ZHCSDA2B February 2015 – April 2015 SN65LVDS93A-Q1
PRODUCTION DATA.
7 Parameter Measurement Information
All input timing is defined at IOVDD / 2 on an input signal with a 10% to 90% rise or fall time of less than 3 ns. CLKSEL = 0 V.
Figure 6. Set Up and Hold Time Definition
Figure 7. Test Load and Voltage Definitions for LVDS Outputs
The 16 grayscale test pattern test device power consumption for a typical display pattern.
Figure 8. 16 Grayscale Test Pattern
The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs.
Figure 9. Worst-Case Power Test Pattern
CLKOUT is shown with CLKSEL at high-level.
CLKIN polarity depends on CLKSEL input level.
Figure 10. SN65LVDS93A-Q1 Timing Definitions
CLKIN polarity depends on CLKSEL input level.
Figure 11. Output Clock Jitter Test Set Up
Figure 12. Enable Time Waveforms
Figure 13. Disable Time Waveforms