ZHCSGZ0B October 2017 – November 2017 TPS23525
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
VCC – Clamped Supply | ||||||
tID | Insertion Delay | VVCC: 0 V → 10 V, measure delay before VGATE ↑ | 32 | ms | ||
UVEN | ||||||
TUV,degl | Deglitch on UVEN | 4 | µs | |||
OV | ||||||
TOV,degl | Deglitch on OV | 4 | µs | |||
SNS | ||||||
TSNS,FST,RESP | Response time to large over current | VSNS steps from 0 mV to 60 mV. Measure time for GATE to come down. | 300 | ns | ||
Neg48VA, NEG48VB | ||||||
TNeg48Vx,FST,RESP | Response time to large reverse current | VNEG48Vx steps from -40 mV to 15 mV. Measure time for GATEx to come down. | 300 | ns | ||
PGb | ||||||
tPGb,DEGL | Deglitch of PGb. (raise GATE, measure delay between GATE and PGb) | Power Good ↑ (V(GATE) 0 V → 10 V) Look for PGb ↓ | 1 | ms | ||
Power Good ↓ (V(GATE) 10 V → 0 V) Look for PGb ↑ | 32 | ms |