SLUSE50 November 2023 TPS92642-Q1
PRODUCTION DATA
Table 6-1 summarizes the device behavior under fault conditions.
FAULT | DETECTION | DESCRIPTION | ||
---|---|---|---|---|
Thermal protection | TJ > 175°C | The thermal protection is activated in the event the maximum MOSFET temperature exceeds the typical value of 175°C. This feature is designed to prevent overheating and damage to the internal switching MOSFETs. | ||
VCC undervoltage lockout | VCC(RISE) < 4.4 V | The device enters the Undervoltage Lockout (UVLO). The switching operation is disabled, the COMP capacitor is discharged. | ||
VCC(FALL) < 4.2 V | ||||
VIN undervoltage lockout | VUDIM < 1.12 V | The device disables switching operation for the corresponding channel. Switching is enabled when the input voltage rises above the turn-on threshold, VIN(DO,RISE). | ||
BST undervoltage lockout | VBST(RISE) < 3.4 V | The device turns off the high-side MOSFET and turns on the low-side MOSFET for the corresponding channel. Normal switching operation is resumed after the bootstrap voltage exceeds 3.2 V. | ||
VBST(FALL) < 3.2 V | ||||
COMP overvoltage | VCOMP > 3.2 V | The FLT flag is set low to indicate that the COMP voltage exceeded the normal operating range. This condition indicates output open-circuit fault. | ||
Short output | VCSN < 1.5 V | The FLT flag is set low to indicate an output short-circuit condition based on sensed CSN voltage. | ||
High-side switch current limit | IHS > 8.6 A | The device turns off the high-side MOSFET, turns on low-side MOSFET and discharges the COMP capacitor. The device attempts to restart after a delay of 5.5 ms. | ||
Low-side switch current limit | ILS > 3.2 A | The device turns off both high-side and low-side MOSFETs and discharges the COMP capacitor. The device attempts to restart after a delay of 5.5 ms. |
Output open and short circuit faults force the FLT pin low when biased through an external resistor and connected to a 5-V supply. The FLT output can be used in conjunction with a microcontroller or system basis chip (SBC) as an interrupt and aid in fault diagnostics.