ZHCSOE1F April 2002 – July 2021 SN65C3221 , SN75C3221
PRODUCTION DATA
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Pin Configuration and Functions
-
6 Specifications
- 6.1 Absolute Maximum Ratings
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions (1)
- 6.4 Electrical Characteristics
- 6.5 Electrical Characteristics - Driver
- 6.6 Switching Characteristics - Driver
- 6.7 Electrical Characteristics - Receiver
- 6.8 Switching Characteristics - Receiver
- 6.9 Electrical Characteristics - Auto-Powerdown
- 6.10 Switching Characteristics - Auto-Powerdown
- 7 Parameter Measurement Information
- 8 Detailed Description
- 9 Application and Implementation
- 10Device and Documentation Support
- 11Mechanical, Packaging, and Orderable Information
封装选项
请参考 PDF 数据表获取器件具体的封装图。
机械数据 (封装 | 引脚)
- PW|16
- DB|16
散热焊盘机械数据 (封装 | 引脚)
订购信息
10.4 Electrostatic Discharge Caution
 |
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |