米6体育平台手机版

ZHCSP75A July 2022 – December 2022 TPS1HC30-Q1

PRODUCTION DATA

封装选项

机械数据 (封装 | 引脚)

PWP|14
- MPDS370A

散热焊盘机械数据 (封装 | 引脚)

PWP|14
- PPTD393

订购信息

9.2.2.2 EMC Transient Disturbances Test

Due to the severe electrical conditions in the automotive environment, immunity capacity against electrical transient disturbances is required, especially for a high side power switch, which is connected directly to the battery. Detailed test requirements are in accordance with the ISO 7637-2:2011 and ISO 16750-2:2010 standards. The TPS1HC30-Q1 device is tested and certificated by a third-party organization.

Table 9-2 ISO 7637-2:2011(E) in 12-V System⁽¹⁾⁽²⁾⁽³⁾⁽⁴⁾

Test Item	Test Pulse Severity Level and vs Accordingly		Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	Burst-Cycle Pulse-Repetition Time		Input Resistance (Ω)	Function Performance Status Classification
Test Item	Level	Vs/V	Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	MIN	MAX	Input Resistance (Ω)	Function Performance Status Classification
1	III	–112	2 ms	500 pulses	0.5 s	—	10	Status II
2a	III	55	50 µs	500 pulses	0.2 s	5 s	2	Status II
2b	IV	10	0.2 to 2 s	10 pulses	0.5 s	5 s	0 to 0.05	Status II
3a	IV	–220	0.1 µs	1 h	90 ms	100 ms	50	Status II
3b	IV	150	0.1 µs	1 h	90 ms	100 ms	50	Status II

(1) Tested both under input low condition and high condition.

(2) The pulse 2-A voltage is 54-V maximum from VBB with respect to ground. A voltage suppressing mechanism must be used to pass Level III. This test was run with an 2-μF capacitor from VBB to ground.

(3) GND pin network is a 1-kΩ resistor in parallel with a diode BAS21-7-F.

(4) Status II: The function does not perform as designed during the test, but returns automatically to normal operation after the test.

Table 9-3 ISO 16750-2:2010(E) Load Dump Test B in 12-V System⁽¹⁾⁽²⁾⁽³⁾⁽⁴⁾⁽⁵⁾

Test Item	Test Pulse Severity Level and vs Accordingly		Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	Burst-Cycle Pulse-Repetition Time		Input Resistance (Ω)	Function Performance Status Classification
Test Item	Level	Vs/V	Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	Burst-Cycle Pulse-Repetition Time		Input Resistance (Ω)	Function Performance Status Classification
Test B		35	40 to 400 ms	5 pulses	60 s		0.5 to 4	Status II

(1) Tested both under input low condition and high condition (DIAG_EN, EN, and VBB are all classified as inputs).

(2) Considering the worst test condition, the device is tested without any filter capacitors on VBB and VOUT.

(3) The GND pin network is a 1-kΩ resistor in parallel with a diode BAS21-7-F.

(4) Status II: The function does not perform as designed during the test, but returns automatically to normal operation after the test.

(5) Select a 36-V external suppressor.