ZHCSIX6B October 2018 – Sept 2019 TMUX1574
PRODUCTION DATA.
- 1 特性
- 2 应用
- 3 说明
- 4 修订历史记录
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Parameter Measurement Information
- 7.1 On-Resistance
- 7.2 Off-Leakage Current
- 7.3 On-Leakage Current
- 7.4 IPOFF Leakage Current
- 7.5 Transition Time
- 7.6 tON (EN) and tOFF (EN) Time
- 7.7 tON (VDD) and tOFF (VDD) Time
- 7.8 Break-Before-Make Delay
- 7.9 Propagation Delay
- 7.10 Skew
- 7.11 Charge Injection
- 7.12 Capacitance
- 7.13 Off Isolation
- 7.14 Channel-to-Channel Crosstalk
- 7.15 Bandwidth
- 8 Detailed Description
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12器件和文档支持
- 13机械、封装和可订购信息
封装选项
机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息
7.11 Charge Injection
The amount of charge injected into the source or drain of the device during the falling or rising edge of the gate signal is known as charge injection, and is denoted by the symbol QC. Figure 37 shows the setup used to measure charge injection from source (Sx) to drain (Dx).
Figure 37. Charge-Injection Measurement Setup