ZHCSR75 November 2022 TPSM82902
PRODUCTION DATA
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Detailed Description
- 7.1 Overview
- 7.2 Functional Block Diagram
- 7.3
Feature Description
- 7.3.1 Mode Selection and Device Configuration (MODE/S-CONF)
- 7.3.2 Adjustable VO Operation (External Voltage Divider)
- 7.3.3 Setable VO Operation (VSET and Internal Voltage Divider)
- 7.3.4 Soft Start/Tracking (SS/TR)
- 7.3.5 Smart Enable with Precise Threshold
- 7.3.6 Power Good (PG)
- 7.3.7 Undervoltage Lockout (UVLO)
- 7.3.8 Current Limit And Short Circuit Protection
- 7.3.9 Thermal Shutdown
- 7.4 Device Functional Modes
- 8 Application and Implementation
- 9 Device and Documentation Support
- 10Mechanical, Packaging, and Orderable Information
9.5 Electrostatic Discharge Caution
 |
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |