ZHCSMR1C october 2019 – september 2021 UCC5870-Q1
PRODUCTION DATA
Table 7-4 lists the memory-mapped registers for the device registers. All register offset addresses not listed in Table 7-4 should be considered as reserved locations and the register contents should not be modified.
Offset | Acronym | Register Name: description | SPI write access enabled state | Section | Covered by Configuration Data CRC? |
---|---|---|---|---|---|
0x0 | CFG1 | Configuration register 1: Primary side device configuration. VCC1 UVLO and OVLO, IO deglitch timer, Over temperature, nFLT2 pin function, and dead time setting. | Configuration 2 | Go | Yes |
0x1 | CFG2 | Configuration register 2: nFLT1,2 pin function setting. | Configuration 2 | Go | Yes |
0x2 | CFG3 | Configuration register 3: Gate driver output fault reaction setting | Configuration 2 | Go | Yes |
0x3 | CFG4 | Configuration register 4: Protection and monitoring function setting. Enabling or disabling of the functions. | Configuration 2 | Go | Yes |
0x4 | CFG5 | Configuration register 5: Protection and monitoring function setting. Enabling or disabling of the functions. Threshold setting. | Configuration 2 | Go | Yes |
0x5 | CFG6 | Configuration Registers 6: Protection and monitoring function setting. Enabling or disabling of the functions. Threshold and timer setting. | Configuration 2 | Go | Yes |
0x6 | CFG7 | Configuration Registers 7: Protection and monitoring function setting. Enabling or disabling of the functions. Threshold and timer setting. | Configuration 2 | Go | Yes |
0x7 | CFG8 | Configuration register 8: Protection and monitoring function setting. Enabling or disabling of the functions. Threshold and timer setting. | Bit15-7,5-3: Configuration 2;Bit6,2-0,: Configuration 2; Active | Go | Yes |
0x8 | CFG9 | Configuration register 9: nFLT1,2 pin function setting. | Configuration 2 | Go | Yes |
0x9 | CFG10 | Configuration register 10: Gate driver output fault reaction setting. | Configuration 2 | Go | Yes |
0xA | CFG11 | Configuration register 11: Gate driver output fault reaction setting | Configuration 2 | Go | Yes |
0xB | ADCDATA1 | ADC data register 1: Digital representation of sampled AI1 voltage | Go | No | |
0xC | ADCDATA2 | ADC data register 2: Digital representation of sampled AI3 voltage | Go | No | |
0xD | ADCDATA3 | ADC data register 3: Digital representation of sampled AI5 voltage | Go | No | |
0xE | ADCDATA4 | ADC data register 4: Digital representation of sampled AI2 voltage | Go | No | |
0xF | ADCDATA5 | ADC data register 5: Digital representation of sampled AI4 voltage | Go | No | |
0x10 | ADCDATA6 | ADC data register 6: Digital representation of sampled AI6 voltage | Go | No | |
0x11 | ADCDATA7 | ADC data register 7: Digital representation of sampled internal die temperature | Go | No | |
0x12 | ADCDATA8 | ADC data register 8: Digital representation of sampled divided OUTH voltage for VGTH monitor | Go | No | |
0x13 | CRCDATA | SPI CRC Data Register | Configuration 2 | Go | Yes |
0x14 | SPITEST | SPI read/write test Register | Configuration 2, Active | Go | Yes |
0x15 | GDADDRESS | Driver address register | Configuration 1 | Go | Yes |
0x16 | STATUS1 | Status register 1: Fault status. | Go | No | |
0x17 | STATUS2 | Status register 2: Fault and pin status. | Go | No | |
0x18 | STATUS3 | Status register 3: Fault status. | Go | No | |
0x19 | STATUS4 | Status register 4: Fault status. | Go | No | |
0x1A | STATUS5 | Status register 5: Fault status. | Go | No | |
0x1B | CONTROL1 | Control register 1: Diagnostic commands. | Configuration 2, Active | Go | Yes |
0x1C | CONTROL2 | Control register 2: Diagnostic commands. | Configuration 2, Active | Go | Yes |
0x1D | ADCCFG | ADC setting | Configuration 2 | Go | Yes |
0x1E | DOUTCFG | DOUT function setting | Configuration 2 | Go | Yes |
Complex bit access types are encoded to fit into small table cells. Table 7-5 shows the codes that are used for access types in this section.
Access Type | Code | Description |
---|---|---|
Read Type | ||
R | R | Read |
Write Type | ||
W | W | Write |
Reset or Default Value | ||
-n | Value after reset or the default value |
CFG1 is shown in Figure 7-45 and described in Table 7-6.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
UV1_DIS | UVLO1_LEVEL | OVLO1_LEVEL | IO_DEGLITCH | GD_TWN_PRI_EN | Reserved | OV1_DIS | |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x1 | R/W-0x1 | R/W-0x0 | RW-0x0 | |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | NFLT2_DOUT_MUX | TDEAD | |||||
RW-0x0 | R/W-0x0 | R/W-0x0 | |||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | UV1_DIS | R/W | 0x0 |
VCC1 UVLO disable: 0x0 = Enabled 0x1 = Disabled |
14 | UVLO1_LEVEL | R/W | 0x0 |
VCC1 UVLO setting: 0x0 = 2.45V (3.3V logic rail) 0x1 = 4.35V (5V logic rail) |
13 | OVLO1_LEVEL | R/W | 0x0 |
VCC1 OVLO setting: 0x0 = 5.65V (5V logic rail) 0x1 = 4.15V (3.3V logic rail) |
12-11 | IO_DEGLITCH | R/W | 0x1 |
IO deglitch (INP and INN) filter time: 0x0 = Deglitch filter bypassed 0x1 = 70ns setting 0x2 = 140ns setting 0x3 = 210ns setting |
10 | GD_TWN_PRI_DIS | R/W | 0x1 |
Over temperature warning of gate driver VCC1 side enable: 0x0 = Enabled 0x1 = Disabled |
9 | RESERVED | R/W | 0x0 |
This bit field is reserved. |
8 | OV1_DIS | R/W | 0x0 |
VCC1 OVLO disable: 0x0 = Enabled 0x1 = Disabled |
7 | RESERVED | R/W | 0x0 |
This bit field is reserved. |
6 | NFLT2_DOUT_MUX | R/W | 0x0 |
nFLT2/DOUT pin function selection: 0x0 = nFLT2 0x1 = DOUT. When this setting is selected, all warnings selected to output to nFLT2 are output on nFLT1. |
5-0 | TDEAD | R/W | 0x0 |
Shoot-through protection dead time: 0x0 = No added deadtime (Interlock function enabled) 0x1 - 0x3F = 105ns to 4445ns with 70ns resolution Deadtime = code(decimal) x 70ns + 105ns |
CFG2 is shown in Figure 7-46 and described in Table 7-7.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
INT_COMM_PRI_FAULT_P | OVLO1_FAULT_P | UVLO1_FAULT_P | STP_FAULT_P | CLK_MON_PRI_FAULT_P | SPI_FAULT_P | CFG_CRC_PRI_FAULT_P | |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x1 | R/W-0x0 | |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
INT_REG_PRI_FAULT_P | TRIM_CRC_PRI_FAULT _P | BIST_PRI_FAULT_P | RESERVED | RESERVED | GD_TWN_PRI_FAULT_P | VREG1_ILIMIT_FAULT_P | PWM_CHK_FAULT_P |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | RW-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | INT_COMM_PRI_FAULT_P | R/W | 0x0 |
Report inter-die communication failure to nFLT1 output: 0x0 = No 0x1 = Yes |
14 | OVLO1_FAULT_P | R/W | 0x0 |
Report VCC1 OVLO fault to nFLT1 output: 0x0 = Yes 0x1 = No |
13 | UVLO1_FAULT_P | R/W | 0x0 |
Report VCC1 UVLO fault to nFLT1 output: 0x0 = Yes 0x1 = No |
12 | STP_FAULT_P | R/W | 0x0 |
Report STP fault to nFLT1 output: 0x0 = Yes 0x1 = No |
11 | CLK_MON_PRI_FAULT_P | R/W | 0x0 |
Report clock monitor fault to nFLT1 output: 0x0 = Yes 0x1 = No |
10-9 | SPI_FAULT_P | R/W | 0x1 |
Report SPI fault to nFLT* outputs: 0x0 = nFLT1 0x1 = nFLT2 0x2 = No report 0x3 = RESERVED |
8 | CFG_CRC_PRI_FAULT_P | R/W | 0x0 |
Report configuration register CRC fault to nFLT1 output: 0x0 = Yes 0x1 = No |
7 | INT_REG_PRI_FAULT_P | R/W | 0x0 |
Report internal regulator fault to nFLT1 output: 0x0 = Yes 0x1 = No |
6 | TRIM_CRC_PRI_FAULT_P | R/W | 0x0 |
Report TRIM CRC fault to nFLT* outputs: 0x0 = Yes 0x1 = No |
5 | BIST_PRI_FAULT_P | R/W | 0x0 |
Report analog BIST fault to nFLT* outputs: 0x0 = Yes 0x1 = No |
4-3 | RESERVED | R/W | 0x0 | These bits are reserved. Writing to these bits sets the CFG_CRC_PRI_FAULT. |
2 | GD_TWN_PRI_FAULT_P | R/W | 0x0 | Report gate driver temp warning to nFLT* outputs: 0x0 = No 0x1 = Yes |
1 | VREG1_ILIMIT_FAULT_P | R/W | 0x0 |
Report VREG1 ILIMIT fault to nFLT1 output: 0x0 = Yes 0x1 = No |
0 | PWM_CHK_FAULT_P | R/W | 0x0 |
Report PWM check fault to nFLT1 output: 0x0 = Yes 0x1 = No |
CFG3 is shown in Figure 7-47 and described in Table 7-8.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
FS_STATE_UVLO1_FAULT | FS_STATE_OVLO1_FAULT | FS_STATE_PWM_CHK | FS_STATE_STP_FAULT | Reserved | FS_STATE_SPI_FAULT | ||
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x2 | ||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
FS_STATE_INT_REG_PRI_FAULT | FS_STATE_INT_COMM_PRI_FAULT | ITO1_EN | ITO2_EN | FS_STATE_CFG_CRC_PRI_FAULT | AI_IZTC_SEL | ||
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | ||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | FS_STATE_UVLO1_FAULT | R/W | 0x0 |
OUTH/OUTL output state during an unmasked VCC1 UVLO fault: 0x0 = Pulled low 0x1 = No action |
14 | FS_STATE_OVLO1_FAULT | R/W | 0x0 |
OUTH/OUTL output state during an unmasked VCC1 OVLO fault: 0x0 = Pulled low 0x1 = No action |
13 | FS_STATE_PWM_CHK | R/W | 0x0 |
OUTH/OUTL output state during an unmasked PWM check fault: 0x0 = Pulled low 0x1 = No action |
12-11 | FS_STATE_STP_FAULT | R/W | 0x0 |
OUTH/OUTL output state during an unmasked shoot-through fault: 0x0 = Low 0x1 = High 0x2 = Reserved 0x3 = No action |
10 | RESERVED | R/W | 0x0 |
Reserved. Writing to these bits sets the CFG_CRC_PRI_FAULT. |
9-8 | FS_STATE_SPI_FAULT | R/W | 0x2 |
OUTH/OUTL output state during an unmasked SPI communication fault: 0x0 = Pulled low 0x1 = Pulled high 0x2 = No action 0x3 = No action |
7 | FS_STATE_INT_REG_PRI_FAULT | R/W | 0x0 |
OUTH/OUTL output state during an unmasked internal regulator fault: 0x0 = Pulled low 0x1 = No action |
6 | FS_STATE_INT_COMM_PRI_FAULT | R/W | 0x0 |
OUTH/OUTL output state during an unmasked internal communication result: 0x0 = Pulled low 0x1 = No action |
5 | ITO1_EN | R/W | 0x0 |
Current source output at AI1, AI3, and AI5: 0x0 = Disabled 0x1 = Enabled |
4 | ITO2_EN | R/W | 0x0 |
Current source output at AI2, AI4, and AI6: 0x0 = Disabled 0x1 = Enabled |
3 | FS_STATE_CFG_CRC_PRI_FAULT | R/W | 0x0 |
Default OUTH/OUTL output state in case of configuration register CRC fault: 0x0 = Pulled low 0x1 = No action |
2-0 | AI_IZTC_SEL | R/W | 0x0 |
AI1, AI3, AI5 bias current enable. Additionally, ITO1_EN must be set to '1'.: 0x0 = All bias current is OFF 0x1 = AI1 bias current is ON 0x2 = AI3 bias current is ON 0x3 = AI1 and AI3 bias current is ON 0x4 = AI5 bias current is ON 0x5 = AI1 and AI5 bias current is ON 0x6 = AI3 and AI5 bias current is ON 0x7 = All bias current is ON |
CFG4 is shown in Figure 7-48 and described in Table 7-9.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
UV2_DIS | PS_TSD_DEGLITCH | DESAT_DEGLITCH | OV2_DIS | MCLP_CFG | GM_BLK | ||
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x1 | R/W-0x0 | R/W-0x1 | ||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
GM_DIS | MCLP_DIS | VCECLP_EN | DESAT_EN | SCP_DIS | OCP_DIS | PS_TSD_EN | UVOV3_EN |
R/W-0x0 | R/W-0x0 | R/W-0x1 | R/W-0x1 | R/W-0x0 | R/W-0x1 | R/W-0x0 | R/W-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | UV2_DIS | R/W | 0x0 |
VCC2 UVLO function disable: 0x0 = Enabled 0x1 = Disabled |
14-13 | PS_TSD_DEGLITCH | R/W | 0x0 |
Power switch thermal shutdown (TSD) deglitch filter time: 0x0 = 250ns 0x1 = 500ns 0x2 = 750ns 0x3 = 1000ns |
12 | DESAT_DEGLITCH | R/W | 0x0 |
DESAT deglitch timer option: 0x0 = 158ns 0x1 = 316ns |
11 | OV2_DIS | R/W | 0x1 |
VCC2 OVLO function disable: 0x0 = Enabled 0x1 = Disabled |
10 | MCLP_CFG | R/W | 0x0 |
Active Miller clamp option: 0x0 = Internal 0x1 = External |
9-8 | GM_BLK | R/W | 0x1 |
Gate voltage monitor blanking time: 0x0 = 500ns 0x1 = 1000ns 0x2 = 2500ns 0x3 = 4000ns |
7 | GM_DIS | R/W | 0x0 |
Gate voltage monitor function enable: 0x0 = Enabled 0x1 = Disabled |
6 | MCLP_DIS | R/W | 0x0 |
Active Miller clamp enable: 0x0 = Enabled 0x1 = Disabled |
5 | VCECLP_EN | R/W | 0x1 |
VCE clamp enable: 0x0 = Disabled 0x1 = Enabled |
4 | DESAT_EN | R/W | 0x1 |
DESAT detection enable: 0x0 = Disabled 0x1 = Enabled |
3 | SCP_DIS | R/W | 0x0 |
Short circuit protection (SCP) enable: 0x0 = Enabled 0x1 = Disabled |
2 | OCP_DIS | R/W | 0x1 |
Overcurrent protection (OCP) enable: 0x0 = Enabled 0x1 = Disabled |
1 | PS_TSD_EN | R/W | 0x0 |
Thermal shutdown protection for IGBT enable: 0x0 = Disabled 0x1 = Enabled |
0 | UVOV3_EN | R/W | 0x0 |
VEE2 UVLO and OVLO function enable: 0x0 = Disabled 0x1 = Enabled |
CFG5 is shown in Figure 7-49 and described in Table 7-10.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
GM_STO2LTO_DIS | DESATTH | DESAT_CHG_CURR | DESAT_DCHG_EN | ||||
RW-0x0 | R/W-0xE | R/W-0x3 | R/W-0x1 | ||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
MCLPTH | STO_CURR | 2LTOFF_STO_EN | PWM_MUTE_EN | ||||
R/W-0x1 | R/W-0x0 | RW-0x0 | R/W-0x1 | ||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | GM_STO2LTO_DIS | R/W | 0x0 |
Disable gate monitor fault detection during STO or 2LTOFF: 0x0 = Gate monitor is enabled during STO or 2LTOFF 0x1 = Gate monitor is disabled during STO or 2LTOFF |
14-11 | DESATTH | R/W | 0xE |
DESAT detection threshold value. DESATTH is programmable from 2.5V to 10V with a 500mV resolution. Calculate DESAT with the following equation: VDESAT = 2.5V +
CodeDESATTH(in decimal)* 500mV
|
10-9 | DESAT_CHG_CURR | R/W | 0x3 |
Blanking cap charging current: 0x0 = 0.6mA 0x1 = 0.7mA 0x2 = 0.8mA 0x3 = 1mA |
8 | DESAT_DCHG_EN | R/W | 0x1 |
DESAT input pull down current enable: 0x0 = disabled 0x1 = enabled |
7-6 | MCLPTH | R/W | 0x1 |
Active Miller clamp threshold voltage: 0x0 = 1.5V 0x1 = 2V 0x2 = 3V 0x3 = 4V |
5-4 | STO_CURR | R/W | 0x0 |
Soft turn-off current: 0x0 = 0.3A 0x1 = 0.6A 0x2 = 0.9A 0x3 = 1.2A |
3-1 | 2LTOFF_STO_EN | R/W | 0x0 |
STO/2LTOFF is enabled for: 0x0 = Disabled 0x1 = STO for SC and DESAT 0x2 = STO for SC, DESAT, and OC faults 0x3 = STO for SC, DESAT, OC, and PS_TSD faults 0x4 = Disabled 0x5 = 2LTOFF for SC and DESAT 0x6 = 2LTOFF for SC, DESAT, and OC faults 0x7 = 2LTOFF for SC, DESAT, OC, and PS_TSD faults |
0 | PWM_MUTE_EN | R/W | 0x1 |
Mute PWM signal in case of SC/OC/OT faults: 0x0 = Muting is Disabled 0x1 = PWM is muted for tMUTE |
CFG6 is shown in Figure 7-50 and described in Table 7-11.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
OCTH | SCTH | TEMP_CURR | |||||
R/W-0x0 | R/W-0x2 | R/W-0x1 | |||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
SC_BLK | OC_BLK | PS_TSDTH | |||||
R/W-0x0 | R/W-0x0 | R/W-0x2 | |||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-12 | OCTH | R/W | 0x0 |
Overcurrent detection threshold value: 0x0 = 200mV 0x1 = 250mV 0x2 = 300mV 0x3 = 350mV 0x4 = 400mV 0x5 = 450mV 0xF = 950mV |
11-10 | SCTH | R/W | 0x2 |
Short-circuit fault detection threshold value: 0x0 = 500mV 0x1 = 750mV 0x2 = 1000mV 0x3 = 1250mV |
9-8 | TEMP_CURR | R/W | 0x1 |
Constant current source for temp sensing diodes: 0x0 = 0.1mA 0x1 = 0.3mA 0x2 = 0.6mA 0x3 = 1.0mA |
7-6 | SC_BLK | R/W | 0x0 |
Short-circuit detection blanking time: 0x0 = 100ns 0x1 = 200ns 0x2 = 400ns 0x3 = 800ns |
5-3 | OC_BLK | R/W | 0x0 |
Over-current detection blanking time: 0x0 = 500ns 0x1 = 1000ns 0x2 = 1500ns 0x3 = 2000ns 0x4 = 2500ns 0x5 = 3000ns 0x6 = 5000ns 0x7 = 10000ns |
2-0 | PS_TSDTH | R/W | 0x2 |
Power switch thermal shutdown threshold: 0x0 = 1.00V 0x1 = 1.25V 0x2 = 1.50V 0x3 = 1.75V 0x4 = 2.00V 0x5 = 2.25V 0x6 = 2.50V 0x7 = 2.75V |
CFG7 is shown in Figure 7-51 and described in Table 7-12.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
UVLO2TH | OVLO2TH | UVLO3TH | OVLO3TH | ||||
R/W-0x2 | R/W-0x2 | R/W-0x2 | R/W-0x2 | ||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
ADC_EN | ADC_SAMP_MODE | ADC_SAMP_DLY | ADC_FAULT_P | FS_STATE_ADC_FAULT | |||
R/W-0x1 | R/W-0x0 | R/W-0x2 | R/W-0x0 | R/W-0x0 | |||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-14 | UVLO2TH | R/W | 0x2 |
VCC2 UVLO threshold: 0x0 = 16V (turnon), 15V(turnoff) 0x1 = 14V (turnon), 13V(turnoff) 0x2 = 12V (turnon), 11V(turnoff) 0x3 = 10V (turnon), 9V(turnoff) |
13-12 | OVLO2TH | R/W | 0x2 |
VCC2 OVLO threshold: 0x0 = 23V (turnon), 24V(turnoff) 0x1 = 21V (turnon), 22V(turnoff) 0x2 = 19V (turnon), 20V(turnoff) 0x3 = 17V (turnon), 18V(turnoff) |
11-10 | UVLO3TH | R/W | 0x2 |
VEE2 UVLO threshold: 0x0 = -3V (turnon), -2V (turnoff) 0x1 = -5V (turnon), -4V (turnoff) 0x2 = -8V (turnon), -7V (turnoff) 0x3 = -10V (turnon), -9V (turnoff) |
9-8 | OVLO3TH | R/W | 0x2 |
VEE2 OVLO threshold: 0x0 = -5V (turnon), -6V(turnoff) 0x1 = -7V (turnon), -8V(turnoff) 0x2 = -10V (turnon), -11V(turnoff) 0x3 = -12V (turnon), -13V(turnoff) |
7 | ADC_EN | R/W | 0x1 |
ADC sampling enable: 0x0 = Disabled 0x1 = Enabled |
6-5 | ADC_SAMP_MODE | R/W | 0x0 |
ADC sampling mode: 0x0 = center aligned 0x1 = edge aligned 0x2 = center hybrid mode 0x3 = RESERVED |
4-3 | ADC_SAMP_DLY | R/W | 0x2 |
ADC sampling point minimum delay setting with reference to PWM rising edge: 0x0 = 280ns 0x1 = 560ns 0x2 = 840ns 0x3 = 1120ns |
2 | ADC_FAULT_P | R/W | 0x0 |
Report ADC fault to nFLT1 output: 0x0 = Disabled 0x1 = Enabled |
1-0 | FS_STATE_ADC_FAULT | R/W | 0x0 |
OUTH/OUTL output state during an unmasked ADC fault (VREF OV/UV, VREF ILIM, or ADC buffer overrun): 0x0 = Pulled low 0x1 = Pulled high 0x2 = Hi-Z 0x3 = No action |
CFG8 is shown in Figure 7-52 and described in Table 7-13.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
GD_2LOFF_VOLT | GD_2LOFF_TIME | GD_2LOFF_CURR | |||||
R/W-0x0 | R/W-0x0 | R/W-0x0 | |||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | CRC_DIS | GD_2LOFF_STO_EN | VREF_SEL | AI_ASC_MUX | IOUT_SEL | ||
RW-0x0 | R-0x0 | R/W-0x1 | R/W-0x1 | R/W-0x0 | R-0x0 | ||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-13 | GD_2LOFF_VOLT | R/W | 0x0 |
Plateau voltage during two-level turnoff: 0x0 = 6V 0x1 = 7V 0x2 = 8V 0x3 = 9V 0x4 = 10V 0x5 = 11V 0x6 = 12V 0x7 = 13V |
12-10 | GD_2LOFF_TIME | R/W | 0x0 |
Duration of plateau voltage during two-level turnoff: 0x0 = 150ns 0x1 = 300ns 0x2 = 450ns 0x3 = 600ns 0x4 = 1000ns 0x5 = 1500ns 0x6 = 2000ns 0x7 = 2500ns |
9-8 | GD_2LOFF_CURR | R/W | 0x0 |
Gate discharge current for transition to plateau voltage level: 0x0 = 0.3A 0x1 = 0.6A 0x2 = 0.9A 0x3 = 1.2A |
7 | RESERVED | R/W | 0x0 |
This bit field is reserved. Writing to these bits sets the CFG_CRC_SEC_FAULT. |
6 | CRC_DIS | R/W | 0x0 |
Disable configuration CRC check: 0x0 = Enable 0x1 = Disable |
5 | GD_2LOFF_STO_EN | R/W | 0x1 |
STO is enabled for the transition from mid voltage level: 0x0 = Disable 0x1 = Enable |
4 | VREF_SEL | R/W | 0x1 |
Selection of VREF voltage: 0x0 = Internal 0x1 = External |
3 | AI_ASC_MUX | R/W | 0x0 |
AI5/ AI6 function selection: 0x0 = AI5 and AI6 is configured as ASC_EN and ASC input respectively. Current source pull up on AI5 is always off. 0x1 = AI5 and AI6 are configured as ADC inputs. The secondary side ASC function is disabled. |
2-0 | IOUT_SEL | R/W | 0x0 |
Gate drive strength selection. IOUT_SEL may be changed while in ACTIVE mode, however the configuration CRC check must be disabled first by setting CRC_DIS=1 to avoid a configuration CRC fault 0x0 = Gate drive output stage all segments enabled 0x1 =Gate drive output stage 1/3 of segments enabled 0x2 = Gate drive output stage 1/6 of segments enabled 0x3 = Gate drive output stage 1/6 of segments enabled 0x4 = Gate drive output stage 1/6 of segments enabled 0x5 = Gate drive output stage 1/6 of segments enabled 0x6 = Gate drive output stage 1/6 of segments enabled 0x7 = Gate drive output stage 1/6 of segments enabled |
CFG9 is shown in Figure 7-53 and described in Table 7-14.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
SPARE | SC_FAULT_P | OC_FAULT_P | GM_FAULT_P | UVLO23_FAULT_P | OVLO23_FAULT_P | PS_TSD_FAULT_P | |
R/W-0x1 | R/W-0x0 | R/W-0x0 | R/W-0x1 | R/W-0x0 | R/W-0x0 | R/W-0x1 | |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
GD_TSD_FAULT_P | INT_COMM_SEC_FAULT_P | CFG_CRC_SEC_FAULT_P | TRIM_CRC_SEC_FAULT_P | INT_REG_SEC_FAULT_P | BIST_SEC_FAULT_P | VREG2_ILIMIT_FAULT_P | CLK_MON_SEC_FAULT_P |
R/W-0x0 | R/W-0x1 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | SPARE | R/W | 0x1 |
This bit field has no effect on the driver functionality. It is covered by the CFG_CRC_SEC and does not cause a CRC automatically when written.. |
14 | SC_FAULT_P | R/W | 0x0 |
Report SC fault to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
13 | OC_FAULT_P | R/W | 0x0 |
Report OC fault to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
12-11 | GM_FAULT_P | R/W | 0x1 |
Report gate voltage monitor fault: 0x0 = No (fault masked) 0x1 = nFLT1 0x2 = nFLT2 0x3 = Indicate gate voltage state on nFLT2 |
10 | UVLO23_FAULT_P | R/W | 0x0 |
Report VCC2 and VEE2 UVLO faults to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
9 | OVLO23_FAULT_P | R/W | 0x0 |
Report VCC2 and VEE2 OVLO faults to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
8 | PS_TSD_FAULT_P | R/W | 0x1 |
Report power switch TSD fault to nFLT1 output: 0x0 = No (fault masked) 0x1 = Yes |
7 | GD_TSD_SEC_FAULT_P | R/W | 0x0 |
Report gate driver TSD fault to nFLT1 output. The thermal shutdown shuts down the secondary side, regardless of the state of this bit: 0x0 = Yes 0x1 = No |
6 | INT_COMM_SEC_FAULT_P | R/W | 0x1 |
Report internal communication fault to nFLT1 output: 0x0 = No (fault masked) 0x1 = Yes |
5 | CFG_CRC_SEC_FAULT_P | R/W | 0x0 |
Report configuration register CRC fault to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
4 | TRIM_CRC_SEC_FAULT_P | R/W | 0x0 |
Report TRIM CRC fault to nFLT* output: 0x0 = Yes 0x1 = No (fault masked) |
3 | INT_REG_SEC_FAULT_P | R/W | 0x0 |
Report internal regulator fault to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
2 | BIST_SEC_FAULT_P | R/W | 0x0 |
Report ABIST fault to nFLT1 and 2 output: 0x0 = Yes 0x1 = No (fault masked) |
1 | VREG2_ILIMIT_FAULT_P | R/W | 0x0 |
Report VREG2 ILIMIT fault to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
0 | CLK_MON_SEC_FAULT_P | R/W | 0x0 |
Report clock monitor fault to nFLT1 output: 0x0 = Yes 0x1 = No (fault masked) |
CFG10 is shown in Figure 7-54 and described in Table 7-15.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
GD_TWN_SEC_EN | SPARE | FS_STATE_DESAT_SCP | FS_STATE_INT_REG_FAULT | RESERVED | FS_STATE_OCP | ||
R/W-0x1 | R/W-0x1 | R/W-0x0 | R/W-0x0 | RW-0x0 | R/W-0x0 | ||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
FS_STATE_PS_TSD | SPARE | FS_STATE_GM | FS_STATE_INT_COMM_SEC | ||||
R/W-0x0 | R/W-0x0 | R/W-0x2 | R/W-0x0 | ||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | GD_TWN_SEC_EN | R/W | 0x1 |
Over temperature warning of gate driver VCC2 side enable: 0x0 = Disabled 0x1 = Enabled |
14 | SPARE | R/W | 0x1 |
This bit field has no effect on the driver functionality. It is covered by the CFG_CRC_SEC and does not cause a CRC automatically when written. |
13-12 | FS_STATE_DESAT_SCP | R/W | 0x0 |
Default OUTH/OUTL output state in case of DESAT/SCP fault: 0x0 = Pulled low 0x1 = Pulled high 0x2 = Reserved 0x3 = No action |
11 | FS_STATE_INT_REG_FAULT | R/W | 0x0 |
Default OUTH/OUTL output state in case of internal regulator fault: 0x0 = Pulled low 0x1 = No action |
10 | RESERVED | R/W | 0x0 |
This bit field is reserved. Writing to these bits sets the CFG_CRC_SEC_FAULT. |
9-8 | FS_STATE_OCP | R/W | 0x0 |
Default OUTH/OUTL output state in case of OC fault: 0x0 = Pulled low 0x1 = Pulled high 0x2 = Reserved 0x3 = No action |
7-6 | FS_STATE_PS_TSD | R/W | 0x0 |
Default state in case of IGBT OT fault: 0x0 = Pulled low 0x1 = Pulled high 0x2 = Reserved 0x3 = No action |
5-4 | SPARE | R/W | 0x0 |
This bit field has no effect on the driver functionality. It is covered by the CFG_CRC_SEC and does not cause a CRC automatically when written. |
3-2 | FS_STATE_GM | R/W | 0x2 |
Default state in case of gate monitor fault: 0x0 = Pulled low 0x1 = Pulled high 0x2 = Hi-Z 0x3 = No action |
1-0 | FS_STATE_INT_COMM_SEC | R/W | 0x0 |
Default state in case of internal communication fault: 0x0 = Pulled low 0x1 = Pulled high 0x2 = Reserved 0x3 = No action |
CFG11 is shown in Figure 7-55 and described in Table 7-16.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
FS_STATE_UVLO2 | FS_STATE_OVLO2 | FS_STATE_UVLO3 | FS_STATE_OVLO3 | ||||
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | ||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
FS_STATE_TRIM_CRC_SEC_FAULT | FS_STATE_CFG_CRC_SEC_FAULT | VCE_CLMP_HLD_TIME | FS_STATE_CLK_MON_SEC_FAULT | ||||
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | ||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-14 | FS_STATE_UVLO2 | R/W | 0x0 |
OUTH/OUTL state during an unmasked VCC2 UVLO fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
13-12 | FS_STATE_OVLO2 | R/W | 0x0 |
OUTH/OUTL state during an unmasked VCC2 OVLO fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
11-10 | FS_STATE_UVLO3 | R/W | 0x0 |
OUTH/OUTL state during an unmasked VEE2 UVLO fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
9-8 | FS_STATE_OVLO3 | R/W | 0x0 |
OUTH/OUTL state during an unmasked VEE2 OVLO fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
7-6 | FS_STATE_TRIM_CRC_SEC_FAULT | R/W | 0x0 |
OUTH/OUTL state during an unmasked TRIM CRC fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
5-4 | FS_STATE_CFG_CRC_SEC_FAULT | R/W | 0x0 |
OUTH/OUTL state during an unmasked configuration register CRC fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
3-2 | VCE_CLMP_HLD_TIME | R/W | 0x0 |
Hold time for the VCE_CLMP function 0x0 = 100ns 0x1 = 200ns 0x2 = 300ns 0x3 = 400ns |
1-0 | FS_STATE_CLK_MON_SEC_FAULT | R/W | 0x0 |
OUTH/OUTL state during an unmasked clock monitor fault: 0x0 = Pulled Low 0x1 = Pulled High 0x2 = Reserved 0x3 = No action |
ADCDATA1 is shown in Figure 7-56 and described in Table 7-17. ADCDATA1 holds digital representation of AI1 input voltage.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_AI1 ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on AI1. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_AI1 | R | 0x0 |
DATA_AI1 holds the data from the last AI1 ADC measurement. Convert the measurement to a voltage using the following equation: VAI1 = DATA_AI1(decimal) × 3.519mV |
ADCDATA2 is shown in Figure 7-57 and described in Table 7-18.DCDATA2 holds digital representation of AI3 input voltage.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_AI3 ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on AI3. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_AI3 | R | 0x0 |
DATA_AI3 holds the data from the last AI3 ADC measurement. Convert the measurement to a voltage using the following equation: VAI3 = DATA_AI3(decimal) × 3.519mV |
ADCDATA3 is shown in Figure 7-58 and described in Table 7-19.DCDATA2 holds digital representation of AI5 input voltage.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_AI5 ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on AI5. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_AI5 | R | 0x0 |
DATA_AI5 holds the data from the last AI5 ADC measurement. Convert the measurement to a voltage using the following equation: VAI5 = DATA_AI5(decimal) × 3.519mV |
ADCDATA4 is shown in Figure 7-59 and described in Table 7-20.DCDATA2 holds digital representation of AI2 input voltage.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_AI2 ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on AI2. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_AI2 | R | 0x0 |
DATA_AI2 holds the data from the last AI2 ADC measurement. Convert the measurement to a voltage using the following equation: VAI2 = DATA_AI2(decimal) × 3.519mV |
ADCDATA5 is shown in Figure 7-60 and described in Table 7-21.Data field of AI4 ADC conversion result
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_AI4 ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on AI4. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_AI4 | R | 0x0 |
DATA_AI4 holds the data from the last AI4 ADC measurement. Convert the measurement to a voltage using the following equation: VAI4 = DATA_AI4(decimal) × 3.519mV |
ADCDATA6 is shown in Figure 7-61 and described in Table 7-22.Data field of AI6 ADC conversion result
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_AI6 ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on AI6. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_AI6 | R | 0x0 |
DATA_AI6 holds the data from the last AI6 ADC measurement. Convert the measurement to a voltage using the following equation: VAI6 = DATA_AI6(decimal) × 3.519mV |
ADCDATA7 is shown in Figure 7-62 and described in Table 7-23.Data field of internal die temperature ADC conversion result
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_DTEMP ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on internal die temperature. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_DTEMP | R | 0x0 |
DATA_DTEMP holds the data from the last secondary side junction temperature ADC measurement. Convert the measurement to a temperature using the following equation: TJ = DATA_DTEMP(decimal) × 0.7015°C - 198.36°C Updated equation for PG2.1 |
ADCDATA8 is shown in Figure 7-63 and described in Table 7-24.Data field of divided OUTH ADC conversion result
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
TIME_STAMP | DATA | ||||||
R-0x0 | R-0x0 | ||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
DATA | |||||||
R-0x0 | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-10 | TIME_STAMP | R | 0x0 |
TIME_STAMP holds the time stamp for the DATA_OUTH ADC measurement. The time stamp counter is incremented with every transition on INP, but the TIME_STAMP bits are only updated with a valid ADC conversion on VGTH. Once the counter reaches 63, it rolls over to 0 on the next edge. |
9-0 | DATA_OUTH | R | 0x0 |
DATA_OUTH holds the data from the last power transistor gate threshold ADC measurement. Convert the measurement to a voltage using the following equation: VGTH = DATA_OUTH(decimal) × 3.519mV |
CRCDATA is shown in Figure 7-64 and described in Table 7-25.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
CRC_TX | |||||||
R/W-0xFF | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
CRC_RX | |||||||
R-0xFF | |||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-8 | CRC_TX | R/W | 0xFF |
CRC_TX holds the CRC for the received SPI data. The CRC is continuously updated as SPI messages are received. CRC_TX is reset when the bits are written, triggering a comparison. If the comparison fails, the STATUS2[SPI_FAULT] is set. |
7-0 | CRC_RX | R | 0xFF |
CRC_RX holds the CRC for the sent SPI data. The CRC is continuously updated as the SPI messages are sent from SDO. CRC_RX is reset when CONTROL1[CLR_SPI_CRC] is written to '1'. |
SPITEST is shown in Figure 7-65 and described in Table 7-26.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
SPI_TEST | |||||||
R/W-0x0 | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
SPI_TEST | SPI_TEST | ||||||
R/W-0x0 | R/W-0x0 | ||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-0 | SPI_TEST | R/W | 0x0 |
Writing non-zero value to SPI_TEST triggers the STATUS2[CFG_CRC_PRI_FAULT]. |
GDADDRESS is shown in Figure 7-66 and described in Table 7-27.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RESERVED | |||||||
R-0x0 | |||||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | GD_ADDR | ||||||
R-0x0 | R-0x0 | ||||||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15-4 | RESERVED | R | 0x0 |
This bit field is reserved. |
3-0 | GD_ADDR | R | 0x0 |
GD_ADDR stores the chip address. This field is updated during Configuration 1 when using the SPI Addressing mode. See the Section 8.1.2 section for more details. |
STATUS1 is shown in Figure 7-67 and described in Table 7-28.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
INP_STATE | INN_STATE | RESERVED | EN_STATE | RESERVED | OPM | ||
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x1 | ||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
OPM | PWM_COMP_CHK_FAULT | RESERVED | GD_TWN_PRI_FAULT | RESERVED | |||
R-0x1 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | |||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | INP_STATE | R | 0x0 |
Indicates the input signal logic level at IN+: 0x0 = LOW 0x1 = HIGH |
14 | INN_STATE | R | 0x0 |
Indicates the input signal logic level at IN-: 0x0 = LOW 0x1 = HIGH |
13-12 | RESERVED | R | 0x0 |
This bit field is reserved. |
11 | ASC_EN_STATE | R | 0x0 |
Indicates the input signal logic level at pin ASC_EN: 0x0 = LOW 0x1 = HIGH |
10-9 | RESERVED | R | 0x0 |
This bit field is reserved. |
8-6 | OPM | R | 0x1 |
Indicates the current operational state of the device: 0x0 = Error 0x1 = Configuration 1 0x2 = Configuration 2 0x3 = Active 0x4 = Error 0x5 = Error 0x6 = Error 0x7 = Error |
5 | PWM_COMP_CHK_FAULT | R | 0x0 |
PWM comparison function check triggers a fault when the input to the secondary side is not the same as the IN+ input: 0x0 = No fault 0x1 = Fault |
4-2 | RESERVED | R | 0x0 |
This bit field is reserved. |
1 | GD_TWN_PRI_FAULT | R | 0x0 |
Gate driver over temperature warning triggers a fault when the temperature of the primary (VCC1)side is greater than the TWN_SET threshold. This bit is cleared when the temperature drops below the threshold, followed by a read of the STATUS1 register: 0x0 = No fault 0x1 = Fault |
0 | RESERVED | R | 0x0 |
This bit field is reserved. |
STATUS2 is shown in Figure 7-68 and described in Table 7-29.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RESERVED | PRI_RDY | UVLO1_FAULT | OVLO1_FAULT | STP_FAULT | VREG1_ILIM_FAULT | SPI_FAULT | INT_REG_PRI_FAULT |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
INT_COMM_PRI_FAULT | BIST_PRI_FAULT | CLK_MON_PRI_FAULT | CFG_CRC_PRI_FAULT | TRIM_CRC_PRI_FAULT | DRV_EN_RCVD | OR_NFLT1_PRI | OR_NFLT2_PRI |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | RESERVED | R | 0x0 |
This bit field is reserved. |
14 | PRI_RDY | R | 0x0 |
Primary side is ready for operations: 0x0 = Not ready 0x1 = Ready |
13 | UVLO1_FAULT | R | 0x0 |
A UVLO1_FAULT fault is triggered when VVCC1 < VUVLO1_LEVEL: 0x0 = No fault 0x1 = Fault |
12 | OVLO1_FAULT | R | 0x0 |
A OVLO1_FAULT fault is triggered when VVCC1 > VOVLO1_LEVEL: 0x0 = No fault 0x1 = Fault |
11 | STP_FAULT | R | 0x0 |
A Shoot-through protection fault is triggered when the IN- and IN+ logic levels are high at the same time: 0x0 = No fault 0x1 = Fault |
10 | VREG1_ILIMIT_FAULT | R | 0x0 |
A VREG1_ILIMIT_FAULT fault is triggered when the VREG1 current limit is active: 0x0 = No fault 0x1 = Fault |
9 | SPI_FAULT | R | 0x0 |
A SPI communication fault is triggered when nCS transitions low and high without receiving a proper amount of SCLK pulses (multiple of 16) or mismatch in the CRC_TX data written by the user. This bit is cleared when a valid SPI command is received, followed by a read of the STATUS2 register: 0x0 = No fault 0x1 = Fault |
8 | INT_REG_PRI_FAULT | R | 0x0 |
A primary side internal regulator fault is triggered when an internal rail on the primary side (including VREG1) experiences an OV or UV event: 0x0 = No fault 0x1 = Fault |
7 | INT_COMM_PRI_FAULT | R | 0x0 |
A primary side internal communication fault is triggered when the communication from the secondary to the primary side is disrupted: 0x0 = No fault 0x1 = Fault |
6 | BIST_PRI_FAULT | R | 0x0 |
A primary side BIST diagnosis fault is triggered when the latent check BIST fails during primary side power-up: 0x0 = No fault 0x1 = Fault |
5 | CLK_MON_PRI_FAULT | R | 0x0 |
A primary side Clock monitor fault is triggered when the received clock from the secondary side is mismatched from the primary clock: 0x0 = No fault 0x1 = Fault |
4 | CFG_CRC_PRI_FAULT | R | 0x0 |
A primary side configuration register CRC fault is triggered if a configuration bit for the primary side registers (CFG1, CFG2, CF3) changes while in ACTIVE mode. Additionally, CFG_CRC_PRI_FAULT is set if the SPITEST register or one of the RESERVED bits in the primary side registers is written while in the Configuration 2 state: 0x0 = No fault 0x1 = Fault |
3 | TRIM_CRC_PRI_FAULT | R | 0x0 |
A primary side internal data CRC fault is triggered if one of the internal bits held in memory changes. The trim register CRC is monitored in Configuration 2 and ACTIVE states: 0x0 = No fault 0x1 = Fault |
2 | DRV_EN_RCVD | R | 0x0 |
Indicates if a DRV_EN command has been received. 0x0=Driver not enabled 0x1=Driver is enabled |
1 | OR_NFLT1_PRI | R | 0x0 |
Indicates the logic OR of all primary side faults reporting to pin nFLT1. |
0 | OR_NFLT2_PRI | R | 0x0 |
Indicates the logic OR of all primary side faults reporting to pin nFLT2. |
STATUS3 is shown in Figure 7-69 and described in Table 7-30.
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15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
GM_STATE | GM_FAULT | INT_REG_SEC_FAULT | INT_COMM_SEC_FAULT | MCLP_STATE | OVLO3_FAULT | UVLO3_FAULT | OVLO2_FAULT |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
UVLO2_FAULT | VCEOV_FAULT | PS_TSD_FAULT | RESERVED | VREG2_ILIMIT_FAULT | SC_FAULT | OC_FAULT | DESAT_FAULT |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | GM_STATE | R | 0x0 |
Indicates the logic state of power transistor gate voltage. The gate is monitored using OUTH or OUTL depending on the expected output state of the driver (OUTL monitored when OUTH is pulled high and vice versa): 0x0 = LOW 0x1 = HIGH |
14 | GM_FAULT | R | 0x0 |
Gate voltage monitor fault is triggered when the GM_STATE does not match expected output: 0x0 = No fault 0x1 = Fault |
13 | INT_REG_SEC_FAULT | R | 0x0 |
Internal regulator fault: 0x0 = No fault 0x1 = Fault |
12 | INT_COMM_SEC_FAULT | R | 0x0 |
A secondary side internal regulator fault is triggered when an internal rail on the secondary side (including VREG2) experiences an OV or UV event: 0x0 = No fault 0x1 = Fault |
11 | MCLP_STATE | R | 0x0 |
Indicates the Active Miller clamp output state: 0x0 = Active Miller clamp is not active. VOUTH> VCLPTH 0x1 = Active Miller clamp is active. VOUTH< VCLPTH |
10 | OVLO3_FAULT | R | 0x0 |
A OVLO3_FAULT fault is triggered when VVEE2 < VOVLO3TH. CFG4[UVOV3_EN] must be '1' to enable VEE2 OV and UV faults: 0x0 = No fault 0x1 = Fault |
9 | UVLO3_FAULT | R | 0x0 |
A UVLO3_FAULT fault is triggered when VVEE2 > VUVLO3TH. CFG4[UVOV3_EN] must be '1' to enable VEE2 OV and UV faults: 0x0 = No fault 0x1 = Fault |
8 | OVLO2_FAULT | R | 0x0 |
A OVLO2_FAULT fault is triggered when VVCC2 > VOVLO2TH. CFG4[OV2_DIS] must be '0' to enable VCC2 OV faults: 0x0 = No fault 0x1 = Fault |
7 | UVLO2_FAULT | R | 0x0 |
A UVLO2_FAULT fault is triggered when VVCC2 < VUVLO2TH. CFG4[UV2_DIS] must be '0' to enable VCC2 UV faults: 0x0 = No fault 0x1 = Fault |
6 | VCEOV_FAULT | R | 0x0 |
Indicates that the active VCE clamp function triggered a soft-turn off event. CFG4[VCECLP_EN] must be '1' to enable VCEOV_FAULT: 0x0 = No fault 0x1 = Fault |
5 | PS_TSD_FAULT | R | 0x0 |
One of the enabled power switch temperature inputs (AI1, AI3, AI5) is above the PS_TSDTH threshold: 0x0 = No fault 0x1 = Fault |
4 | RESERVED | R | 0x0 |
This bit field is reserved. |
3 | VREG2_ILIMIT_FAULT | R | 0x0 |
A VREG2_ILIMIT_FAULT fault is triggered when the VREG2 current limit is active: 0x0 = No fault 0x1 = Fault |
2 | SC_FAULT | R | 0x0 |
One or more of the enabled power switch current inputs (AI2, AI4, AI6) is above the SCTH threshold indicating a short circuit fault: 0x0 = No fault 0x1 = Fault |
1 | OC_FAULT | R | 0x0 |
One or more of the enabled power switch current inputs (AI2, AI4, AI6) is above the OCTH threshold indicating a, over current fault: 0x0 = No fault 0x1 = Fault |
0 | DESAT_FAULT | R | 0x0 |
DESAT fault is triggered when VDESAT > VDESATTH indicating an over current fault: 0x0 = No fault 0x1 = Fault |
STATUS4 is shown in Figure 7-70 and described in Table 7-31.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RESERVED | VCE_STATE | GD_TWN_SEC_FAULT | GD_TSD_SEC_FAULT | RESERVED | OR_NFLT1_SEC | OR_NFLT2_SEC | BIST_SEC_FAULT |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
CLK_MON_SEC_FAULT | CFG_CRC_SEC_FAULT | TRIM_CRC_SEC_FAULT | RESERVED | SEC_RDY | |||
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | |||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | RESERVED | R | 0x0 |
This bit field is reserved. |
14 | VCE_STATE | R | 0x0 |
State of VCE voltage: 0x0 = Low 0x1 = High |
13 | GD_TWN_SEC_FAULT | R | 0x0 |
Gate driver over temperature warning triggers a fault when the temperature of the secondary (VCC2) side is greater than the TWN_SET threshold. This bit is cleared when the temperature drops below the threshold, followed by a read of the STATUS4 register: 0x0 = No fault 0x1 = Fault |
12 | GD_TSD_SEC_FAULT | R | 0x0 |
Gate driver thermal shutdown triggers a fault when the temperature of the secondary (VCC2) side is greater than the TSD_SET threshold: 0x0 = No fault 0x1 = Fault |
11 | RESERVED | R | 0x0 |
This bit field is reserved. |
10 | OR_NFLT1_SEC | R | 0x0 |
Indicates the logic OR of all secondary side faults reporting to pin nFLT1. |
9 | OR_NFLT2_SEC | R | 0x0 |
Indicates the logic OR of all secondary side faults reporting to pin nFLT2. |
8 | BIST_SEC_FAULT | R | 0x0 |
A secondary side BIST diagnosis fault is triggered when the latent check BIST fails during secondary side power-up: 0x0 = No fault 0x1 = Fault |
7 | CLK_MON_SEC_FAULT | R | 0x0 |
A secondary side clock monitor fault is triggered when the received clock from the primary side is mismatched from the secondary clock: 0x0 = No fault 0x1 = Fault |
6 | CFG_CRC_SEC_FAULT | R | 0x0 |
A secondary side configuration register CRC fault is triggered if a configuration bit for the secondary side registers (CFG4 - CF11) changes while in ACTIVE mode. Additionally, CFG_CRC_SEC_FAULT is set if the SPITEST register or one of the RESERVED bits in the secondary side registers is written while in the Configuration 2 state: 0x0 = No fault 0x1 = Fault |
5 | TRIM_CRC_SEC_FAULT | R | 0x0 |
A secondary side internal data CRC fault is triggered if one of the internal bits held in memory changes. The trim register CRC is monitored in Configuration 2 and ACTIVE states: 0x0 = No fault 0x1 = Fault |
4-1 | RESERVED | R | 0x0 |
This bit field is reserved |
0 | SEC_RDY | R | 0x0 |
Secondary side is ready for operations: 0x0 = Not ready 0x1 = Ready |
STATUS5 is shown in Figure 7-71 and described in Table 7-32.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
ADC_FAULT | Reserved | Reserved | Reserved | Reserved | Reserved | Reserved | Reserved |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
Reserved | Reserved | Reserved | Reserved | Reserved | Reserved | Reserved | RESERVED |
R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 | R-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | ADC_FAULT | R | 0x0 |
ADC_FAULT indicates that a fault has occurred in the VREF or during the ADC data transfer to the primary side. This fault only indicates faults when the ADC is enabled. 0x0 = No fault 0x1 = Fault condition. The VREF supply is out of range (OV, UV, or in current limit), or the IN+ signal is faster than guaranteed operation while ADC is enabled (30kHz). |
14-0 | RESERVED | R | 0x0 |
This bit field is reserved |
CONTROL1 is shown in Figure 7-72 and described in Table 7-33. To write data in ACTIVE state, disable the configuration CRC check by setting CRC_DIS=1 before writing the data. The only exception to this is the CLR_SPI_CRC bit. This bit can be written in ACTIVE mode without disabling the CRC.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
CLR_SPI_CRC | RESERVED | CFG_CRC_CHK_PRI | |||||
R/W-0x0 | R-0x0 | R/W-0x0 | |||||
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
PWM_COMP_CHK | RESERVED | STP_CHK | RESERVED | CLK_MON_CHK_PRI | |||
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | |||
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | CLR_SPI_CRC | R/W | 0x0 |
Clear SPI CRC code: 0x0 = No 0x1 = Yes |
14-9 | RESERVED | R | 0x0 |
This bit field is reserved |
8 | CFG_CRC_CHK_PRI | R/W | 0x0 |
Run CRC check of configuration register bits of primary (VCC1) side: 0x0 = No 0x1 = Yes |
7 | PWM_COMP_CHK | R/W | 0x0 |
Run PWM signal comparison function check. PWM comparator generates PWM fault to set PWM_COMP_CHK_FAULT. This is only available in Configuration 2: 0x0 = No 0x1 = Yes |
6 | RESERVED | R/W | 0x0 |
This bit field is reserved |
5 | STP_CHK | R/W | 0x0 |
Run the check of STP function. shoot through protection generates STP fault to set STP_FAULT: 0x0 = No 0x1 = Yes |
4-1 | RESERVED | R | 0x0 |
This bit field is reserved |
0 | CLK_MON_CHK_PRI | R/W | 0x0 |
Run clock monitor check. Primary side clock monitor generates clock monitor fault to set CLK_MON_PRI_FAULT. SPI functions normally during this test: 0x0 = No 0x1 = Yes |
CONTROL2 is shown in Figure 7-73 and described in Table 7-34. To write data in ACTIVE state, disable the configuration CRC check by setting CRC_DIS=1 before writing the data.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
CLR_STAT_REG | RESERVED | GATE_OFF_CHK | GATE_ON_CHK | VCECLP_CHK | RESERVED | DESAT_CHK | SCP_CHK |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
OCP_CHK | RESERVED | VGTH_MEAS | RESERVED | CLK_MON_CHK_SEC | CFG_CRC_CHK_SEC | PS_TSD_CHK_SEC | RESERVED |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | CLR_STAT_REG | R/W | 0x0 |
Clear status register. This bit is set back 0 once status register is cleared. Reading this bit always returns 0: 0x0 = No 0x1 = Yes |
14 | RESERVED | R/W | 0x0 | This bit field is reserved. |
13 | GATE_OFF_CHK | R/W | 0x0 |
Check the continuity of gate turnoff path. The gate monitor comparator generates off-state fault to test the GM_FAULT while the gate is off. This function is used in ACTIVE mode with the CRC_DIS bit set. The MCU or the external controller controls IN+/IN- to turn off OUTH before sending this command. The gate driver output is pulled low and does not respond to IN+/IN- until GM_FAULT and this bit is cleared. Ensure that the CRC_DIS bit is cleared after performing the necessary latent function checks to enable the CRC function: 0x0 = OFF 0x1 = ON |
12 | GATE_ON_CHK | R/W | 0x0 |
Check the continuity of gate turnon path. The gate monitor comparator generates on-state fault to test the GM_FAULT while the gate is on. This function is used in ACTIVE mode with the CRC_DIS bit set. The gate driver output is pulled low. MCU or the external controller controls IN+/IN- to turn on OUTH before sending this command. Ensure that the CRC_DIS bit is cleared after performing the necessary latent function checks to enable the CRC function: 0x0 = OFF 0x1 = ON |
11 | VCECLP_CHK | R/W | 0x0 |
Manual VCECLP BIST. The VCECLAMP comparator generates VCE over voltage fault to set VCEOV_FAULT. This function is used in ACTIVE mode with the CRC_DIS bit set. MCU or the external controller controls IN+/IN- to turn off OUTH before sending this command. Ensure that the CRC_DIS bit is cleared after performing the necessary latent function checks to enable the CRC function: 0x0 = No 0x1 = Yes |
10 | RESERVED | R/W | 0x0 |
Reserved |
9 | DESAT_CHK | R/W | 0x0 | Manual DESAT BIST. The DESAT comparator generates
DESAT fault to set DESAT_FAULT. This function is used in ACTIVE mode
with the CRC_DIS bit set. MCU or the external controller controls
IN+/IN- to turn on OUTH before sending this command. Ensure that the
CRC_DIS bit is cleared after performing the necessary latent
function checks to enable the CRC function: 0x0 = No 0x1 = Yes |
8 | SCP_CHK | R/W | 0x0 |
Manual SCP BIST. The SCP comparator generates short circuit fault to set SC_FAULT. This function is used in ACTIVE mode with the CRC_DIS bit set. MCU or the external controller controls IN+/IN- to turn on OUTH before sending this command. Ensure that the CRC_DIS bit is cleared after performing the necessary latent function checks to enable the CRC function: 0x0 = No 0x1 = Yes |
7 | OCP_CHK | R/W | 0x0 | Manual OCP BIST. The OCP comparator generates over
current fault to set OC_FAULT. This function is used in ACTIVE mode
with the CRC_DIS bit set. MCU or the external controller controls
IN+/IN- to turn on OUTH before sending this command. Ensure that the
CRC_DIS bit is cleared after performing the necessary latent
function checks to enable the CRC function: 0x0 = No 0x1 = Yes |
6 | RESERVED | R/W | 0x0 |
Reserved |
5 | VGTH_MEAS | R/W | 0x0 |
Run VGTH measurement function. Refer to the Section 7.3.5.14 section. This is only available in Configuration 2: 0x0 = No 0x1 = Yes |
4 | RESERVED | R/W | 0x0 |
Reserved |
3 | CLK_MON_CHK_SEC | R/W | 0x0 |
Manual clock monitor BIST. Secondary side clock monitor generates clock monitor fault to set CLK_MON_SEC_FAULT. SPI function normally during this test: 0x0 = No 0x1 = Yes |
2 | CFG_CRC_CHK_SEC | R/W | 0x0 |
Run CRC check of configuration bits of VCC2 side, Secondary side configuration CRC generates CRC fault to set CFG_CRC_SEC_FAULT: 0x0 = No 0x1 = Yes |
1 | PS_TSD_CHK_SEC | R/W | 0x0 |
Check power switch TSD protection function. The Power Switch over temperature protection generates over temperature fault to set PS_TSD_FAULT. This function is used in ACTIVE mode with the CRC_DIS bit set. MCU or the external controller controls IN+/IN- to turn on OUTH before sending this command. Ensure that the CRC_DIS bit is cleared after performing the necessary latent function checks to enable the CRC function: 0x0 = No 0x1 = Yes |
0 | RESERVED | R/W | 0x0 | This bit field is reserved. |
ADCCFG is shown in Figure 7-74 and described in Table 7-35.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
RESERVED | ADC_ON_CH_SEL_7 | ADC_ON_CH_SEL_6 | ADC_ON_CH_SEL_5 | ADC_ON_CH_SEL_4 | ADC_ON_CH_SEL_3 | ADC_ON_CH_SEL_2 | ADC_ON_CH_SEL_1 |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | ADC_OFF_CH_SEL_7 | ADC_OFF_CH_SEL_6 | ADC_OFF_CH_SEL_5 | ADC_OFF_CH_SEL_4 | ADC_OFF_CH_SEL_3 | ADC_OFF_CH_SEL_2 | ADC_OFF_CH_SEL_1 |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | Reserved | R/W | 0x0 | Reserved |
14 | ADC_ON_CH_SEL_7 | R/W | 0x0 |
The die temperature is enabled for sampling during the PWM ON ADC round robin. Die temperature data is returned to ADCDATA7. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
13 | ADC_ON_CH_SEL_6 | R/W | 0x0 |
The AI6 channel is enabled for sampling during the PWM ON ADC round robin. AI6 data is returned to ADCDATA6. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
12 | ADC_ON_CH_SEL_5 | R/W | 0x0 |
The AI4 channel is enabled for sampling during the PWM ON ADC round robin. AI4 data is returned to ADCDATA5. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
11 | ADC_ON_CH_SEL_4 | R/W | 0x0 |
The AI2 channel is enabled for sampling during the PWM ON ADC round robin. AI2 data is returned to ADCDATA4. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
10 | ADC_ON_CH_SEL_3 | R/W | 0x0 |
The AI5 channel is enabled for sampling during the PWM ON ADC round robin. AI5 data is returned to ADCDATA3. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
9 | ADC_ON_CH_SEL_2 | R/W | 0x0 |
The AI3 channel is enabled for sampling during the PWM ON ADC round robin. AI3 data is returned to ADCDATA2. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
8 | ADC_ON_CH_SEL_1 | R/W | 0x0 |
The AI1 channel is enabled for sampling during the PWM ON ADC round robin. AI1 data is returned to ADCDATA1. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
7 | Reserved | R/W | 0x0 | Reserved |
6 | ADC_OFF_CH_SEL7 | R/W | 0x0 |
The die temperature is enabled for sampling during the PWM OFF ADC round robin. Die temperature data is returned to ADCDATA7. The round robin sampling order is: AI1, AI3, AI5,AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
5 | ADC_OFF_CH_SEL6 | R/W | 0x0 |
The AI6 channel is enabled for sampling during the PWM OFF ADC round robin. AI6 data is returned to ADCDATA6. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
4 | ADC_OFF_CH_SEL5 | R/W | 0x0 |
The AI4 channel is enabled for sampling during the PWM OFF ADC round robin. AI4 data is returned to ADCDATA5. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
3 | ADC_OFF_CH_SEL4 | R/W | 0x0 |
The AI2 channel is enabled for sampling during the PWM OFF ADC round robin. AI2 data is returned to ADCDATA4. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
2 | ADC_OFF_CH_SEL3 | R/W | 0x0 |
The AI5 channel is enabled for sampling during the PWM OFF ADC round robin. AI5 data is returned to ADCDATA3. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
1 | ADC_OFF_CH_SEL2 | R/W | 0x0 |
The AI3 channel is enabled for sampling during the PWM OFF ADC round robin. AI3 data is returned to ADCDATA2. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
0 | ADC_OFF_CH_SEL1 | R/W | 0x0 |
The AI1 channel is enabled for sampling during the PWM OFF ADC round robin. AI1 data is returned to ADCDATA1. The round robin sampling order is: AI1, AI3, AI5, AI2, AI4, AI6, Die Temp: 0x0 = No 0x1 = Yes |
DOUTCFG is shown in Figure 7-75 and described in Table 7-36.
Return to Summary Table.
15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 |
AI1OT_EN | AI3OT_EN | AI5OT_EN | AI2OCSC_EN | AI4OCSC_EN | AI6OCSC_EN | FREQ_DOUT | |
RW-0x0 | RW-0x0 | RW-0x0 | RW-0x1 | RW-0x1 | RW-0x0 | R/W-0x0 | |
7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 |
RESERVED | DOUT_TO_TJ | DOUT_TO_AI6 | DOUT_TO_AI4 | DOUT_TO_AI2 | DOUT_TO_AI5 | DOUT_TO_AI3 | DOUT_TO_AI1 |
R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R/W-0x0 | R-0x0 |
Bit | Field | Type | Reset | Description |
---|---|---|---|---|
15 | AI1OT_E | R/W | 0x0 |
AI1 Over Temperature protection for power FET: 0x0 = Disabled 0x1 = Enabled |
14 | AI3OT_EN | R/W | 0x0 |
AI3 Over Temperature protection for power FET: 0x0 = Disabled 0x1 = Enabled |
13 | AI5OT_EN | R/W | 0x0 |
AI5 Over Temperature protection for power FET: 0x0 = Disabled 0x1 = Enabled |
12 | AI2OCSC_EN | R/W | 0x1 |
AI2 Over Current / Short circuit protection for power FET: 0x0 = Disabled 0x1 = Enabled |
11 | AI4OCSC_EN | R/W | 0x1 |
AI4 Over Current / Short circuit protection for power FET: 0x0 = Disabled 0x1 = Enabled |
10 | AI6OCSC_EN | R/W | 0x0 |
AI6 Over Current / Short circuit protection for power FET: 0x0 = Disabled 0x1 = Enabled |
9-8 | FREQ_DOUT | R/W | 0x0 |
DOUT output frequency: 0x0 = 13.9kHz 0x1 = 27.8kHz 0x2 = 55.7kHz 0x3 = 111.4kHz |
7 | RESERVED | R/W | 0x0 |
Reserved |
6 | DOUT_TO_TJ | R/W | 0x0 |
Channel of die temp is selected to output on DOUT. Only one channel can be selected at a time.: 0x0 = No 0x1 = Yes |
5 | DOUT_TO_AI6 | R/W | 0x0 |
Channel AI6 is selected to output on DOUT. Only one channel can be selected at a time. : 0x0 = No 0x1 = Yes |
4 | DOUT_TO_AI4 | R/W | 0x0 |
Channel AI4 is selected to output on DOUT. Only one channel can be selected at a time.: 0x0 = No 0x1 = Yes |
3 | DOUT_TO_AI2 | R/W | 0x0 |
Channel AI2 is selected to output on DOUT. Only one channel can be selected at a time.: 0x0 = No 0x1 = Yes |
2 | DOUT_TO_AI5 | R/W | 0x0 |
Channel AI5 is selected to output on DOUT. Only one channel can be selected at a time.: 0x0 = No 0x1 = Yes |
1 | DOUT_TO_AI3 | R/W | 0x0 |
Channel AI3 is selected to output on DOUT. Only one channel can be selected at a time.: 0x0 = No 0x1 = Yes |
0 | DOUT_TO_AI1 | R/W | 0x0 |
Channel AI1 is selected to output on DOUT. Only one channel can be selected at a time.: 0x0 = No 0x1 = Yes |