SWCS046U March 2010 – October 2014 TPS65910
PRODUCTION DATA.
TI offers an extensive line of development tools, including tools to evaluate the performance of the processors, generate code, develop algorithm implementations, and fully integrate and debug software and hardware modules. The tool's support documentation is electronically available within the Code Composer Studio™ Integrated Development Environment (IDE).
The following products support development of the TPS65910 device applications:
Software Development Tools: Code Composer Studio™ Integrated Development Environment (IDE): including Editor C/C++/Assembly Code Generation, and Debug plus additional development tools Scalable, Real-Time Foundation Software (DSP/BIOS™), which provides the basic run-time target software needed to support any TPS65910 device application.
Hardware Development Tools: Extended Development System (XDS™) Emulator
For a complete listing of development-support tools for the TPS65910 platform, visit the Texas Instruments website at www.ti.com. For information on pricing and availability, contact the nearest TI field sales office or authorized distributor.
To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all microprocessors (MPUs) and support tools. Each device has one of three prefixes: X, P, or null (no prefix) (for example, TPS65910). Texas Instruments recommends two of three possible prefix designators for its support tools: TMDX and TMDS. These prefixes represent evolutionary stages of product development from engineering prototypes (TMDX) through fully qualified production devices and tools (TMDS).
Device development evolutionary flow:
Support tool development evolutionary flow:
X and P devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package type (for example, RSL) and the temperature range (for example, blank is the default commercial temperature range).
For orderable part numbers of TPS65910x devices in the RSL package types, see the Package Option Addendum of this document, the TI website (www.ti.com), or contact your TI sales representative.
The following documents describe the TPS65910 device. Copies of these documents are available on the Internet at www.ti.com.
The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy.
PARTS | PRODUCT FOLDER | SAMPLE & BUY | TECHNICAL DOCUMENTS | TOOLS & SOFTWARE | SUPPORT & COMMUNITY |
---|---|---|---|---|---|
TPS65910 | Click here | Click here | Click here | Click here | Click here |
TPS65910A | Click here | Click here | Click here | Click here | Click here |
TPS65910A3 | Click here | Click here | Click here | Click here | Click here |
TPS659101 | Click here | Click here | Click here | Click here | Click here |
TPS659102 | Click here | Click here | Click here | Click here | Click here |
TPS659103 | Click here | Click here | Click here | Click here | Click here |
TPS659104 | Click here | Click here | Click here | Click here | Click here |
TPS659105 | Click here | Click here | Click here | Click here | Click here |
TPS659106 | Click here | Click here | Click here | Click here | Click here |
TPS659107 | Click here | Click here | Click here | Click here | Click here |
TPS659108 | Click here | Click here | Click here | Click here | Click here |
TPS659109 | Click here | Click here | Click here | Click here | Click here |
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.
SmartReflex, E2E are trademarks of Texas Instruments.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Recipient agrees to not knowingly export or re-export, directly or indirectly, any product or technical data (as defined by the U.S., EU, and other Export Administration Regulations) including software, or any controlled product restricted by other applicable national regulations, received from disclosing party under nondisclosure obligations (if any), or any direct product of such technology, to any destination to which such export or re-export is restricted or prohibited by U.S. or other applicable laws, without obtaining prior authorization from U.S. Department of Commerce and other competent Government authorities to the extent required by those laws.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
Additional acronyms used in this data sheet are described below.
ACRONYM | DEFINITION |
---|---|
DDR | Dual-Data Rate (memory) |
ES | Engineering Sample |
ESD | Electrostatic Discharge |
FET | Field Effect Transistor |
EPC | Embedded Power Controller |
FSM | Finite State Machine |
GND | Ground |
GPIO | General-Purpose I/O |
HBM | Human Body Model |
HD | Hot-Die |
HS-I2C | High-Speed I2C |
I2C | Inter-Integrated Circuit |
IC | Integrated Circuit |
ID | Identification |
IDDQ | Quiescent supply current |
IEEE | Institute of Electrical and Electronics Engineers |
IR | Instruction Register |
I/O | Input/Output |
JEDEC | Joint Electron Device Engineering Council |
JTAG | Joint Test Action Group |
LBC7 | Lin Bi-CMOS 7 (360 nm) |
LDO | Low Drop Output voltage linear regulator |
LP | Low-Power application mode |
LSB | Least Significant Bit |
MMC | Multimedia Card |
MOSFET | Metal Oxide Semiconductor Field Effect Transistor |
NVM | Nonvolatile Memory |
OMAP™ | Open Multimedia Application Platform™ |
RTC | Real-Time Clock |
SMPS | Switched Mode Power Supply |
SPI | Serial Peripheral Interface |
POR | Power-On Reset |