SCES596G JULY 2004 – August 2017 SN74AUP1G126
PRODUCTION DATA.
For related documentation see the following:
Implications of Slow of Floating CMOS Inputs application report
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
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