This application describes a TPDxEUSB30/A eye pattern test. Figure 10-2 shows the lab board that was designed to demonstrate the degradation of the eye pattern quality with and without the TPD2EUSB30/A in the USB 3.0 signal path. The measurements show that there is only ~2 ps jitter penalty to the differential signal when the TPD2EUSB30/A device is added in the signal path. A similar setup was employed to measure the eye diagram for the TPD4EUSB30.

Figure 8-1 Measurement Setup to collect the Eye Pattern on a Reference Board with TPD2EUSB30/A

Figure 8-2 Measurement Setup to collect the Eye Pattern on a Reference Board with TPD2EUSB30/A