ZHCSTL6A October 2023 – July 2024 MSPM0C1103-Q1 , MSPM0C1104-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
Supply | ||||||
VDDPGM/ERASE | Program and erase supply voltage | 1.62 | 3.6 | V | ||
IDDERASE | Supply current from VDD during erase operation | Supply current delta | 2 | mA | ||
IDDPGM | Supply current from VDD during program operation | Supply current delta | 2.5 | mA | ||
Endurance | ||||||
NWEC(LOWER) | Erase/program cycle endurance | 100 | k cycles | |||
NE(MAX) | Total erase operations before failure (1) | 802 | k erase operations | |||
NW(MAX) | Write operations per word line before sector erase (1) | 83 | write operations | |||
Retention | ||||||
tRET_85 | Flash memory data retention | -40°C <= Tj <= 85°C | 60 | years | ||
tRET_105 | Flash memory data retention | -40°C <= Tj <= 105°C | 11.4 | years | ||
tRET_130 | Flash memory data retention | -40°C <= Tj <= 130°C | 2.4 | years | ||
Program and Erase Timing | ||||||
tPROG (WORD, 64) | Program time for flash word (2) | 40 | µs | |||
tPROG (SEC, 64) | Program time for 1kB sector | 5.1 | ms | |||
tERASE (SEC) | Sector erase time | <10k erase/program cycles | 20 | 200 | ms | |
tERASE (BANK) | Bank erase time | <10k erase/program cycles | 22 | 220 | ms |