ZHCSP39G February 2003 – August 2022 TLC2272-Q1 , TLC2272A-Q1 , TLC2274-Q1 , TLC2274A-Q1
PRODUCTION DATA
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Pin Configuration and Functions
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6 Specifications
- 6.1 Absolute Maximum Ratings
- 6.2 ESD Ratings
- 6.3 Recommended Operating Conditions
- 6.4 Thermal Information
- 6.5 Electrical Characteristics: VDD = 5 V (TLC2272-Q1 and TLC2272A-Q1)
- 6.6 Electrical Characteristics: VDD± = ±5 V (TLC2272-Q1 and TLC2272A-Q1)
- 6.7 Electrical Characteristics: VDD = 5 V (TLC2274-Q1 and TLC2274A-Q1)
- 6.8 Electrical Characteristics: VDD± = ±5 V (TLC2274-Q1 and TLC2274A-Q1)
- 6.9 Typical Characteristics
- 7 Detailed Description
- 8 Application and Implementation
- 9 Device and Documentation Support
- 10Mechanical, Packaging, and Orderable Information
9.6 Electrostatic Discharge Caution
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |