6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)(2) | MIN | MAX | UNIT |
|---|
| VCC |
Supply voltage(3) |
–0.5 |
6 |
V |
| VI/O |
Input/Output DC voltage (D+, D-)(3) |
–0.5 |
20 |
V |
| VI/O |
Input/Output DC voltage (D1+/D1-, D2+/D2-) (3) |
–0.5 |
6 |
V |
| VI |
Digital input voltage (SEL1, SEL2, OE) |
–0.5 |
6 |
V |
| VO |
Digital output voltage (FLT) |
–0.5 |
6 |
V |
| IK |
Input-output port diode current (D+, D-, D1+, D1-, D2+, D2-) |
VIN < 0 |
–50 |
| mA |
| IIK |
Digital logic input clamp current (SEL1, SEL2, OE) (3) |
VI < 0 |
–50 |
| mA |
| ICC |
Continuous current through VCC |
| 100 |
mA |
| IGND |
Continuous current through GND |
–100 |
| mA |
| Tstg |
Storage temperature |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.
(3) All voltages are with respect to ground, unless otherwise specified.