ZHCSK05D July 2019 – October 2022 SN3257-Q1
PRODUCTION DATA
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Parameter Measurement Information
- 7.1 On-Resistance
- 7.2 Off-Leakage Current
- 7.3 On-Leakage Current
- 7.4 IPOFF Leakage Current
- 7.5 Transition Time
- 7.6 tON (EN) and tOFF (EN) Time
- 7.7 tON (VDD) and tOFF (VDD) Time
- 7.8 Break-Before-Make Delay
- 7.9 Propagation Delay
- 7.10 Skew
- 7.11 Charge Injection
- 7.12 Capacitance
- 7.13 Off Isolation
- 7.14 Channel-to-Channel Crosstalk
- 7.15 Bandwidth
- 8 Detailed Description
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
7.12 Capacitance
The parasitic capacitance of the device is captured at the source (Sx), drain (Dx), and select (SELx) pins. The capacitance is measured in both the ON and OFF state and is denoted by the symbol CON and COFF. Figure 7-12 shows the setup used to measure capacitance.
Figure 7-12 Capacitance Measurement Setup