ZHCSNX8B December 2020 – September 2023 TPS6593-Q1
PRODUCTION DATA
POS | PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|---|
Electrical Characteristics | |||||||
9.1 | VPOR_Falling | VCCA UVLO/POR falling threshold | Measured on VCCA pin | 2.7 | 2.75 | 2.8 | V |
9.2 | VPOR_Rising | VCCA UVLO/POR rising threshold | Measured on VCCA pin | 2.7 | 3 | V | |
9.3 | VPOR_Hyst | VCCA UVLO/POR hysteresis | 100 | mV | |||
9.5aa | VVCCA_OVP_Rising | VCCA OVP rising threshold | Measured on VCCA pin. VCCA_PG_SET = 0b | 3.9 | 4.0 | 4.1 | V |
9.5ab | Measured on VCCA pin. VCCA_PG_SET = 1b | 5.6 | 5.7 | 5.8 | V | ||
9.5b | VVCCA_OVP_Hyst | VCCA OVP hysteresis | 50 | mV | |||
9.15 | VVCCA_PVIN_SR | Input slew rate of VCCA and PVIN_x supplies | Measured at VCCA and PVIN_x pins as voltage rises from 0V to VPOR_Rising | 60 | mV/µs | ||
9.16 | VVIO_SR | Input slew rate of VIO supply | Measured at VIO pin as voltage rises from 0V to VPOR_Rising | 60 | mV/µs | ||
9.17 | VVBACKUP_SR | Input slew rate of VBACKUP supply | Measured at VBACKUP pin | 60 | mV/µs | ||
Timing Requirements | |||||||
26.3a | tlatency_VCCAOVP | VCCA_OVP signal latency from detection | VCCA_PG_SEL = 0b. Total delay from detection of VCCA_OVP to the rise of VCCA_OVP_INT | 15 | µs | ||
26.3b | VCCA_PG_SEL = 1b. Total delay from detection of VCCA_OVP to the rise of VCCA_OVP_INT | 15 | µs | ||||
26.4 | tlatency_VCCAUVLO | VCCA_UVLO signal latency from detection | Measured time between VVCCA falling from 3.3 V to 2.7 V with ≤ 100mv/µs slope, to the detection of VCCA_UVLO signal | 10 | µs | ||
26.5 | tlatency_VINT | LDOVINT OVP and UVLO signal latency from detection | With 25-mV overdrive |
12 | µs | ||
26.15 | tLBISTrun | Run time for LBIST | 1.8 | ms | |||
26.16 | tINIT_NVM_ANALOG | Device initialization time to load default values for NVM registers, and start-up analog circuits | 2 | ms | |||
26.17 | tINIT_REF_CLK_LDO | Device initialization time for reference bandgaps, system clock, and internal LDOs | 1 | ms |