ZHCSMX9B April 2021 – March 2022 TXU0104-Q1
PRODUCTION DATA
- 1 特性
- 2 应用
- 3 说明
- 4 Revision History
- 5 Related Products
- 6 Pin Configuration and Functions—TXU0104-Q1
-
7 Specifications
- 7.1 Absolute Maximum Ratings
- 7.2 ESD Ratings
- 7.3 Recommended Operating Conditions
- 7.4 Thermal Information
- 7.5 Electrical Characteristics
- 7.6 Switching Characteristics: Tsk, TMAX
- 7.7 Switching Characteristics, VCCA = 1.2 ± 0.1 V
- 7.8 Switching Characteristics, VCCA = 1.5 ± 0.1 V
- 7.9 Switching Characteristics, VCCA = 1.8 ± 0.15 V
- 7.10 Switching Characteristics, VCCA = 2.5 ± 0.2 V
- 7.11 Switching Characteristics, VCCA = 3.3 ± 0.3 V
- 7.12 Switching Characteristics, VCCA = 5.0 ± 0.5 V
- 7.13 Operating Characteristics
- 7.14 Typical Characteristics
- 8 Parameter Measurement Information
-
9 Detailed Description
- 9.1 Overview
- 9.2 Functional Block Diagram
- 9.3
Feature Description
- 9.3.1 CMOS Schmitt-Trigger Inputs with Integrated Pulldowns
- 9.3.2 Control Logic (OE) with VCC(MIN) Circuitry
- 9.3.3 Balanced High-Drive CMOS Push-Pull Outputs
- 9.3.4 Partial Power Down (Ioff)
- 9.3.5 VCC Isolation and VCC Disconnect
- 9.3.6 Over-Voltage Tolerant Inputs
- 9.3.7 Glitch-Free Power Supply Sequencing
- 9.3.8 Negative Clamping Diodes
- 9.3.9 Fully Configurable Dual-Rail Design
- 9.3.10 Supports High-Speed Translation
- 9.3.11 Wettable Flanks
- 9.4 Device Functional Modes
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
封装选项
机械数据 (封装 | 引脚)
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- BQA|14
订购信息
13.6 Electrostatic Discharge Caution
 |
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |