SDLS032H December 1983 – September 2016 SN5407 , SN5417 , SN7407 , SN7417
PRODUCTION DATA.
请参考 PDF 数据表获取器件具体的封装图。
For related documentation see the following:
The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy.
PARTS | PRODUCT FOLDER | SAMPLE & BUY | TECHNICAL DOCUMENTS | TOOLS & SOFTWARE | SUPPORT & COMMUNITY |
---|---|---|---|---|---|
SN5407 | Click here | Click here | Click here | Click here | Click here |
SN5417 | Click here | Click here | Click here | Click here | Click here |
SN7407 | Click here | Click here | Click here | Click here | Click here |
SN7417 | Click here | Click here | Click here | Click here | Click here |
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert meto register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.
E2E is a trademark of Texas Instruments.
Blu-ray Disc is a registered trademark of Blue-ray Disc Association.
All other trademarks are the property of their respective owners.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.