米6体育平台手机版

ZHCSRU5F September 2005 – March 2023 SN65HVD50 , SN65HVD51 , SN65HVD52 , SN65HVD53 , SN65HVD54 , SN65HVD55

PRODUCTION DATA

封装选项

机械数据 (封装 | 引脚)

D|14
- MPDS177H

散热焊盘机械数据 (封装 | 引脚)

订购信息

7.5 Driver Switching Characteristics

over recommended operating conditions unless otherwise noted

PARAMETER			TEST CONDITIONS	MIN	TYP⁽¹⁾	MAX	UNIT
t_PLH	Propagation delay time, low-to-high-level output	HVD50, HVD53	R_L = 54 Ω, C_L = 50 pF, See Figure 8-5	4	8	12	ns
		HVD51, HVD54		20	29	46
		HVD52, HVD55		90	143	230
t_PHL	Propagation delay time, high-to-low-level output	HVD50, HVD53		4	8	12	ns
		HVD51, HVD54		20	30	46
		HVD52, HVD55		90	143	230
t_r	Differential output signal rise time	HVD50, HVD53		3	6	12	ns
		HVD51, HVD54		20	34	60
		HVD52, HVD55		120	197	300
t_f	Differential output signal fall time	HVD50, HVD53		3	6	11	ns
		HVD51, HVD54		20	33	60
		HVD52, HVD55		120	192	300
t_sk(p)	Pulse skew (\|t_PHL – t_PLH\|)	HVD50, HVD53			1.4		ns
		HVD51, HVD54			1.6
		HVD52, HVD55			7.4
t_sk(pp)⁽²⁾	Part-to-part skew	HVD50, HVD53			1		ns
		HVD51, HVD54			4
		HVD52, HVD55			22
t_PZH1	Propagation delay time, high-impedance-to-high-level output	HVD53	R_L = 110 Ω, RE at 0 V, See Figure 8-6 D = 3 V and S1 = Y, D = 0 V and S1 = Z			30	ns
		HVD54				180
		HVD55				380
t_PHZ	Propagation delay time, high-level-to-high-impedance output	HVD53				16	ns
		HVD54				40
		HVD55				110
t_PZL1	Propagation delay time, high-impedance-to-low-level output	HVD53	R_L = 110 Ω, RE at 0 V, See Figure 8-7 D = 3 V and S1 = Z, D = 0 V and S1 = Y			23	ns
		HVD54				200
		HVD55				420
t_PLZ	Propagation delay time, low-level-to-high-impedance output	HVD53				19	ns
		HVD54				70
		HVD55				160
t_PZH2	Propagation delay time, standby-to-high-level output		R_L = 110 Ω, RE at 3 V, See Figure 8-6 D = 3 V and S1 = Y, D = 0 V and S1 = Z			3300	ns
t_PZL2	Propagation delay time, standby-to-low-level output		R_L = 110 Ω, RE at 3 V, See Figure 8-7 D = 3 V and S1 = Z, D = 0 V and S1 = Y			3300	ns

(1) All typical values are at 25°C and with a 5-V supply.

(2) t_sk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.