SLUS161F April 1999 – May 2020 UCC2813-0 , UCC2813-1 , UCC2813-2 , UCC2813-3 , UCC2813-4 , UCC2813-5 , UCC3813-0 , UCC3813-1 , UCC3813-2 , UCC3813-3 , UCC3813-4 , UCC3813-5
PRODUCTION DATA.
- 1 Features
- 2 Applications
- 3 Description
- 4 Revision History
- 5 Device Comparison Table
- 6 Pin Configuration and Functions
- 7 Specifications
-
8 Detailed Description
- 8.1 Overview
- 8.2 Functional Block Diagram
- 8.3
Feature Description
- 8.3.1 Detailed Pin Descriptions
- 8.3.2 Undervoltage Lockout (UVLO)
- 8.3.3 Self-Biasing, Active Low Output
- 8.3.4 Reference Voltage
- 8.3.5 Oscillator
- 8.3.6 Synchronization
- 8.3.7 PWM Generator
- 8.3.8 Minimum Off-Time Adjustment (Dead-Time Control)
- 8.3.9 Leading Edge Blanking
- 8.3.10 Minimum Pulse Width
- 8.3.11 Current Limiting
- 8.3.12 Overcurrent Protection and Full-Cycle Restart
- 8.3.13 Soft Start
- 8.3.14 Slope Compensation
- 8.4 Device Functional Modes
-
9 Application and Implementation
- 9.1 Application Information
- 9.2
Typical Application
- 9.2.1 Design Requirements
- 9.2.2
Detailed Design Procedure
- 9.2.2.1 Bulk Capacitor Calculation
- 9.2.2.2 Transformer Design
- 9.2.2.3 MOSFET and Output Diode Selection
- 9.2.2.4 Output Capacitor Calculation
- 9.2.2.5 Current Sensing Network
- 9.2.2.6 Gate Drive Resistor
- 9.2.2.7 REF Bypass Capacitor
- 9.2.2.8 RT and CT
- 9.2.2.9 Start-Up Circuit
- 9.2.2.10 Voltage Feedback Compensation Procedure
- 9.2.3 Application Curves
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
12.6 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.