ZHCSN70F November 2002 – November 2023 UCC27423 , UCC27424 , UCC27425
PRODUCTION DATA
请参考 PDF 数据表获取器件具体的封装图。
Figure 8-5 and Figure 8-6 shows rising/falling time and turn-on/off propagation delay testing waveform in room temperature for UCC27424, and waveform measurement data (see the bottom part of the waveform). Each channel, INA/INB/OUTA/OUTB, is labeled and displayed on the left hand of the waveforms.
The load capacitance testing condition is 1.8 nF, VDD = 12 V, and f = 300 kHz.
HI and LI share one same input from function generator, therefore, besides the propagation delay and rising/falling time, the difference of the propagation delay between HO and LO gives the propagation delay matching data.
Note the linear rise and fall edges of the switching waveforms. This is due to the constant output current characteristic of the driver as opposed to the resistive output impedance of traditional MOSFET-based gate drivers.