over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all linearity parameters are measured using 12-bit resolution mode (unless otherwise noted) (1)
| PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
| EI |
Integral linearity error (INL) |
VDD reference, 10-bit (2) |
-1.0 |
|
+1.0 |
LSB |
| VDD reference, 12-bit (2) |
-4.0 |
|
+4.0 |
LSB |
| ED |
Differential linearity error (DNL) |
VDD reference, 10-bit (2) |
-1.0 |
|
+1.0 |
LSB |
| VDD reference, 12-bit (2) |
-1.0 |
|
+4.0 |
LSB |
| EO |
Offset error |
VDD reference, 10-bit (2) (3) |
-3 |
|
3 |
mV |
| VDD reference, 12-bit (2) (3) |
-3 |
|
3 |
mV |
| EG |
Gain error |
VDD reference, 10-bit (2) |
-5 |
|
5 |
LSB |
| VDD reference, 12-bit (2) |
-25 |
|
25 |
LSB |
(1) Total Unadjusted Error (TUE) can be calculated from EI , EO , and EG using the following formula: TUE = √( EI2 + |EO|2 + EG2 )
Note: You must convert all of the errors into the same unit, usually LSB, for the above equation to be accurate
(2) VDD reference specifications are measured with VR+ = VDD and VR- = VSS = 0V.
(3) Offset error achieves +/-3mV after software calibration