ZHCSH55B December   2017  – September 2018 TPS65218D0

UNLESS OTHERWISE NOTED, this document contains PRODUCTION DATA.  

  1. 器件概述
    1. 1.1 特性
    2. 1.2 应用
    3. 1.3 说明
    4. 1.4 简化原理图
  2. 修订历史记录
  3. Pin Configuration and Functions
    1. 3.1 Pin Functions
      1.      Pin Functions
  4. Specifications
    1. 4.1 Absolute Maximum Ratings
    2. 4.2 ESD Ratings
    3. 4.3 Recommended Operating Conditions
    4. 4.4 Thermal Information
    5. 4.5 Electrical Characteristics
    6. 4.6 Timing Requirements
    7. 4.7 Typical Characteristics
  5. Detailed Description
    1. 5.1 Overview
    2. 5.2 Functional Block Diagram
    3. 5.3 Feature Description
      1. 5.3.1 Wake-Up and Power-Up and Power-Down Sequencing
        1. 5.3.1.1  Power-Up Sequencing
        2. 5.3.1.2  Power-Down Sequencing
        3. 5.3.1.3  Strobes 1 and 2
        4. 5.3.1.4  Supply Voltage Supervisor and Power Good (PGOOD)
        5. 5.3.1.5  Backup Supply Power-Good (PGOOD_BU)
        6. 5.3.1.6  Internal LDO (INT_LDO)
        7. 5.3.1.7  Current Limited Load Switches
          1. 5.3.1.7.1 Load Switch 1 (LS1)
          2. 5.3.1.7.2 Load Switch 2 (LS2)
          3. 5.3.1.7.3 Load Switch 3 (LS3)
        8. 5.3.1.8  LDO1
        9. 5.3.1.9  Coin Cell Battery Voltage Acquisition
        10. 5.3.1.10 UVLO
        11. 5.3.1.11 Power-Fail Comparator
        12. 5.3.1.12 Battery-Backup Supply Power-Path
        13. 5.3.1.13 DCDC3 / DCDC4 Power-Up Default Selection
        14. 5.3.1.14 I/O Configuration
          1. 5.3.1.14.1 Configuring GPO2 as Open-Drain Output
          2. 5.3.1.14.2 Using GPIO3 as Reset Signal to DCDC1 and DCDC2
        15. 5.3.1.15 Push Button Input (PB)
          1. 5.3.1.15.1 Signaling PB-Low Event on the nWAKEUP Pin
          2. 5.3.1.15.2 Push Button Reset
        16. 5.3.1.16 AC_DET Input (AC_DET)
        17. 5.3.1.17 Interrupt Pin (INT)
        18. 5.3.1.18 I2C Bus Operation
    4. 5.4 Device Functional Modes
      1. 5.4.1 Modes of Operation
      2. 5.4.2 OFF
      3. 5.4.3 ACTIVE
      4. 5.4.4 SUSPEND
      5. 5.4.5 RESET
    5. 5.5 Programming
      1. 5.5.1 Programming Power-Up Default Values
    6. 5.6 Register Maps
      1. 5.6.1 Password Protection
      2. 5.6.2 Freshness Seal (FSEAL) Bit
      3. 5.6.3 FLAG Register
      4. 5.6.4 TPS65218D0 Registers
        1. 5.6.4.1  CHIPID Register (subaddress = 0x0) [reset = 0x5]
          1. Table 5-8 CHIPID Register Field Descriptions
        2. 5.6.4.2  INT1 Register (subaddress = 0x1) [reset = 0x0]
          1. Table 5-9 INT1 Register Field Descriptions
        3. 5.6.4.3  INT2 Register (subaddress = 0x2) [reset = 0x0]
          1. Table 5-10 INT2 Register Field Descriptions
        4. 5.6.4.4  INT_MASK1 Register (subaddress = 0x3) [reset = 0x0]
          1. Table 5-11 INT_MASK1 Register Field Descriptions
        5. 5.6.4.5  INT_MASK2 Register (subaddress = 0x4) [reset = 0x0]
          1. Table 5-12 INT_MASK2 Register Field Descriptions
        6. 5.6.4.6  STATUS Register (subaddress = 0x5) [reset = 00XXXXXXb]
          1. Table 5-13 STATUS Register Field Descriptions
        7. 5.6.4.7  CONTROL Register (subaddress = 0x6) [reset = 0x0]
          1. Table 5-14 CONTROL Register Field Descriptions
        8. 5.6.4.8  FLAG Register (subaddress = 0x7) [reset = 0x0]
          1. Table 5-15 FLAG Register Field Descriptions
        9. 5.6.4.9  PASSWORD Register (subaddress = 0x10) [reset = 0x0]
          1. Table 5-16 PASSWORD Register Field Descriptions
        10. 5.6.4.10 ENABLE1 Register (subaddress = 0x11) [reset = 0x0]
          1. Table 5-17 ENABLE1 Register Field Descriptions
        11. 5.6.4.11 ENABLE2 Register (subaddress = 0x12) [reset = 0x0]
          1. Table 5-18 ENABLE2 Register Field Descriptions
        12. 5.6.4.12 CONFIG1 Register (subaddress = 0x13) [reset = 0x4C]
          1. Table 5-19 CONFIG1 Register Field Descriptions
        13. 5.6.4.13 CONFIG2 Register (subaddress = 0x14) [reset = 0xC0]
          1. Table 5-20 CONFIG2 Register Field Descriptions
        14. 5.6.4.14 CONFIG3 Register (subaddress = 0x15) [reset = 0x0]
          1. Table 5-21 CONFIG3 Register Field Descriptions
        15. 5.6.4.15 DCDC1 Register (offset = 0x16) [reset = 0x99]
          1. Table 5-22 DCDC1 Register Field Descriptions
        16. 5.6.4.16 DCDC2 Register (subaddress = 0x17) [reset = 0x99]
          1. Table 5-23 DCDC2 Register Field Descriptions
        17. 5.6.4.17 DCDC3 Register (subaddress = 0x18) [reset = 0x8C]
          1. Table 5-24 DCDC3 Register Field Descriptions
        18. 5.6.4.18 DCDC4 Register (subaddress = 0x19) [reset = 0xB2]
          1. Table 5-25 DCDC4 Register Field Descriptions
        19. 5.6.4.19 SLEW Register (subaddress = 0x1A) [reset = 0x6]
          1. Table 5-26 SLEW Register Field Descriptions
        20. 5.6.4.20 LDO1 Register (subaddress = 0x1B) [reset = 0x1F]
          1. Table 5-27 LDO1 Register Field Descriptions
        21. 5.6.4.21 SEQ1 Register (subaddress = 0x20) [reset = 0x0]
          1. Table 5-28 SEQ1 Register Field Descriptions
        22. 5.6.4.22 SEQ2 Register (subaddress = 0x21) [reset = 0x0]
          1. Table 5-29 SEQ2 Register Field Descriptions
        23. 5.6.4.23 SEQ3 Register (subaddress = 0x22) [reset = 0x98]
          1. Table 5-30 SEQ3 Register Field Descriptions
        24. 5.6.4.24 SEQ4 Register (subaddress = 0x23) [reset = 0x75]
          1. Table 5-31 SEQ4 Register Field Descriptions
        25. 5.6.4.25 SEQ5 Register (subaddress = 0x24) [reset = 0x12]
          1. Table 5-32 SEQ5 Register Field Descriptions
        26. 5.6.4.26 SEQ6 Register (subaddress = 0x25) [reset = 0x63]
          1. Table 5-33 SEQ6 Register Field Descriptions
        27. 5.6.4.27 SEQ7 Register (subaddress = 0x26) [reset = 0x3]
          1. Table 5-34 SEQ7 Register Field Descriptions
  6. Application and Implementation
    1. 6.1 Application Information
      1. 6.1.1 Applications Without Backup Battery
      2. 6.1.2 Applications Without Battery Backup Supplies
    2. 6.2 Typical Application
      1. 6.2.1 Design Requirements
      2. 6.2.2 Detailed Design Procedure
        1. 6.2.2.1 Output Filter Design
        2. 6.2.2.2 Inductor Selection for Buck Converters
        3. 6.2.2.3 Output Capacitor Selection
      3. 6.2.3 Application Curves
  7. Power Supply Recommendations
  8. Layout
    1. 8.1 Layout Guidelines
    2. 8.2 Layout Example
  9. 器件和文档支持
    1. 9.1 器件支持
      1. 9.1.1 第三方米6体育平台手机版_好二三四免责声明
    2. 9.2 文档支持
      1. 9.2.1 相关文档
    3. 9.3 接收文档更新通知
    4. 9.4 社区资源
    5. 9.5 商标
    6. 9.6 静电放电警告
    7. 9.7 Glossary
  10. 10机械、封装和可订购信息

封装选项

机械数据 (封装 | 引脚)
散热焊盘机械数据 (封装 | 引脚)
订购信息

Power-Up Sequencing

When the power-up sequence initiates, STROBE1 occurs, and any rail assigned to this strobe is enabled. After a delay time of DLY1, STROBE2 occurs and the rail assigned to this strobe is powered up. The sequence continues until all strobes occur and all DLYx times execute. Strobe assignments and delay times are defined in the SEQx registers, and are changed under I2C control. The power-up sequence executes if one of the following events occurs:

  • From the OFF state:
    • The push-button (PB) is pressed (falling edge on PB) OR
    • The AC_DET pin is pulled low (falling edge) OR
    • The PWR_EN is asserted (driven to high-level) OR
    • The main power is connected (IN_BIAS) and AC_DET is grounded AND
    • The device is not in undervoltage lockout (UVLO) or overtemperature shutdown (OTS).
  • From the PRE_OFF state:
    • The PB is pressed (falling edge on PB) OR
    • The AC_DET pin is pulled low (falling edge) OR
    • PWR_EN is asserted (driven to high-level) AND
    • The device is not in UVLO or OTS.
  • From the SUSPEND state:
    • The PB is pressed (falling edge on PB) OR
    • The AC_DET pin is pulled low (falling edge) OR
    • The PWR_EN pin is pulled high (level sensitive) AND
    • The device is not in UVLO or OTS.

When a power-up event is detected, the device enters a WAIT_PWR_EN state and triggers the power-up sequence. The device remains in WAIT_PWR_EN as long as the PWR_EN and either the PB or AC_DET pin are held low. If both, the PB and AC_DET return to logic-high state and the PWR_EN pin has not been asserted within 20 s of entering WAIT_PWR_EN state, the power-down sequence is triggered and the device returns to OFF state. Once PWR_EN is asserted, the device advances to ACTIVE state, which is functionally equivalent to WAIT_PWR_EN. However, the AC_DET pin is ignored and power-down is controlled by the PWR_EN pin only.

Rails not assigned to a strobe (SEQ = 0000b) are not affected by power-up and power-down sequencing and remain in their current ON/OFF state regardless of the sequencer. A rail can be enabled/disabled at any time by setting the corresponding enable bit in the ENABLEx register, with the exception that the ENABLEx register cannot be accessed while the sequencer is active. Enable bits always reflect the current enable state of the rail, for example the sequencer sets and resets the enable bits for the rails under its control.

NOTE

The power-up sequence is defined by strobes and delay times, and can be triggered by the PB, AC_DET (not shown, same as PB), or PWR_EN pin.

TPS65218D0 power_up_seq_lds206.gif
Push-button deglitch time is not shown.
Figure 5-1 Power-Up Sequences from OFF or SUSPEND State;
PB is Power-Up Event
TPS65218D0 tps65218-power-up-sequence-from-suspend-state.gifFigure 5-2 Power-Up Sequences from SUSPEND State;
PWR_EN is Power-Up Event
TPS65218D0 tps65218-power-up-sequence-from-recovery-state.gifFigure 5-3 Power-Up Sequences from RECOVERY State