula: TUE = √( E_I²+ |E_O|²+ E_G²)
Note: You must convert all of the errors into the same unit, usually LSB, for the above equation to be accurate

(2) VDD reference specifications are measured with V_R+ = VDD and V_R- = VSS = 0V.