4 修订历史记录

Changes from D Revision (August 2015) to E Revision

• Added DW 封装。Go
• Added Maximum junction temperature to the Absolute Maximum Ratings table Go
• Added I_OL for different T_j to the Recommended Operating Conditions tableGo
• Changed I_CC standby into different input states, with increased maximums Go
• Changed C_io, C_i maximum Go
• Removed ΔI_CC spec from the Electrical Characteristics table, added ΔI_CC typical characteristics graph Go
• Clarified interrupt reset time (t_ir) with respect to falling edge of ACK related SCL pulse. Go
• Made changes to the Interrupt Output (INT) sectionGo
• Made changes to the Reads section Go
• Added the Calculating Junction Temperature and Power Dissipation sectionGo
• Changed recommended supply sequencing values Go
• Power on reset requirements relaxed Go

Changes from C Revision (May 2015) to D Revision

• Added DB 封装。Go

Changes from B Revision (October 2014) to C Revision

• Added standby mode current for V_I = V_CC test condition.Go
• Changed ΔI_CC for one P-port input at V_I = V_CC - 0.6, and other P-port I/O at V_I = V_CC or GND.Go
• Added clarification in datasheet that raising voltage above V_CC on P-port I/O will result in current flow from P-port to V_CC. Go

Changes from A Revision (March 2012) to B Revision

• Added 处理额定值表，特性 说明 部分，器件功能模式，应用和实施部分，电源相关建议部分，布局部分，器件和文档支持部分以及机械、封装和可订购信息部分。Go
• Updated I_OL PARAMETER in the Electrical Characteristics table.Go

Changes from * Revision (November 2011) to A Revision

• 最初发布的完整版本。Go