ZHCSF57 June 2016 TPS51200-EP
PRODUCTION DATA.
Consider the following points before starting the TPS51200-EP device layout design.
Because the TPS51200-EP is a linear regulator, the VO current flows in both source and sink directions, thereby dissipating power from the device. When the device is sourcing current, the voltage difference shown in Equation 4 calculates the power dissipation.
In this case, if the VLDOIN pin is connected to an alternative power supply lower than the VDDQ voltage, overall power loss can be reduced. During the sink phase, the device applies the VO voltage across the internal LDO regulator. Equation 5 calculates the power dissipation, PD_SNK.
Because the device does not sink and source current at the same time and the I/O current may vary rapidly with time, the actual power dissipation should be the time average of the above dissipations over the thermal relaxation duration of the system. The current used for the internal current control circuitry from the VIN supply and the VLDOIN supply are other sources of power consumption. This power can be estimated as 5 mW or less during normal operating conditions and must be effectively dissipated from the package.
Maximum power dissipation allowed by the package is calculated by Equation 6.
where
NOTE
Because Equation 6 demonstrates the effects of heat spreading in the ground plane, use it as a guideline only. Do not use Equation 6 to estimate actual thermal performance in real application environments.
In an application where the device is mounted on PCB, TI strongly recommends using ψJT and ψJB, as explained in the section pertaining to estimating junction temperature in the Semiconductor and IC Package Thermal Metrics application report, SPRA953. Using the thermal metrics ψJT and ψJB, as shown in the Thermal Information table, estimate the junction temperature with corresponding formulas shown in Equation 7. The older θJC top parameter specification is listed as well for the convenience of backward compatibility.
where
NOTE
Both TT and TB can be measured on actual application boards using a thermo-gun (an infrared thermometer). For more information about measuring TT and TB, see the application report Using New Thermal Metrics (SBVA025).
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