The TMAG5173-Q1 offers independent configurations to perform linear position measurements in X, Y, and Z axes. To calculate the expected error during linear measurement, the contributions from each of the individual error sources must be understood. The relevant error sources include sensitivity error, offset, noise, cross axis sensitivity, hysteresis, nonlinearity, drift across temperature, drift across life time, and so forth. For a 3-axis Hall solution like the TMAG5173-Q1, the cross-axis sensitivity and hysteresis error sources are insignificant. Use Equation 19 to estimate the linear measurement error calculation at room temperature.

where

• Error_{LM_25C} is total error in % during linear measurement at 25°C.
• B is input magnetic field.
• SENS_ER is sensitivity error in decimal number at 25°C. As an example, enter 0.05 for sensitivity error of 5%.
• B_off is offset error at 25°C.
• N_{RMS_25} is RMS noise at 25°C.

In many applications, system level calibration at room temperature can nullify the offset and sensitivity errors at 25°C. The noise errors can be reduced by internally averaging by up to 32x on the device in addition to the averaging that could be done in the microcontroller. Use Equation 20 to estimate the linear measurement error across temperature after calibration at room temperature.

where

• Error_{LM_Temp} is total error in % during linear measurement across temperature after room temperature calibration.
• B is input magnetic field.
• SENS_DR is sensitivity drift in decimal number from value at 25°C. As an example, enter 0.05 for sensitivity drift of 5%.
• B_{off_DR} is offset drift from value at 25°C.
• N_{RMS_Temp} is RMS noise across temperature.

If room temperature calibration is not performed, sensitivity and offset errors at room temperature must also account for total error calculation across temperature (see Equation 21).

where

• Error_{LM_Temp_NCal} is total error in % during linear measurement across temperature without room temperature calibration.