ZHCSA58F June   2006  – May 2018 TMP275

PRODUCTION DATA.  

  1. 特性
  2. 应用
  3. 说明
    1.     Device Images
      1.      简化电路原理图
      2.      内部框图
  4. 修订历史记录
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Digital Temperature Output
      2. 7.3.2 Serial Interface
      3. 7.3.3 Bus Overview
      4. 7.3.4 Serial Bus Address
        1. 7.3.4.1 Writing and Reading to the TMP275
        2. 7.3.4.2 Slave Mode Operations
          1. 7.3.4.2.1 Slave Receiver Mode
          2. 7.3.4.2.2 Slave Transmitter Mode
        3. 7.3.4.3 SMBus Alert Function
        4. 7.3.4.4 General Call
        5. 7.3.4.5 High-Speed Mode
        6. 7.3.4.6 Time-Out Function
      5. 7.3.5 Timing Diagrams
      6. 7.3.6 Two-Wire Timing Diagrams
    4. 7.4 Device Functional Modes
      1. 7.4.1 Shutdown Mode (SD)
      2. 7.4.2 Thermostat Mode (TM)
        1. 7.4.2.1 Comparator Mode (TM = 0)
        2. 7.4.2.2 Interrupt Mode (TM = 1)
      3. 7.4.3 One-Shot (OS)
    5. 7.5 Programming
      1. 7.5.1  Pointer Register
        1. 7.5.1.1 Pointer Register Byte (offset = N/A) [reset = 00h]
        2. 7.5.1.2 Pointer Addresses of the TMP275
          1. Table 3. Pointer Addresses of the TMP275 Field Description
      2. 7.5.2  Temperature Register
      3. 7.5.3  Configuration Register
      4. 7.5.4  Shutdown Mode (SD)
      5. 7.5.5  Thermostat Mode (TM)
      6. 7.5.6  Polarity (POL)
      7. 7.5.7  Fault Queue (F1/F0)
      8. 7.5.8  Converter Resolution (R1/R0)
      9. 7.5.9  One-Shot (OS)
      10. 7.5.10 High and Low Limit Registers
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Typical Connections of the TMP275
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
        3. 8.2.1.3 Application Curve
      2. 8.2.2 Connecting Multiple Devices on a Single Bus
      3. 8.2.3 Temperature Data Logger for Cold Chain Management Applications
  9. Power Supply Recommendations
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11器件和文档支持
    1. 11.1 文档支持
      1. 11.1.1 相关文档
    2. 11.2 社区资源
    3. 11.3 商标
    4. 11.4 静电放电警告
    5. 11.5 术语表
  12. 12机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Electrical Characteristics

at TA = −40°C to +125°C, and V+ = 2.7 V to 5.5 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TEMPERATURE INPUT
Range –40 125 °C
Accuracy (Temperature Error) –20°C to 100°C, V+ = 3.3 V ±0.0625 ±0.5 °C
0°C to 100°C, V+ = 3 V to 3.6 V ±0.0625 ±0.75 °C
–40°C to 125°C, V+ = 3 V to 3.6 V ±0.0625 ±1 °C
25°C to 100°C, V+ = 3.3 V to 5.5 V 0.2 ±1.5 °C
Resolution(1) Selectable 0.0625 °C
Repeatability(2) 25°C, V+= 3.3 V(3) ±0.0625 °C
Long-term drift (4) 500 hours at 150°C ±0.0625 °C
DIGITAL INPUT/OUTPUT
Input Capacitance 3 pF
Input logic level, HIGH, VIH 0.7(V+) 6 V
Input logic level, LOW, VIL −0.5 0.3(V+) V
Leakage Input Current, IIN 0 V ≤ VIN ≤ 6 V 1 µA
Input Voltage Hysteresis SCL and SDA pins 500 mV
SDA Output logic level, LOW, VOL IOL = 3 mA 0 0.15 0.4 V
ALERT Output logic level, HIGH, VOL IOL = 4 mA 0 0.15 0.4 V
Resolution Selectable 9 to 12 Bits
Coversion Time 9-Bit 27.5 37.5 ms
10-Bit 55 75 ms
11-Bit 110 150 ms
12-Bit 220 300 ms
Time-out time 25 54 74 ms
POWER SUPPLY
Operating range 2.7 5.5 V
Quiescent Current, IQ Serial bus inactive 50 85 µA
Serial bus active, SCL freq = 400 kHz 100 µA
Serial bus active, SCL freq = 3.4 MHz 410 µA
Shutdown Current, ISD Serial bus inactive 0.1 3 µA
Serial bus active, SCL freq = 400 kHz 60 µA
Serial bus active, SCL freq = 3.4 MHz 380 µA
TEMPERATURE RANGE
Specified Range –40 125 °C
Operating Range –55 127 °C
Specified for 12-bit resolution.
Repeatability is the ability to reproduce a reading when the measured temperature is applied consecutively, under the same conditions.
One-shot mode setup, 1 sample per minute for 24 hours.
Long-term drift is determined using accelerated operational life testing at a junction temperature of 150°C.