7 Specifications
7.1 Absolute Maximum Ratings(1)
over operating free-air temperature range (unless otherwise noted)
|
MIN |
MAX |
UNIT |
Supply Voltage Range |
VDD Steady-state supply voltage |
–0.3 |
1.4 |
V |
VDD33 Steady-state supply voltage |
–0.3 |
3.8 |
V |
Voltage Range |
USB_SSRXP_UP, USB_SSRXN_UP, USB_SSRXP_DN[4:1], USB_SSRXN_DP[4:1] and USB_VBUS terminals |
-0.3 |
1.4 |
V |
XI terminals |
-0.3 |
2.45 |
V |
All other terminals |
-0.3 |
3.8 |
V |
Storage temperature, Tstg |
–65 |
150 |
°C |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
|
MIN |
MAX |
UNIT |
Tstg |
Storage temperature range |
–65 |
150 |
°C |
V(ESD) |
Electrostatic discharge |
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) |
–2000 |
2000 |
V |
Charged device model (CDM), per JEDEC specification JESD22-C101, all pins(2) |
–500 |
500 |
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
|
MIN |
NOM |
MAX |
UNIT |
VDD(1) |
1.1-V supply voltage |
0.99 |
1.1 |
1.26 |
V |
VDD33 |
3.3-V supply voltage |
3 |
3.3 |
3.6 |
V |
USB_VBUS |
Voltage at USB_VBUS PAD |
0 |
|
1.155 |
V |
TA |
Operating free-air temperature range |
TUSB8020B |
0 |
25 |
70 |
°C |
TUSB8020BI |
–40 |
25 |
85 |
TJ |
Operating junction temperature range |
–40 |
25 |
105 |
°C |
(1) A 1.05-V, 1.1-V, or 1.2-V supply may be used as long as minimum and maximum supply conditions are met.
7.4 Thermal Information
THERMAL METRIC(1) |
TUSB8020B |
UNIT |
PHP |
48 PINS |
RθJA |
Junction-to-ambient thermal resistance |
31.8 |
°C/W |
RθJC(top) |
Junction-to-case (top) thermal resistance |
16.1 |
°C/W |
RθJB |
Junction-to-board thermal resistance |
13 |
°C/W |
ψJT |
Junction-to-top characterization parameter |
0.5 |
°C/W |
ψJB |
Junction-to-board characterization parameter |
12.9 |
°C/W |
RθJC(bot) |
Junction-to-case (bottom) thermal resistance |
0.9 |
°C/W |
7.5 3.3-V I/O Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER |
OPERATION |
TEST CONDITIONS |
MIN |
TYP |
MAX |
UNIT |
VIH |
High-level input voltage(1) |
VDD33 |
|
2 |
|
VDD33 |
V |
VIL |
Low-level input voltage(1) |
VDD33 |
|
0 |
|
0.8 |
V |
VI |
Input voltage |
|
|
0 |
|
VDD33 |
V |
VO |
Output voltage(2) |
|
|
0 |
|
VDD33 |
V |
tt |
Input transition time (trise and tfall) |
|
|
0 |
|
25 |
ns |
Vhys |
Input hysteresis(3) |
|
|
|
|
0.13 × VDD33 |
V |
VOH |
High-level output voltage |
VDD33 |
IOH = –4 mA |
2.4 |
|
|
V |
VOL |
Low-level output voltage |
VDD33 |
IOL = 4 mA |
|
|
0.4 |
V |
IOZ |
High-impedance, output current(2) |
VDD33 |
VI = 0 to VDD33 |
|
|
±20 |
µA |
IOZP |
High-impedance, output current with internal pullup or pulldown resistor(4) |
VDD33 |
VI = 0 to VDD33 |
|
|
±225 |
µA |
II |
Input current(5) |
VDD33 |
VI = 0 to VDD33 |
|
|
±15 |
µA |
(1) Applies to external inputs and bidirectional buffers
(2) Applies to external outputs and bidirectional buffers
(3) Applies to GRSTz
(4) Applies to pins with internal pullups/pulldowns
(5) Applies to external input buffers
7.6 Power-Up Timing Requirements
|
MIN |
TYP |
MAX |
UNIT |
td1 |
VDD33 stable before VDD stable. No timing relationship between VDD33 and VDD |
0 |
|
|
ms |
td2 |
VDD and VDD33 stable before deassertion of GRSTZ. |
3 |
|
|
ms |
tsu_io |
Setup for MISC inputs sampled at the deassertion of GRSTZ(1) |
0.1 |
|
|
µs |
thd_io |
Hold for MISC inputs sampled at the deassertion of GRSTZ.(1) |
0.1 |
|
|
µs |
tVDD33_RAMP |
VDD33 supply ramp requirements |
0.2 |
|
100 |
ms |
tVDD_RAMP |
VDD supply ramp requirements |
0.2 |
|
100 |
ms |
(1) Miscellaneous pins sampled at deassertion of GRSTZ: FULLPWRMGMTz, GANGED, PWRCTL_POL, SMBUSz, BATEN1, and BATEN2
Figure 1. Power-Up Timing Requirements
7.7 Hub Input Supply Current
Typical values measured at TA = 25°C
PARAMETER |
VDD33 |
VDD11 |
UNIT |
3.3 V |
1.1 V |
LOW-POWER MODES |
Power-on (after reset) |
5 |
39 |
mA |
Disconnect from host |
5 |
39 |
mA |
Suspend (USB2 host) |
5 |
39 |
mA |
Suspend (USB3 host) |
6 |
40 |
mA |
ACTIVE MODES (US STATE / DS STATE) |
3.0 host / 1 SS device and hub in U1 |
50 |
218 |
mA |
3.0 host / 1 SS device and hub in U0 |
50 |
342 |
mA |
3.0 host / 2 SS devices and hub in U1 |
50 |
284 |
mA |
3.0 host / 2 SS devices and hub in U0 |
50 |
456 |
mA |
3.0 host / 1 SS and 1 HS device in U1 |
92 |
242 |
mA |
3.0 host / 1 SS and 1 HS device in U0 |
93 |
364 |
mA |
2.0 host / 1 HS device active |
48 |
71 |
mA |
2.0 host / 2 HS devices active |
60 |
80 |
mA |
SMBUS Programming current |
79 |
225 |
mA |