ZHCSSS4 august 2023 REF35-Q1
PRODUCTION DATA
The REF35-Q1 is designed and tested for a low output voltage temperature coefficient, which is defined as the change in output voltage over temperature. The temperature coefficient is calculated using the box method in which a box is formed by the minimum/maximum limits for the nominal output voltage over the operating temperature range. REF35-Q1 has a low maximum temperature coefficient of 15 ppm/°C from –40°C to +125°C. The box method specifies limits for the temperature error but does not specify the exact shape and slope of the device under test. Due to temperature curvature correction to achieve low-temperature drift, the temperature drift is expected to be non-linear. See TI's Analog Design Journal, Precision voltage references, for more information on the box method. Use Equation 1 for the box method.
Figure 8-3 shows a typical voltage versus temperature curves for various reference voltages.