ZHCSN45B December   2021  – December 2023 SN75LVPE5412

PRODUCTION DATA  

  1.   1
  2. 特性
  3. 应用
  4. 说明
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 DC Electrical Characteristics
    6. 5.6 High Speed Electrical Characteristics
    7. 5.7 SMBUS/I2C Timing Characteristics
    8. 5.8 Typical Characteristics
    9. 5.9 Typical Jitter Characteristics
  7. Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Five-Level Control Inputs
      2. 6.3.2 Linear Equalization
      3. 6.3.3 Flat Gain
      4. 6.3.4 Receiver Detect State Machine
    4. 6.4 Device Functional Modes
      1. 6.4.1 Active PCIe Mode
      2. 6.4.2 Active Buffer Mode
      3. 6.4.3 Standby Mode
    5. 6.5 Programming
      1. 6.5.1 Pin Mode
      2. 6.5.2 SMBUS/I2C Register Control Interface
        1. 6.5.2.1 Shared Registers
        2. 6.5.2.2 Channel Registers
  8. Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Applications
      1. 7.2.1 PCIe x8 Lane Switching
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Design Procedure
      2. 7.2.2 Protocol Agnostic Linear Redriver for High Speed Interfaces
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. Device and Documentation Support
    1. 8.1 接收文档更新通知
    2. 8.2 支持资源
    3. 8.3 Trademarks
    4. 8.4 静电放电警告
    5. 8.5 术语表
  10. Revision History
  11. 10Mechanical, Packaging, and Orderable Information

封装选项

请参考 PDF 数据表获取器件具体的封装图。

机械数据 (封装 | 引脚)
  • RUA|42
散热焊盘机械数据 (封装 | 引脚)
订购信息

SMBUS/I2C Timing Characteristics

over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Secondary Mode
tSP Pulse width of spikes which must be
suppressed by the input filter
50 ns
tHD-STA Hold time (repeated) START condition.
After this period, the first clock pulse is
generated
0.6 µs
tLOW LOW period of the SCL clock 1.3 µs
THIGH HIGH period of the SCL clock 0.6 µs
tSU-STA Set-up time for a repeated START
condition
0.6 µs
tHD-DAT Data hold time 0 µs
TSU-DAT Data setup time 0.1 µs
tr Rise time of both SDA and SCL signals Pull-up resistor = 4.7kΩ, Cb = 10pF 120 ns
tf Fall time of both SDA and SCL signals Pull-up resistor = 4.7kΩ, Cb = 10pF 2 ns
tSU-STO Set-up time for STOP condition 0.6 µs
tBUF Bus free time between a STOP and
START condition
1.3 µs
tVD-DAT Data valid time 0.9 µs
tVD-ACK Data valid acknowledge time 0.9 µs
Cb Capacitive load for each bus line 400 pF