ZHCSK05D July 2019 – October 2022 SN3257-Q1
PRODUCTION DATA
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Parameter Measurement Information
- 7.1 On-Resistance
- 7.2 Off-Leakage Current
- 7.3 On-Leakage Current
- 7.4 IPOFF Leakage Current
- 7.5 Transition Time
- 7.6 tON (EN) and tOFF (EN) Time
- 7.7 tON (VDD) and tOFF (VDD) Time
- 7.8 Break-Before-Make Delay
- 7.9 Propagation Delay
- 7.10 Skew
- 7.11 Charge Injection
- 7.12 Capacitance
- 7.13 Off Isolation
- 7.14 Channel-to-Channel Crosstalk
- 7.15 Bandwidth
- 8 Detailed Description
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
7.6 tON (EN) and tOFF (EN) Time
The tON (EN) time is defined as the time taken by the output of the device to rise to 90% after the enable has fallen past the logic threshold. The 90% measurement is used to provide the timing of the device being enabled in the system. Figure 7-6 shows the setup used to measure the enable time, denoted by the symbol tON (EN).
The tOFF (EN) time is defined as the time taken by the output of the device to fall to 90% after the enable has fallen past the logic threshold. The 90% measurement is used to provide the timing of the device being disabled in the system. Figure 7-6 shows the setup used to measure enable time, denoted by the symbol tOFF (EN).
Figure 7-6 tON (EN) and tOFF (EN) Time Measurement Setup