6 Specifications
6.1 Absolute Maximum Ratings
at GND = 0 V and all voltages related to ground (unless otherwise noted)(1) (2)
|
MIN |
MAX |
UNIT |
Core voltage |
VCCINT |
–0.5 |
1.8 |
V |
I/O voltage |
VCCIO |
–0.5 |
3.75 |
V |
PLL digital supply |
VCCD_PLL |
–0.5 |
4.5 |
V |
PLL Analog supply |
VCCA |
–0.5 |
3.75 |
V |
Input voltage at input pins, VI |
–0.5 |
4.2 |
V |
Output current from output pins, IOUT |
–25 |
40 |
mA |
Operating junction temperature, TJ |
–40 |
125 |
°C |
Storage temperature range, Tstg |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to the device ground.
6.2 ESD Ratings
|
MIN |
MAX |
UNIT |
V(ESD) |
Electrostatic discharge |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) |
|
2000 |
V |
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) |
|
500 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
at GND = 0 V and all voltages related to ground (unless otherwise noted)
|
MIN |
NOM |
MAX |
UNIT |
VCCINT |
Core voltage |
1.15 |
1.2 |
1.25 |
V |
VCCIO |
I/O voltage |
1.8-V operation |
1.71 |
1.8 |
1.89 |
V |
2.5-V operation |
2.375 |
2.5 |
2.625 |
|
3.3-V operation |
3.135 |
3.3 |
3.465 |
V |
VCCD_PLL |
PLL digital supply |
1.16 |
1.2 |
1.24 |
V |
VCCA |
PLL Analog supply |
2.375 |
2.5 |
2.625 |
V |
VI |
Input voltage at input pins |
–0.3 |
|
VCCIO(1) + 0.3 |
V |
TJ |
Operating junction temperature |
0 |
|
85 |
°C |
tRAMP |
Power-supply ramp time |
50 |
|
3000 |
µs |
(1) VCCIO is the corresponding bank voltage
6.4 Thermal Information
THERMAL METRIC(1) |
OPT9221 |
UNIT |
ZVM (NFBGA) |
256 BALLS |
RθJA |
Junction-to-ambient thermal resistance |
30.6 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance |
7.6 |
RθJB |
Junction-to-board thermal resistance |
16.0 |
(1) For more information about traditional and new thermal metrics, see the
IC Package Thermal Metrics application report,
SPRA953.
6.5 Electrical Characteristics
PARAMETER |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
1.8-V CMOS I/Os |
VIH |
High-level input threshold |
|
0.65 × VCCIO(1) |
|
|
V |
VIL |
Low-level input threshold |
|
|
|
0.35 × VCCIO |
V |
VOH |
High-level output voltage |
|
VCCIO – 0.45 |
|
|
V |
VOL |
Low-level output voltage |
|
|
|
0.45 |
V |
Ilkg |
Input pin leakage current(2) |
|
–10 |
|
10 |
µA |
IOH |
High-level output current |
|
|
|
–2 |
mA |
IOL |
Low-level output current |
|
|
|
2 |
mA |
3.3-V LVCMOS I/Os |
VIH |
High-level input voltage |
|
1.7 |
|
|
V |
VIL |
Low-level input voltage |
|
|
|
0.8 |
V |
VOH |
High-level output voltage |
|
VCCIO – 0.2 |
|
|
V |
VOL |
Low-level output voltage |
|
|
|
0.2 |
V |
Ilkg |
Input pin leakage current(2) |
|
–10 |
|
10 |
µA |
IOH |
High-level output current |
|
|
|
–2 |
mA |
IOL |
Low-level output current |
|
|
|
2 |
mA |
(1) VCCIO is the corresponding bank voltage.
(2) For, 0 < Input voltage < VCCIO.
6.6 Timing Requirements
PARAMETER |
MIN |
TYP |
MAX |
UNIT |
SYSCLK_IN |
System input clock frequency |
|
6 |
|
MHz |
|
12 |
|
MHz |
|
24 |
|
MHz |
|
48 |
|
MHz |
Duty cycle |
40% |
|
60% |
|
SYSCLK_FREQ |
Internal system clock frequency |
|
48 |
|
MHz |
VD_IN |
VD_IN pulse duration |
40 |
|
|
ns |
RESET |
RESET pulse duration |
40 |
|
|
ns |
I2C clock |
Slave I2C interface clock frequency |
|
400 |
|
KHz |
Master I2C interface clock frequency |
|
400 |
|
KHz |
|
Sensor I2C interface clock frequency |
|
400 |
|
KHz |
PARALLEL CMOS MODE (Assuming default OP_CLK polarity) |
tsu |
Data setup time |
Data valid to zero crossing of CLKOUT |
5 |
|
|
ns |
th |
Data hold time |
Zero crossing of CLKOUT to data becoming invalid |
20 |
|
|
ns |