ZHCSQB8C July 2021 – December 2022 TPS38700-Q1
PRODUCTION DATA
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
Common Parameters | ||||||
VDD | Input supply voltage | 2.2 | 5.5 | V | ||
VBBAT | Backup battery voltage range | 1.85 | 5.5 | V | ||
UVLO_VDDR | UVLO VDD | Rising threshold | 2.2 | V | ||
UVLO_VDDF | UVLO VDD | Falling threshold/switch over to VBBAT | 1.90 | 2 | V | |
UVLO_VBBAT | UVLO Battery backup | Falling threshold | 1.85 | V | ||
POR | Power ON reset voltage, all outputs guaranteed to be stable above this value | Falling threshold | 1.39 | V | ||
IDD | Supply current into VDD pin ACT=High, SLEEP=High, RTC=active |
VDD ≤ 5.5 V, power up sequence complete | 45 | 75 | µA | |
IDD | Supply current into VDD pin ACT=Low, SLEEP=Low, RTC=active |
VDD ≤ 5.5 V ,power down sequence complete |
35 | 60 | µA | |
IBBAT | Supply current from VBBAT | VBBAT ≤ 5.5 V | 35 | 60 | µA | |
ILKG_NRST | Output leakage current (NRST) | VDD=VNRST = 5.5 V | 300 | nA | ||
ILKG_NIRQ | Output leakage current (NIRQ) | VDD=VNIRQ = 5.5 V | 300 | nA | ||
ACT_L | Logic Low input | 0.36 | V | |||
ACT_H | Logic high input | 0.84 | VDD - 0.2 | V | ||
SLEEP_L | Logic Low input | 0.36 | V | |||
SLEEP_H | Logic high input | 0.84 | VDD - 0.2 | V | ||
ACT | Internal Pull down | 100 | kΩ | |||
SLEEP | Internal Pull down | 100 | kΩ | |||
ENx | Output High | Push-Pull configuration, Io=1mA | VDD-0.2 | V | ||
Output Low | Push-Pull or Open-Drain (10 kΩ pull up) | 0.1 | V | |||
R_ENx | Enable Output resistance | Push-Pull config | 200 | Ω | ||
NRST | Output Low | Open-Drain (10 kΩ pull up) | 0.1 | V | ||
NIRQ | Output Low | Open-Drain (10 kΩ pull up) | 0.1 | V | ||
CLK32K | Leakage test | Open-Drain,4.7 kΩ pull up to 1.8V, 10pF capacitive load | 100 | nA | ||
Output Low | Open-Drain, Io = -1mA, pull up to 1.8V, 10pF capacitive load | 0.1 | V | |||
Acc_CLK32K | Accuracy Early Boot | t < 50ms, VDD > VDDmin | -10 | 10 | % | |
Accuracy Operating | t > 1s, VDD > VDDmin | -100 | 100 | ppm | ||
XTAL Fault | Crystal Frequency fault detection | -10 | 10 | % | ||
OSC | Internal oscillator tolerance | -5 | 5 | % | ||
Ilkg(BBAT) | Leakge current from VBBAT | VBBAT > 1.85V | 300 | nA | ||
TSD | Thermal Shutdown | 165 | ℃ | |||
TSD Hysterisis | Thermal Shutdown Hysteresis | 25 | ℃ | |||
VIH_ALT | NEM_PD, NRST_IN, NPWR_BTN | Pin 10,11,12 Active Low, Open-Drain | 1.1 | V | ||
VIL_ALT | NEM_PD, NRST_IN, NPWR_BTN | Pin 10,11,12 Active Low, Open-Drain | 0.36 | V | ||
I2C Electrical Specifications | ||||||
CB | Capacitive load for SDA and SCL | 400 | pF | |||
SDA, SCL | Low Threshold, OTP = 1.2 V | 0.36 | V | |||
SDA, SCL | High Threshold, OTP = 1.2 V | 0.84 | V | |||
SDA, SCL | Low Threshold, OTP = 1.8 V | 0.54 | V | |||
SDA, SCL | High Threshold, OTP = 1.8 V | 1.26 | V | |||
SDA, SCL | Low Threshold, OTP = 3.3 V | production variant | 0.84 | V | ||
SDA, SCL | Low Threshold, OTP = 3.3 V | production variant | 2.31 | V | ||
SDA, SCL | Low Threshold, OTP = 5V | 1.5 | V | |||
SDA, SCL | High Threshold, OTP = 5V | 3.5 | V | |||
SDA | Output Low with 3 mA sink current | 0.2 | V |