When it is important for a system to detect a brief over-current condition, it is advisable to utilize the latching feature of the TLV3603(E). By latching the comparator output, the MCU is reassured not to miss the over-current occurrence. The circuit below shows one way to implement the latching function.

When an over-current condition is detected by the TLV3603(E), the output will go high. The occurrence of the output going high coupled with a logic high from the RESET signal from the MCU will create a logic low signal at the output of the 2-channel NAND gate. This will cause the output of the TLV3603(E) to be held in a logic high state (latched), thus allowing the MCU to detect the fault condition regardless of how narrow the over-current condition persists. The addition of the NAND gate also provides a means of clearing the latch state of the comparator once the MCU is done processing the event. This is accomplished by the MCU passing a logic low state to the NAND input causing the LE/HYS pin of the comparator to be returned to a logic high state. The TLV3603(E) latched status is cleared and the TLV3603(E) output can continue to track the status of the input pins.

Figure 8-10 Over-Current Latched Output Circuit.