ZHCSR16 September 2022 TPS544C26
ADVANCE INFORMATION
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
SUPPLY | ||||||
PVIN operating input range | 4 | 18 | V | |||
IQ(PVIN) | PVIN quiescent current | Non-switching, PVIN = 12 V, VEN = 0 V, no bias on VCC/VDRV pin | 7.5 | 9 | mA | |
IVCC | VCC/VDRV external bias current | 5 V external bias on VCC/VDRV pin, regular switching. TJ = 25°C, PVIN = 12 V, VOUT = 1.1 V, VEN = 2 V, fSW = 1 MHz | 30 | mA | ||
IQ(VCC) | VCC/VDRV quiescent current | 5V external bias on VCC/VDRV pin, non-switching. PVIN = 12V, VEN = 2 V, VFB = VREF + 50 mV | 5 | mA | ||
UVLO | ||||||
PVINOV | PVIN overvoltage rising threshold | PVIN rising, VIN_OV_FAULT_LIMIT register (55h) = 0b | 16.5 | V | ||
PVINOV | PVIN overvoltage rising threshold | PVIN rising, VIN_OV_FAULT_LIMIT register (55h) = 1b | 18.5 | V | ||
PVINOV | PVIN overvoltage falling threshold | PVIN falling. PVIN_OVF status bit, once it is set, cannot be cleared unless PVIN falls below the PVIN overvoltage falling threshold |
13.5 | V | ||
VIN_ON | PVIN turn-on voltage | PVIN rising, VIN_ON register (35h) = 00b | 10 | V | ||
VIN_ON | PVIN turn-on voltage | PVIN rising, VIN_ON register (35h) = 01b | 9 | V | ||
VIN_ON | PVIN turn-on voltage | PVIN rising, VIN_ON register (35h) = 10b | 8 | V | ||
VIN_ON | PVIN turn-on voltage | PVIN rising, VIN_ON register (35h) = 11b. Ignore VIN_ON setting, and use VCC UVLO rising threshold to enable the device. | Disabled | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 000b | reserved | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 000b | 4.2 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 001b | 9.5 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 010b | 8.5 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 011b | 7.5 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 100b | 6.5 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 101b | 5.5 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 110b | 4.2 | V | ||
VIN_OFF | PVIN turn-off voltage | PVIN falling, VIN_OFF register (36h) = 111b. Ignore VIN_OFF setting, and use VCC UVLO falling threshold to disable the device. | Disabled | V | ||
PVINUVLO(R) | PVIN UVLO rising threshold | PVIN rising, 5V external bias on VCC/VDRV pin | 2.0 | 2.55 | 3.0 | V |
PVINUVLO(F) | PVIN UVLO falling threshold | PVIN falling, 5V external bias on VCC/VDRV pin | 1.8 | 2.3 | 2.8 | V |
PVINUVLO(H) | PVIN UVLO hysteresis | 0.25 | V | |||
ENABLE | ||||||
VEN(R) | EN voltage rising threshold | EN rising, enable switching | 1.14 | 1.19 | 1.24 | V |
VEN(F) | EN voltage falling threshold | EN falling, disable switching | 0.94 | 0.98 | 1.02 | V |
VEN(H) | EN voltage hysteresis | 0.21 | V | |||
tEN(DIG) | EN Deglitch Time | 0.2 | µs | |||
EN internal pulldown resistor | EN to AGND | 87 | 103 | 119 | kΩ | |
INTERNAL VCC LDO | ||||||
tdelay(uvlo_I2C) | Delay from VCC UVLO to I2C ready to communicate | VCC/VDRV >= 3 V | TBD | ms | ||
Internal VCC LDO output voltage | PVIN = 4 V, IVCC(load) = 5 mA | 3.925 | 3.97 | 4.0 | V | |
Internal VCC LDO output voltage | PVIN = 5 V to 16 V, IVCC(load) = 5 mA | 4.28 | 4.44 | 4.55 | V | |
VCC UVLO rising threshold | VCC rising | 3.69 | 3.75 | 3.81 | V | |
VCC UVLO falling threshold | VCC falling | 3.49 | 3.55 | 3.61 | V | |
VCC UVLO hysteresis | 0.2 | V | ||||
VCC LDO dropout voltage | PVIN – VVCC, PVIN = 4 V, IVCC(load) = 45 mA | 90 | 144 | 226 | mV | |
VCC LDO short-circuit current limit | PVIN = 5 V | 150 | 200 | mA | ||
VOUT VOLTAGE | ||||||
Output Voltage controlled through SVID interface | Output voltage range by SetVID & SetWP commands | 0.5 | 3.04 | V | ||
Output Voltage controlled through SVID interface | Output voltage resolution by SetVID & SetWP commands | 5 | mV | |||
Output Voltage controlled through SVID interface | SVID fast slew rate, register (AFh) DVS_CFG = 010b | 2.5 | 2.78 | 3.06 | mV/µs | |
Output Voltage controlled through SVID interface | SVID fast slew rate, register (AFh) DVS_CFG = 100b | 5 | 5.5 | 6.1 | mV/µs | |
Output Voltage controlled through SVID interface | SVID fast slew rate, register (AFh) DVS_CFG = 110b | 10 | 11.1 | 12.2 | mV/µs | |
Output Voltage controlled through SVID interface | SVID OFFSET range | –127 | 127 | Step | ||
Output Voltage controlled through SVID interface | SVID OFFSET resolution | 1 | Step | |||
Output Voltage controlled through I2C interface | Output voltage range by register (A6h) VOUT_CMD | 0.5 | 3.04 | V | ||
Output Voltage controlled through I2C interface | Output voltage resolution by register (A6h) VOUT_CMD | 5 | mV | |||
Output Voltage controlled through I2C interface | Output voltage transition slew rate by register (A6h) VOUT_CMD, register (AFh) DVS_CFG = 010b | 0.625 | mV/µs | |||
Output Voltage controlled through I2C interface | Output voltage transition slew rate by register (A6h) VOUT_CMD, register (AFh) DVS_CFG = 100b | 1.25 | mV/µs | |||
Output Voltage controlled through I2C interface | Output voltage transition slew rate by register (A6h) VOUT_CMD, register (AFh) DVS_CFG = 110b | 2.5 | mV/µs | |||
Output Voltage controlled through I2C interface | I2C offset (register (A8h) VID_OFFSET) range, 5mV VID step | –63 | 63 | mV | ||
Output Voltage controlled through I2C interface | I2C offset (register (A8h) VID_OFFSET) resolution, 5mV VID step | 0.5 | mV | |||
Output Voltage controlled through I2C interface | I2C offset (register (A8h) VID_OFFSET) range, 10mV VID step | –127 | 127 | mV | ||
Output Voltage controlled through I2C interface | I2C offset (register (A8h) VID_OFFSET) resolution, 10mV VID step | 1.0 | mV | |||
VOUT(ACC) | Output voltage accuracy | TJ = 0°C to 85°C, VOUT = 0.75 V, VVOSNS–VGOSNS | 0.744 | 0.75 | 0.756 | V |
VOUT(ACC) | Output voltage accuracy | TJ = 0°C to 85°C, VOUT = 1.1 V, VVOSNS–VGOSNS | 1.0945 | 1.1 | 1.1055 | V |
VOUT(ACC) | Output voltage accuracy | TJ = 0°C to 85°C, VOUT = 1.8 V, VVOSNS–VGOSNS | 1.791 | 1.8 | 1.809 | V |
VOUT(ACC) | Output voltage accuracy | TJ = –40°C to 125°C, VOUT = 0.75 V, VVOSNS–VGOSNS | 0.7425 | 0.75 | 0.7575 | V |
VOUT(ACC) | Output voltage accuracy | TJ = –40°C to 125°C, VOUT = 1.1 V, VVOSNS–VGOSNS | 1.089 | 1.1 | 1.111 | V |
VOUT(ACC) | Output voltage accuracy | TJ = –40°C to 125°C, VOUT = 1.8 V, VVOSNS–VGOSNS | 1.782 | 1.8 | 1.818 | V |
IVOS | VOSNS input current | VVOSNS = 1.8 V | 111 | 130 | µA | |
SWITCHING FREQUENCY | ||||||
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, FREQUENCY_SWITCH register (33h) = 00b | 540 | 600 | 660 | kHz |
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, FREQUENCY_SWITCH register (33h) = 01b | 720 | 800 | 880 | kHz |
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, FREQUENCY_SWITCH register (33h) = 10b | 900 | 1000 | 1100 | kHz |
fSW(FCCM) | Switching frequency, FCCM operation | TJ = –40°C to 125°C, PVIN = 12 V, VOUT = 1.1 V, no load, FREQUENCY_SWITCH register (33h) = 11b | 1080 | 1200 | 1320 | kHz |
STARTUP | ||||||
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 00b | 0.5 | 0.55 | ms | |
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 01b | 1.0 | 1.1 | ms | |
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 10b | 1.5 | 1.65 | ms | |
tON(DLY) | Power on sequence delay | VVCC = 4.5 V, register (60h) TON_DELAY = 11b | 2.0 | 2.2 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 00b | 0 | 0.05 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 01b | 1.0 | 1.1 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 10b | 1.5 | 1.65 | ms | |
tOFF(DLY) | Power off sequence delay | VVCC = 4.5 V, register (64h) TOFF_DELAY = 11b | 2.0 | 2.2 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 000b | 1.0 | 1.1 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 001b | 2.0 | 2.2 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 010b | 4.0 | 4.4 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 011b | 8.0 | 8.8 | ms | |
tON(Rise) | Soft-start time | VVCC = 4.5 V, register (61h) TON_RISE = 1xxb | 16.0 | 17.6 | ms | |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 00b, Vboot = 1.1V, PROTOCOL ID = 07h, 5mV VID step | 2.00 | 2.2 | 2.44 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 01b, Vboot = 1.1V, PROTOCOL ID = 07h, 5mV VID step | 1.00 | 1.1 | 1.22 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 10b, Vboot = 1.1V, PROTOCOL ID = 07h, 5mV VID step | 0.50 | 0.55 | 0.61 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 11b, Vboot = 1.1V, PROTOCOL ID = 07h, 5mV VID step | 0.25 | 0.275 | 0.31 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 00b, Vboot = 1.8V, PROTOCOL ID = 04h, 10mV VID step | 3.27 | 3.6 | 4.00 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 01b, Vboot = 1.8V, PROTOCOL ID = 04h, 10mV VID step | 1.64 | 1.8 | 2.00 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 10b, Vboot = 1.8V, PROTOCOL ID = 04h, 10mV VID step | 0.82 | 0.9 | 1.00 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by SVID | VVCC = 4.5 V, register (65h) TOFF_FALL = 11b, Vboot = 1.8V, PROTOCOL ID = 04h, 10mV VID step | 0.41 | 0.45 | 0.50 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 00b, PROTOCOL ID = 07h, 5mV VID step | 2.00 | 2.2 | 2.44 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 01b, PROTOCOL ID = 07h, 5mV VID step | 1.00 | 1.1 | 1.22 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 10b, PROTOCOL ID = 07h, 5mV VID step | 0.50 | 0.55 | 0.61 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 11b, PROTOCOL ID = 07h, 5mV VID step | 0.25 | 0.275 | 0.31 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 00b, PROTOCOL ID = 04h, 10mV VID step | 3.27 | 3.6 | 4.00 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 01b, PROTOCOL ID = 04h, 10mV VID step | 1.64 | 1.8 | 2.00 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 10b, PROTOCOL ID = 04h, 10mV VID step | 0.82 | 0.9 | 1.00 | V/ms |
tOFF(Fall) | Soft-stop slew rate, VOUT controlled by I2C | VVCC = 4.5 V, register (65h) TOFF_FALL = 11b, PROTOCOL ID = 04h, 10mV VID step | 0.41 | 0.45 | 0.50 | V/ms |
POWER STAGE | ||||||
RDSON(HS) | High-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VBOOT-SW = 4.5 V | 4 | mΩ | ||
RDSON(HS) | High-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VBOOT-SW = 5.0 V | 3.91 | mΩ | ||
RDSON(LS) | Low-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VVCC = 4.5 V | 1 | mΩ | ||
RDSON(LS) | Low-side MOSFET on-resistance | TJ = 25°C, PVIN = 12 V, VVCC = 5 V | 0.98 | mΩ | ||
tON(min) | Minimum ON pulse width | VVCC = 4.5 V | 50 | ns | ||
tOFF(min) | Minimum OFF pulse width | VVCC = 4.5 V, IO=1.5A, VOUT = VOUT(set) – 20 mV, SW falling edge to rising edge | 180 | ns | ||
BOOT CIRCUIT | ||||||
IBOOT(LKG) | BOOT leakage current | VEN = 2 V, VBOOT-SW = 5 V | 150 | µA | ||
VBOOT-SW(UV_F) | BOOT-SW UVLO falling threshold | 2.60 | 2.76 | V | ||
OVERCURRENT PROTECTION | ||||||
ILS(OC) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0000b | 8.5 | 10 | 11.5 | A |
ILS(OC) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0001b | 10.2 | 12 | 13.8 | A |
ILS(OC) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0010b | 13.5 | 15 | 16.5 | A |
ILS(OC) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0011b | 17.1 | 19 | 20.9 | A |
ILS(OC) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0100b | 18 | 20 | 22 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0101b | 22.5 | 25 | 27.5 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0110b | 23.4 | 26 | 28.6 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 0111b | 27 | 30 | 33 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 1000b | 29.7 | 33 | 36.3 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 1001b | 31.5 | 35 | 38.5 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 1010b | 35.1 | 39 | 42.9 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 1011b | 36 | 40 | 44 | A |
ILS(OCL) | Low-side valley overcurrent limit (TPS544C26) | Valley current limit on LS FET, IOUT_OC_FAULT_LIMIT (46h) = 11xxb | 36 | 40 | 44 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 000b | 8.5 | 10 | 11.5 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 001b | 13.5 | 15 | 16.5 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 010b | 18 | 20 | 22 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 011b | 22.5 | 25 | 27.5 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 100b | 27 | 30 | 33 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 101b | 31.5 | 35 | 38.5 | A |
ILS(OCW) | Low-side valley overcurrent warning (TPS544C26) | Valley current limit on LS FET, IOUT_OC_WARN_LIMIT (4Ah) = 11xb | 36 | 40 | 44 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 00b, ICCMAX ≥ 15A | –18 | –20 | –22 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 00b, ICCMAX ≤ 10 A | –8.5 | –10 | –11.5 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 01b, ICCMAX ≥ 15A | –13.5 | –15 | –16.5 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 01b, ICCMAX ≤ 10 A | –6.37 | –7.5 | –8.63 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 10b, ICCMAX ≥ 15A | –10.2 | –12 | –13.8 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 10b, ICCMAX ≤ 10 A | –5.1 | –6 | –6.9 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 11b, ICCMAX ≥ 15A | –8.5 | –10 | –11.5 | A |
ILS(NOC) | Low-side negative overcurrent limit | Sinking current limit on LS FET, IOUT_NOC_LIMIT (B4h) = 11b, ICCMAX ≤ 10 A | –4.25 | –5 | –5.75 | A |
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 00b, enter DCM | 1200 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 00b, exit DCM | 1500 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 01b, enter DCM | 900 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 01b, exit DCM | 1200 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 10b, enter DCM | 0 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 10b, exit DCM | 300 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 11b, enter DCM | –300 | mA | ||
IZC | Zero-cross detection current threshold | VIN = 12 V, VVCC = 4.5 V, SEL_ZC = 11b, exit DCM | 0 | mA | ||
Response delay before entering Hiccup | UV RESPONSE_DELAY = 00b | 2 | µs | |||
Response delay before entering Hiccup | UV RESPONSE_DELAY = 01b | 16 | µs | |||
Response delay before entering Hiccup | UV RESPONSE_DELAY = 10b | 64 | µs | |||
Response delay before entering Hiccup | UV RESPONSE_DELAY = 11b | 256 | µs | |||
Hiccup sleep time before a restart | 56 | ms | ||||
OUTPUT OVP AND UVP | ||||||
VOVP | Vout tracking overvoltage protection (OVP) threshold, offset above Vout | (VOSNS – GOSNS) rising. (40h) VOUT_OV_FAULT_LIMIT = 00b | 80 | 100 | 120 | mV |
VOVP | Vout tracking overvoltage protection (OVP) threshold, offset above Vout | (VOSNS – GOSNS) rising. (40h) VOUT_OV_FAULT_LIMIT = 01b | 120 | 150 | 180 | mV |
VOVP | Vout tracking overvoltage protection (OVP) threshold, offset above Vout | (VOSNS – GOSNS) rising. (40h) VOUT_OV_FAULT_LIMIT = 10b | 160 | 200 | 240 | mV |
VOVP | Vout tracking overvoltage protection (OVP) threshold, offset above Vout | (VOSNS – GOSNS) rising. (40h) VOUT_OV_FAULT_LIMIT = 11b | 240 | 300 | 360 | mV |
Vout tracking OVP de-glitch time | 2 | µs | ||||
VFixOV | Vout fixed OVP threshold, 5mV step | (VOSNS – GOSNS) rising. (CFh) FAULT_CTRL2, SEL_FIX_OVF = 0b, and (CCh) PROTOCOL_ID_SVID, PROTOCOL_ID<7:6> = 01b or 10b (5mV step) | 1.425 | 1.5 | 1.575 | V |
VFixOV | Vout fixed OVP threshold, 5mV step | (VOSNS – GOSNS) rising. (CFh) FAULT_CTRL2, SEL_FIX_OVF = 1b, and (CCh) PROTOCOL_ID_SVID, PROTOCOL_ID<7:6> = 01b or 10b (5mV step) | 1.71 | 1.8 | 1.89 | V |
VFixOV | Vout fixed OVP threshold, 10mV step | (VOSNS – GOSNS) rising. (CFh) FAULT_CTRL2, SEL_FIX_OVF = 0b, and (CCh) PROTOCOL_ID_SVID, PROTOCOL_ID<7:6> = 00b or 11b (10mV step) | 2.33 | 2.4 | 2.47 | V |
VFixOV | Vout fixed OVP threshold, 10mV step | (VOSNS – GOSNS) rising. (CFh) FAULT_CTRL2, SEL_FIX_OVF = 1b, and (CCh) PROTOCOL_ID_SVID, PROTOCOL_ID<7:6> = 00b or 11b (10mV step) | 2.93 | 3.0 | 3.07 | V |
Vout fixed OVP de-glitch time | 2 | µs | ||||
VUVP | Vout tracking undervoltage protection (UVP) threshold, offset below Vout | (VOSNS – GOSNS) falling. (44h) VOUT_UV_FAULT_LIMIT = 00b | –120 | –150 | –180 | mV |
VUVP | Vout tracking undervoltage protection (UVP) threshold, offset below Vout | (VOSNS – GOSNS) falling. (44h) VOUT_UV_FAULT_LIMIT = 01b | –160 | –200 | –240 | mV |
VUVP | Vout tracking undervoltage protection (UVP) threshold, offset below Vout | (VOSNS – GOSNS) falling. (44h) VOUT_UV_FAULT_LIMIT = 10b | –160 | –200 | –240 | mV |
VUVP | Vout tracking undervoltage protection (UVP) threshold, offset below Vout | (VOSNS – GOSNS) falling. (44h) VOUT_UV_FAULT_LIMIT = 11b | –240 | –300 | –360 | mV |
Vout tracking UVP response delay time | (45h) VOUT_UV_FAULT_RESPONSE, RESPONSE_DELAY<1:0> = 00b. From UV detection to tri-state of the power FETs | 2 | 4 | µs | ||
Vout tracking UVP response delay time | (45h) VOUT_UV_FAULT_RESPONSE, RESPONSE_DELAY<1:0> = 01b. From UV detection to tri-state of the power FETs | 14.4 | 16 | 17.6 | µs | |
Vout tracking UVP response delay time | (45h) VOUT_UV_FAULT_RESPONSE, RESPONSE_DELAY<1:0> = 10b. From UV detection to tri-state of the power FETs | 57.6 | 64 | 70.4 | µs | |
Vout tracking UVP response delay time | (45h) VOUT_UV_FAULT_RESPONSE, RESPONSE_DELAY<1:0> = 11b. From UV detection to tri-state of the power FETs | 230.4 | 256 | 281.6 | µs | |
VR READY AND CATASTROPHIC FAULT | ||||||
VOL(VRRDY) | VRRDY pin output low-level voltage | IVRRDY = 10 mA, VIN = 12 V, VVCC = 4.5 V | 300 | mV | ||
ILKG(VRRDY) | VRRDY pin Leakage current when open drain output is high | Rpullup = 10 kΩ, VVRRDY = 5 V | 5 | µA | ||
Min VCC for valid VRRDY pin output | PVIN = 0 V, VEN = 0 V, Rpullup = 10 kΩ, VVRRDY ≤ 0.3 V | 1.2 | V | |||
CAT_FAULT# pin output low-level voltage | Rpullup = 4.99 kΩ, Vpullup = 3.3 V | 210 | 300 | mV | ||
CAT_FAULT# pin Leakage current when open drain output is high | Rpullup = 4.99 kΩ, Vpullup = 3.3 V | 5 | µA | |||
OUTPUT DISCHARGE | ||||||
Output discharge on VOSNS pin | VIN = 12 V, VVCC = Internal LDO, VVOSNS = 0.5 V, EN=0V | 40 | Ω | |||
THERMAL SHUTDOWN | ||||||
TJ(SD) | Thermal shutdown threshold (1) | Junction temperature rising | 153 | 166 | °C | |
TJ(HYS) | Thermal shutdown hysteresis (1) | 30 | °C | |||
MEASUREMENT SYSTEM (I2C) | ||||||
MIOUT(rng) | Output current measurement range | (C0h) ICC_MAX = 40 A | 0 | 40 | A | |
MIOUT(acc) | Output current measurement accuracy | (C0h) ICC_MAX = 40 A, 0 ≤ IOUT ≤ 4 A, –40°C ≤ TJ ≤ 125°C | –0.625 | 0.625 | A | |
MIOUT(acc) | Output current measurement accuracy | (C0h) ICC_MAX = 40 A, IOUT = 12 A, –40°C ≤ TJ ≤ 125°C | –8% | 8% | ||
MIOUT(acc) | Output current measurement accuracy | (C0h) ICC_MAX = 40 A, 24 A ≤ IOUT < 40 A, –40°C ≤ TJ ≤ 125°C | –6% | 6% | ||
MIOUT(lsb) | Output current measurement bit resolution | (C0h) ICC_MAX = 40 A | 0.1563 | A | ||
MVOUT(rng) | Output voltage measurement range | 0 | 3.04 | V | ||
MVOUT(acc) | Output voltage measurement accuracy | 0.75 V ≤ VOUT ≤ 1.5 V, PROTOCOL ID = 07h, 5mV VID step | –19 | 19 | mV | |
MVOUT(acc) | Output voltage measurement accuracy | 1.5 V < VOUT ≤ 3.0 V, PROTOCOL ID = 04h, 10mV VID step | –37.5 | 37.5 | mV | |
MVOUT(lsb) | Output voltage measurement bit resolution | PROTOCOL ID = 07h, 5mV VID step | 6.25 | mV | ||
MVOUT(lsb) | Output voltage measurement bit resolution | PROTOCOL ID = 04h, 10mV VID step | 12.5 | mV | ||
MPIN(rng) | Input power measurement range | (6Bh) PIN_OP_WARN_LIMIT = 000b (360 W) | 0 | 360 | W | |
MPIN(acc) | Input power measurement accuracy datapoint | Room Temp, 12V, 15A, 180W | 180 | W | ||
MPIN(acc) | Input power measurement accuracy datapoint | Room Temp, 12V, 25A, 300W | 300 | W | ||
MPIN(acc) | Input power measurement accuracy | % | % | |||
MPIN(lsb) | Input power measurement bit resolution | W | ||||
MVIN(rng) | Input voltage measurement range | VINSNSM – AGND | 8 | 16 | V | |
MVIN(acc) | Input voltage measurement accuracy datapoint | VINSNSM – AGND. TJ = 0℃ to 85℃ | 8 | V | ||
MVIN(acc) | Input voltage measurement accuracy datapoint | VINSNSM – AGND. TJ = 0℃ to 85℃ | 12 | V | ||
MVIN(acc) | Input voltage measurement accuracy datapoint | VINSNSM – AGND. TJ = 0℃ to 85℃ | 16 | V | ||
MVIN(acc) | Input voltage measurement accuracy | 8 V≤ VINSNSM ≤ 16 V | % | % | ||
MVIN(lsb) | Input voltage measurement bit resolution | VINSNSM – AGND | V | |||
MIIN(rng) | Input current measurement range | (B3h) PIN_SENSE_RES = 100b (1.0 mΩ), 101b (0.5 mΩ) | 0 | 32 | A | |
MIIN(acc) | Input current measurement accuracy datapoint | Room temp, PIN_SENSE_RES set accordingly | 15 | A | ||
MIIN(acc) | Input current measurement accuracy datapoint | Room temp, PIN_SENSE_RES set accordingly | 25 | A | ||
MIIN(acc) | Input current measurement accuracy | % | % | |||
MIIN(lsb) | Input current measurement bit resolution | A | ||||
MTSNS(rng) | Internal temperature sense range | –40 | 125 | °C | ||
MTSNS(acc) | Internal temperature sense accuracy datapoint | -40 | °C | |||
MTSNS(acc) | Internal temperature sense accuracy datapoint | 0 | °C | |||
MTSNS(acc) | Internal temperature sense accuracy datapoint | 25 | °C | |||
MTSNS(acc) | Internal temperature sense accuracy datapoint | 85 | °C | |||
MTSNS(acc) | Internal temperature sense accuracy datapoint | 125 | °C | |||
MTSNS(acc) | Internal temperature sense accuracy | –40°C ≤ TJ ≤ 125°C | % | % | ||
MTSNS(lsb) | Internal temperature sense bit resolution | °C | ||||
SVID Timing and Physical Characteristics | ||||||
CPAD_SVID | SVID pin pad capacitance(1) | 0 | 4 | pF | ||
CPIN_SVID | SVID pin capacitance(1) | 0 | 5 | pF | ||
VMAX_SVID | VDS max open drain buffer to accommodate ringing on bus | –1 | 3.3 | V | ||
VIL_SVID | SV_CLK, SV_DIO input low voltage | 0.45 | 0.5 | 0.55 | V | |
VIH_SVID | SV_CLK, SV_DIO input high voltage | 0.54 | 0.59 | 0.64 | V | |
VHYS_SVID | SV_CLK, SV_DIO input voltage hysteresis | 0.05 | V | |||
RRSVIDL | Open Drain Pulldown resistance | SV_DIO, SV_ALERT# pins pulldown resistance | 4 | 8 | 13 | Ω |
ILKG_SVID | Input leakage current | Pullup source = 5.5 V, off state | 20 | µA | ||
DCLK_SVID | SVID clock duty ratios (Period and duty cycle are measured with respect to 0.5 x VccIO) | 0.4 | 0.6 | |||
tCO_VR_SVID | VR Clock to Data delay without board parasitic | 12 | ns | |||
tSU_VR_SVID | Setup time of data at VR side | 7 | ns | |||
tH_VR_SVID | Hold time of data at VR side | 14 | ns | |||
tCO_CPU_SVID | CPU Clock to Data delay | Measured at bump | –3.6 | 0.65 | ns | |
tSU_CPU_SVID | Setup time of data at CPU side | 1 | ns | |||
tH_CPU_SVID | Hold time of data at CPU side | 3 | ns | |||
SRF_DATA | Falling slew rate of SV_DIO(1) | SV_DIO from 0.735V to 0.315V, Rpu=64.9Ω | 1.2 | 4 | V/ns | |
SRR_DATA | Rising slew rate of SV_DIO(1) | SV_DIO from 0.315V to 0.735V, Rpu=64.9Ω | 1.1 | 3.6 | V/ns | |
SRF_ALERT | Falling slew rate of SV_ALERT#(1) | SV_ALERT# from 0.735V to 0.315V, Rpu=75Ω | 1.25 | 4.2 | V/ns | |
SRR_ALERT | Rising slew rate of SV_ALERT#(1) | SV_ALERT# from 0.315V to 0.735V, Rpu=75Ω | 1.15 | 3.3 | V/ns | |
FREQSVID | Max SVID Clock frequency Support | 43 | MHz | |||
I2C Timing and Physical Characteristics | ||||||
FREQI2C | I2C operating frequency range | 50 | 1000 | kHz | ||
VIH_I2C | SM_CLK, SM_DIO High-level input voltage | 0.535 | 0.585 | 0.635 | V | |
VIL_I2C | SM_CLK, SM_DIO Low-level input voltage | 0.465 | 0.515 | 0.565 | V | |
VHYS_I2C | SM_CLK, SM_DIO Input voltage hysteresis | 0.05 | V | |||
NWRNVM | Number of NVM writeable cycles (1) | –40°C ≤ TJ ≤ 125°C | 1000 | Cycles | ||
CBUS_I2C | I2C bus capacitance on each bus line(1) | 0 | 400 | pF | ||
CPIN_I2C | I2C pin capacitance(1) | 0 | 10 | pF | ||
tH_STA | Hold time for a (repeated) START condition | 0.26 | µs | |||
tLOW | Low period of SM_CLK | 0.5 | µs | |||
tHIGH | High period of SM_CLK | 0.26 | µs | |||
tSU_STA | Setup time for a repeated START condition | 0.26 | µs | |||
tH_I2C | I2C DATA hold time | 0 | µs | |||
tSU_I2C | I2C DATA setup time | 50 | ns | |||
tR_I2C | SM_CLK and SM_DIO rise time(1) | 100 kHz class | 1000 | ns | ||
400 kHz class | 300 | ns | ||||
1000 kHz class | 120 | ns | ||||
tF_I2C | SM_CLK and SM_DIO fall time(1) | 100 kHz class | 1000 | ns | ||
400 kHz class | 300 | ns | ||||
1000 kHz class | 120 | ns | ||||
tSU_STO | Setup time for a STOP condition | 0.26 | µs | |||
tBUF | Bus free time between a STOP and START condition | 0.5 | µs |