ZHCSDP3A December 2014 – May 2015 UCC27528-Q1
PRODUCTION DATA.
MIN | MAX | UNIT | ||
---|---|---|---|---|
Supply voltage range | VDD | –0.3 | 20 | V |
INA, INB, voltage(3) | –6.5 | 20 | V | |
ENA, ENB voltage(3) | –0.3 | 20 | V | |
OUTA, OUTB voltage | DC | –0.3 | VDD + 0.3 | V |
Repetitive pulse < 200 ns(4) | –2 | VDD + 0.3 | ||
Output continuous source and sink current | IOUT_DC | 0.3 | A | |
Output pulsed source and sink current (0.5 µs) | IOUT_pulsed | 5 | A | |
Operating virtual junction temperature, TJ | –40 | 150 | °C | |
Lead temperature | Soldering, 10 s | 300 | °C | |
Reflow | 260 | |||
Storage temperature, Tstg | –65 | 150 | °C |
VALUE | UNIT | |||
---|---|---|---|---|
V(ESD) | Electrostatic discharge | Human-body model (HBM), per AEC Q100-002(1) | ±4000 | V |
Charged-device model (CDM), per AEC Q100-011 | ±1000 |
MIN | NOM | MAX | UNIT | |||
---|---|---|---|---|---|---|
VDD | Supply voltage | 4.5 | 12 | 18 | V | |
Input voltage | INA, INB | –5 | 18 | V | ||
Enable voltage | ENA and ENB | 0 | 18 | V | ||
Operating junction temperature | –40 | 140 | °C |
THERMAL METRIC(1) | D | UNIT | |
---|---|---|---|
8 PINS | |||
RθJA | Junction-to-ambient thermal resistance | 128 | °C/W |
RθJC(top) | Junction-to-case (top) thermal resistance | 77.7 | |
RθJB | Junction-to-board thermal resistance | 68.5 | |
ψJT | Junction-to-top characterization parameter | 20.7 | |
ψJB | Junction-to-board characterization parameter | 68 | |
RθJC(bot) | Junction-to-case (bottom) thermal resistance | n/a |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
---|---|---|---|---|---|---|---|
BIAS CURRENTS | |||||||
IDD(off) | Startup current | VDD = 3.4 V, INA = VDD, INB = VDD | 55 | 125 | 225 | μA | |
VDD = 3.4 V, INA = GND, INB = GND | 25 | 125 | 225 | ||||
UNDERVOLTAGE LOCKOUT (UVLO) | |||||||
VON | Supply start threshold | TJ = 25°C | 3.91 | 4.2 | 4.5 | V | |
TJ = –40°C to 140°C | 3.75 | 4.2 | 4.65 | ||||
VOFF | Minimum operating voltage after supply start | 3.6 | 3.9 | 4.4 | |||
VDD_H | Supply voltage hysteresis | 0.2 | 0.3 | 0.5 | |||
INPUTS (INA, INB) | |||||||
VIN_H | Input signal high threshold | Output high for non-inverting input pins Output low for inverting input pins |
55 | 70 | %VDD | ||
VIN_L | Input signal low threshold | Output low for non-inverting input pins Output high for inverting input pins |
30 | 38 | |||
VIN_HYS | Input hysteresis | 17 | |||||
ENABLE (ENA, ENB) | |||||||
VEN_H | Enable signal high threshold | Output enabled | 1.7 | 1.9 | 2.1 | V | |
VEN_L | Enable signal low threshold | Output disabled | 0.95 | 1.10 | 1.25 | ||
VEN_HYS | Enable hysteresis | 0.7 | 0.8 | 1.1 | |||
OUTPUTS (OUTA, OUTB) | |||||||
ISNK/SRC | Sink and source peak current(1) | CLOAD = 0.22 µF, fSW = 1 kHz | ±5 | A | |||
VDD–VOH | High output voltage | IOUT = –10 mA | 0.075 | V | |||
VOL | Low output voltage | IOUT = 10 mA | 0.01 | ||||
ROH | Output pullup resistance(2) | IOUT = –10 mA | 2.5 | 5 | 7.5 | Ω | |
ROL | Output pulldown resistance | IOUT = 10 mA | 0.15 | 0.5 | 1 | Ω |
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
tR | Rise time | CLOAD = 1.8 nF, VDD = 10 V | 7 | ns | ||
tF | Fall time | CLOAD = 1.8 nF, VDD = 10 V | 6 | ns | ||
tM | Delay matching between 2 channels | INA = INB, OUTA and OUTB at 50% transition point, VDD = 10 V | 1 | 4 | ns | |
tPW | Minimum input pulse width that changes the output state | VDD = 10 V | 15 | ns | ||
tD1, tD2 | Input to output propagation delay, See Figure 2. | CLOAD = 1.8 nF, 7-V input pulse, VDD = 10 V |
6 | 17 | 26 | ns |
tD3, tD4 | EN to output propagation delay, See Figure 1 . |
CLOAD = 1.8 nF, 7-V enable pulse, VDD = 10 V | 6 | 13 | 23 | ns |
VDD = 3.4 V | ||
VDD = 12 V |
VDD = 12 V |
VDD = 12 V | IOUT = 10 mA |
VDD = 10 V | CLOAD = 1.8 nF |
VDD = 10 V |
Both Channels Switching | CLOAD = 1.8 nF |
CLOAD = 1.8 nF |
VDD = 4.5 V |
VDD = 12 V | CLOAD = 500 pF | Both Channels Switching |
fSW = 500 kHz |
VDD = 12 V |
VDD = 12 V | IOUT = 10 mA |
VDD = 10 V | CLOAD = 1.8 nF |
VDD = 10 V |
CLOAD = 1.8 nF |
CLOAD = 1.8 nF |