SCES590E JULY 2004 – March 2018 SN74AUP1G06
PRODUCTION DATA.
- 1 Features
- 2 Applications
- 3 Description
- 4 Revision History
- 5 Pin Functions and Configurations
-
6 Specifications
- 6.1 Absolute Maximum Ratings
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions
- 6.4 Thermal Information
- 6.5 Electrical Characteristics
- 6.6 Switching Characteristics, CL = 5 pF
- 6.7 Switching Characteristics, CL = 10 pF
- 6.8 Switching Characteristics, CL = 15 pF
- 6.9 Switching Characteristics
- 6.10 Operating Characteristics
- 6.11 Typical Characteristics
- 7 Parameter Measurement Information
- 8 Detailed Description
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
封装选项
请参考 PDF 数据表获取器件具体的封装图。
机械数据 (封装 | 引脚)
- DPW|5
- DBV|5
- DSF|6
- DCK|5
- DRL|5
- YFP|4
- DRY|6
散热焊盘机械数据 (封装 | 引脚)
- DRY|6
订购信息
12.5 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.