ZHCSNX8B December 2020 – September 2023 TPS6593-Q1
PRODUCTION DATA
POS | PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|---|
Electrical Characteristics: CRYSTAL | |||||||
6.1 | Crystal frequency | 32768 | Hz | ||||
6.2 | Crystal frequency tolerance | Parameter of crystal, TJ = 25°C | –20 | 20 | ppm | ||
6.4 | Crystal series resistance | At fundamental frequency | 90 | kΩ | |||
6.5 | Oscillator drive power | The power dissipated in the crystal during oscillator operation | 0.1 | 0.5 | μW | ||
6.6 | Crystal Load capacitance(1) | Corresponding to crystal frequency, including parasitic capacitances | 6 | 12.5 | pF | ||
6.7 | Crystal shunt capacitance | Parameter of crystal | 1.4 | 2.6 | pF | ||
Electrical Characteristics: 32-kHz CRYSTAL OSCILLATOR EXTERNAL COMPONENTS | |||||||
6.7a | Load capacitance on OSC32KIN and OSC32KOUT (parallel mode, including parasitic of PCB for external capacitor)(2) | External Capacitors | 0 | 13 | pF | ||
6.7b | Internal Capacitors | 9.5 | 12 | 14.5 | pF | ||
Switching Characteristics: 32-kHz CRYSTAL OSCILLATOR CLOCK | |||||||
23.1 | Crystal Oscillator output frequency | Typical with specified load capacitors | 32768 | Hz | |||
23.2 | Crystal Oscillator Output duty cycle | Parameter of crystal, TJ = 25°C | 40% | 50% | 60% | ||
23.3 | Crystal Oscillator rise and fall time | 10% to 90%, with 10 pF load capacitance | 10 | 20 | ns | ||
23.4 | Crystal Oscillator Settling time | From Oscillator enable to reaching ±1% of final output frequency | 200 | ms | |||
Switching Characteristics: 20-MHz and 128-kHz RC OSCILLATOR CLOCK | |||||||
23.10 | 20 MHz RC Oscillator output frequency | 19 | 20 | 21 | MHz | ||
23.12 | 128 kHz RC Oscillator output frequency | 121 | 128 | 135 | kHz | ||
Switching Characteristics: DPLL, SYNCCLKIN, and SYNCCLKOUT | |||||||
22.1a | External input clock nominal frequency | EXT_CLK_FREQ = 0x0 | 1.1 | MHz | |||
22.1b | EXT_CLK_FREQ = 0x1 | 2.2 | |||||
22.1c | EXT_CLK_FREQ = 0x2 | 4.4 | |||||
22.2a | External input clock required accuracy from nominal frequency | SS_DEPTH = 0x0 | –18% | 18% | |||
22.2b | SS_DEPTH = 0x1 | –12% | 12% | ||||
22.2c | SS_DEPTH = 0x2 | –10% | 10% | ||||
22.13a | Logic low time for SYNCCLKIN clock | 40 | ns | ||||
22.13b | Logic high time for SYNCCLKIN clock | 40 | ns | ||||
22.3 | External clock detection delay for missing clock detection | 1.8 | µs | ||||
22.4 | External clock input debounce time for clock detection | 20 | µs | ||||
22.5 | Clock change delay (internal to external) | From valid clock detection to use of external clock | 600 | µs | |||
22.7a | SYNCCLKOUT clock nominal frequency | SYNCCLKOUT_FREQ_SEL = 0x1 | 1.1 | MHz | |||
22.7b | SYNCCLKOUT_FREQ_SEL = 0x2 | 2.2 | MHz | ||||
22.7c | SYNCCLKOUT_FREQ_SEL = 0x3 | 4.4 | MHz | ||||
22.8 | SYNCCLKOUT duty-cycle | Cycle-to-cycle | 40% | 50% | 60% | ||
22.9 | SYNCCLKOUT output buffer external load | 5 | 35 | 50 | pF | ||
22.11a | Spread spectrum variation for nominal switching frequency | SS_DEPTH = 0x1 | 6.3% | ||||
22.11b | SS_DEPTH = 0x2 | 8.4% | |||||
Timing Requirements: Clock Monitors | |||||||
26.7a | tlatency_CLKfail | Clock Monitor Failure signal latency from occurrence of error | Failure on 20MHz system clock | 10 | µs | ||
26.7b | Failure on 128KHz monitoring clock | 40 | µs | ||||
26.8 | tlatency_CLKdrift | Clock Monitor Drift signal latency from detection | 115 | µs | |||
26.9 | fsysclk | Internal system clock | 19 | 20 | 21 | MHz | |
26.10 | CLKdrift_TH | Threshold for internal system clock frequency drift detection | -20% | 20% | |||
26.11 | CLKfail_TH | Threshold for internal system clock stuck at high or stuck at low detection | 10 | MHz |