ZHCSJ17H November   2002  – November 2018 SN65HVD233 , SN65HVD234 , SN65HVD235

PRODUCTION DATA.  

  1. 1 特性
  2. 2 应用
  3. 3 说明
    1.     Device Images
      1.      方框图
  4. 4 修订历史记录
  5. 5 （说明 （续））
  6. 6 Device Comparison Table
  7. 7 Pin Configuration and Functions
    1.     Pin Functions
  8. 8 Specifications
    1. 8.1  Absolute Maximum Ratings
    2. 8.2  ESD Ratings
    3. 8.3  Recommended Operating Conditions
    4. 8.4  Thermal Information
    5. 8.5  Power Dissipation Ratings
    6. 8.6  Electrical Characteristics: Driver
    7. 8.7  Electrical Characteristics: Receiver
    8. 8.8  Switching Characteristics: Driver
    9. 8.9  Switching Characteristics: Receiver
    10. 8.10 Switching Characteristics: Device
    11. 8.11 Typical Characteristics
  9. 9 Parameter Measurement Information
  10. 10Detailed Description
    1. 10.1 Overview
    2. 10.2 Functional Block Diagrams
    3. 10.3 Feature Description
      1. 10.3.1 Diagnostic Loopback (SN65HVD233)
      2. 10.3.2 Autobaud Loopback (SN65HVD235)
      3. 10.3.3 Slope Control
      4. 10.3.4 Standby
      5. 10.3.5 Thermal Shutdown
    4. 10.4 Device Functional Modes
      1. 10.4.1 Driver and Receiver
  11. 11Application and Implementation
    1. 11.1 Application Information
    2. 11.2 Typical Application
      1. 11.2.1 Design Requirements
        1. 11.2.1.1 Bus Loading, Length and Number of Nodes
        2. 11.2.1.2 CAN Termination
      2. 11.2.2 Detailed Design Procedure
      3. 11.2.3 Application Curve
    3. 11.3 System Example
      1. 11.3.1 ISO 11898 Compliance of SN65HVD23x Family of 3.3-V CAN Transceivers
        1. 11.3.1.1 Introduction
        2. 11.3.1.2 Differential Signal
        3. 11.3.1.3 Common-Mode Signal
        4. 11.3.1.4 Interoperability of 3.3-V CAN in 5-V CAN Systems
  12. 12Power Supply Recommendations
  13. 13Layout
    1. 13.1 Layout Guidelines
    2. 13.2 Layout Example
  14. 14器件和文档支持
    1. 14.1 相关链接
    2. 14.2 接收文档更新通知
    3. 14.3 社区资源
    4. 14.4 商标
    5. 14.5 静电放电警告
    6. 14.6 术语表
  15. 15机械、封装和可订购信息

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • D|8
散热焊盘机械数据 (封装 | 引脚)
订购信息

9 Parameter Measurement Information

SN65HVD233 SN65HVD234 SN65HVD235 pmi_dri_lls557.gifFigure 12. Driver Voltage, Current, and Test Definition
SN65HVD233 SN65HVD234 SN65HVD235 pmi_bus_lls557.gifFigure 13. Bus Logic State Voltage Definitions
SN65HVD233 SN65HVD234 SN65HVD235 pmi_driv_lls557.gifFigure 14. Driver VOD
SN65HVD233 SN65HVD234 SN65HVD235 pmi_dtc_lls557.gif
A. The input pulse is supplied by a generator having the following characteristics: Pulse repetition rate (PRR) ≤ 125 kHz, 50% duty cycle, tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.
B. CL includes fixture and instrumentation capacitance.
Figure 15. Driver Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_rece_lls557.gifFigure 16. Receiver Voltage and Current Definitions
SN65HVD233 SN65HVD234 SN65HVD235 pmi_rectc_lls557.gif
A. The input pulse is supplied by a generator having the following characteristics: Pulse repetition rate (PRR) ≤ 125 kHz, 50% duty cycle, tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.
B. CL includes fixture and instrumentation capacitance.
Figure 17. Receiver Test Circuit and Voltage Waveforms

Table 1. Differential Input Voltage Threshold Test

INPUT OUTPUT MEASURED
VCANH VCANL R |VID|
–6.1 V –7 V L VOL 900 mV
12 V 11.1 V L 900 mV
–1 V –7 V L 6 V
12 V 6 V L 6 V
–6.5 V –7 V H VOH 500 mV
12 V 11.5 V H 500 mV
–7 V –1 V H 6 V
6 V 12 V H 6 V
Open Open H X
SN65HVD233 SN65HVD234 SN65HVD235 pmi_testc_lls557.gif

NOTE:

This test is conducted to test survivability only. Data stability at the R output is not specified.
Figure 18. Test Circuit, Transient Overvoltage Test
SN65HVD233 SN65HVD234 SN65HVD235 pmi_tens_lls557.gif

NOTE:

All VI input pulses are supplied by a generator having the following characteristics: tr or tf ≤ 6 ns, pulse repetition rate (PRR) = 125 kHz, 50% duty cycle.
Figure 19. Ten(s) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_tenz_lls557.gifFigure 20. Ten(z) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_vocpp_lls557.gifFigure 21. VOC(pp) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_tloop_lls557.gifFigure 22. T(loop) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_tlbk_lls557.gifFigure 23. T(LBK) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_tab1_lls557.gifFigure 24. T(AB1) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_tab2_lls557.gifFigure 25. T(AB2) Test Circuit and Voltage Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_los_lls557.gifFigure 26. IOS Test Circuit and Waveforms
SN65HVD233 SN65HVD234 SN65HVD235 pmi_comm_lls557.gif

NOTE:

All input pulses are supplied by a generator with f ≤ 1.5 MHz.
Figure 27. Common-Mode Voltage Rejection
SN65HVD233 SN65HVD234 SN65HVD235 sch_diag_lls557.gifFigure 28. Equivalent Input and Output Schematic Diagrams
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