ZHCSAT9I september   2012  – october 2020 SN65DSI83

PRODUCTION DATA  

  1.   1
  2. 1 特性
  3. 2 应用
  4. 3 说明
  5. 4 Revision History
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings #GUID-BDB96F65-5C5F-4805-AA4B-B71B15ADA38F/SLLSEB91839
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Switching Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Clock Configurations and Multipliers
      2. 7.3.2 ULPS
      3. 7.3.3 LVDS Pattern Generation
    4. 7.4 Device Functional Modes
      1. 7.4.1 Reset Implementation
      2. 7.4.2 Initialization Sequence
      3. 7.4.3 LVDS Output Formats
      4. 7.4.4 DSI Lane Merging
      5. 7.4.5 DSI Pixel Stream Packets
      6. 7.4.6 DSI Video Transmission Specifications
    5. 7.5 Programming
      1. 7.5.1 Local I2C Interface Overview
    6. 7.6 Register Maps
      1. 7.6.1 Control and Status Registers Overview
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Video STOP and Restart Sequence
      2. 8.1.2 Reverse LVDS Pin Order Option
      3. 8.1.3 IRQ Usage
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Example Script
      3. 8.2.3 Application Curve
  10. 9 Power Supply Recommendations
    1. 9.1 VCC Power Supply
    2. 9.2 VCORE Power Supply
  11. 10Layout
    1. 10.1 Layout Guidelines
      1. 10.1.1 Package Specific
      2. 10.1.2 Differential Pairs
      3. 10.1.3 Ground
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Community Resources
    3. 11.3 Trademarks
  13.   Mechanical, Packaging, and Orderable Information

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7.3.3 LVDS Pattern Generation

The SN65DSI83 device supports a pattern generation feature on LVDS channels. This feature can be used to test the LVDS output path and LVDS panels in a system platform. The pattern generation feature can be enabled by setting the CHA_TEST_PATTERN bit at address 0x3C. No DSI data is received while the pattern generation feature is enabled.

There are three modes available for LVDS test pattern generation. The mode of test pattern generation is determined by register configuration, as shown in Table 7-1.

Table 7-1 Video Registers
ADDRESS BITREGISTER NAME
0x20.7:0CHA_ACTIVE_LINE_LENGTH_LOW
0x21.3:0CHA_ACTIVE_LINE_LENGTH_HIGH
0x24.7:0CHA_VERTICAL_DISPLAY_SIZE_LOW
0x25.3:0CHA_VERTICAL_DISPLAY_SIZE_HIGH
0x2C.7:0CHA_HSYNC_PULSE_WIDTH_LOW
0x2D.1:0CHA_HSYNC_PULSE_WIDTH_HIGH
0x30.7:0CHA_VSYNC_PULSE_WIDTH_LOW
0x31.1:0CHA_VSYNC_PULSE_WIDTH_HIGH
0x34.7:0CHA_HORIZONTAL_BACK_PORCH
0x36.7:0CHA_VERTICAL_BACK_PORCH
0x38.7:0CHA_HORIZONTAL_FRONT_PORCH
0x3A.7:0CHA_VERTICAL_FRONT_PORCH
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