米6体育平台手机版

ZHCSA03C july 2012 – november 2020 TL1431-SP

PRODUCTION DATA

封装选项

机械数据 (封装 | 引脚)

JG|8
- MCER001B
U|10
- MCFP001B

散热焊盘机械数据 (封装 | 引脚)

订购信息

6.6 Typical Characteristics

Data at high and low temperatures are applicable only within the recommended operating free-air temperature ranges of the various devices.

Figure 6-1 Reference Voltage vs Free-Air Temperature

Figure 6-3 Cathode Current vs Cathode Voltage

Figure 6-5 Off-State Cathode Current vs Free-Air Temperature

Figure 6-7 Equivalent Input-Noise Voltage vs Frequency

Figure 6-2 Reference Current vs Free-Air Temperature

Figure 6-4 Cathode Current vs Cathode Voltage

Figure 6-6 Ratio of Delta Reference Voltage to Delta Cathode Voltage vs Free-Air Temperature

Figure 6-8 Equivalent Input-Noise Voltage Over a 10-s Period

Figure 6-10 Small-Signal Voltage Amplification vs Frequency

Figure 6-12 Reference Impedance vs Frequency

Figure 6-14 Pulse Response

A. The areas under the curves represent conditions that may cause the device to oscillate. For curves B, C; and D, R2; and V+ are adjusted to establish the initial V_KA and I_KA conditions, with C_L = 0. V_BATT and C_L then are adjusted to determine the ranges of stability.

Figure 6-16 Stability Boundary Conditions

Figure 6-9 Test Circuit for 0.1-Hz to 10-Hz Equivalent Input-Noise Voltage

Figure 6-11 Test Circuit for Voltage Amplification

Figure 6-13 Test Circuit for Reference Impedance

Figure 6-15 Test Circuit for Pulse Response

Figure 6-17 Test Circuits for Curves A Through D