SBVS080J September 2006 – November 2016 TPS75100 , TPS75103 , TPS75105
PRODUCTION DATA.
请参考 PDF 数据表获取器件具体的封装图。
Two evaluation modules (EVMs) are available to assist in the initial circuit performance evaluation using the TPS7510x. The TPS75105EVM-174 and TPS75105DSKEVM-529 evaluation modules (and related user guides) can be requested at the Texas Instruments website through the product folders or purchased directly from the TI eStore.
PRODUCT ID | OPTIONS(1)(2) |
---|---|
TPS7510x yyyz | X is the nominal default diode output current (for example, 3 = 3 mA, 5 = 5 mA, and 0 = 10 mA). YYY is the package designator. Z is the reel quantity (R = 3000, T = 250). |
For related documentation see the following:
The table below lists quick access links. Categories include technical documents, support and community resources, tools and software, and quick access to sample or buy.
PARTS | PRODUCT FOLDER | SAMPLE & BUY | TECHNICAL DOCUMENTS | TOOLS & SOFTWARE | SUPPORT & COMMUNITY |
---|---|---|---|---|---|
TPS75100 | Click here | Click here | Click here | Click here | Click here |
TPS75103 | Click here | Click here | Click here | Click here | Click here |
TPS75105 | Click here | Click here | Click here | Click here | Click here |
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.