ZHCSDF1 February 2015 UCD90240
PRODUCTION DATA.
- 1 特性
- 2 应用
- 3 说明
- 4 修订历史记录
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Detailed Description
- 7.1 Device Overview
- 7.2 Functional Block Diagram
- 7.3
Feature Description
- 7.3.1 TI Fusion GUI
- 7.3.2 PMBUS Interface
- 7.3.3 Rail Setup
- 7.3.4 Rail Monitoring Configuration
- 7.3.5 GPI Configuration
- 7.3.6 Rail Sequence Configuration
- 7.3.7 Fault Responses Configuration
- 7.3.8 GPO Configuration
- 7.3.9 Margining Configuration
- 7.3.10 Pin Selected Rail States Configuration
- 7.3.11 Watchdog Timer
- 7.3.12 System Reset Function
- 7.3.13 Cascading Multiple Devices
- 7.3.14 Voltage Monitoring
- 7.3.15 Status Monitoring
- 7.3.16 Data and Error Logging to EEPROM Memory
- 7.3.17 Black Box First Fault Logging
- 7.3.18 PMBUS Address Selection
- 7.3.19 ADC Reference
- 7.3.20 Device Reset
- 7.3.21 Brownout
- 7.3.22 Device Configuration and Programming
- 7.3.23 Internal Fault Management
- 8 Application and Implementation
- 9 Power Supply Recommendations
- 10Layout
- 11器件和文档支持
- 12机械封装和可订购信息
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted) (1)| MIN | MAX | UNIT | ||
|---|---|---|---|---|
| Voltage applied at V33D to DVSS | 0 | 4 | V | |
| Voltage applied at V33A to AVSS | 0 | 4 | V | |
| Input voltage on all I/O pins except PMBUS_CNTRL, PMBALERT#, MARGIN19 and MARGIN20, regardless of whether the device is powered(2)(3) | –0.3 | 5.5 | V | |
| Input voltage on PMBUS_CNTRL, PMBALERT#, MARGIN19 and MARGIN20 | –0.3 | V33D+0.3 | V | |
| Maximum current per output pin | – | 25 | mA | |
| Maximum junction temperature | – | 150 | °C | |
| Unpowered storage temperature, Tstg | –65 | 150 | °C | |
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Applies to static and dynamic signals including overshoot.
(3) All I/O pins except PMBUS_CNTRL, PMBALERT#, MARGIN19 and MARGIN20 are tolerant to 5-V digital inputs without creating reliability issues, as long as the supply voltage, V33D, is present. There are limitations to how long a 5-V input can be present on any given I/O pin if V33D is not present. Not meeting these conditions will affect reliability of the device and affect the I/O pin characteristics specifications.
- If the voltage applied to an I/O pin is in the high voltage range (5V ± 10%) while V33D is not present, such condition should be allowed for a maximum of 10,000 hours at 27°C or 5,000 hours at 85°C, over the lifetime of the device.
- If the voltage applied to an I/O pin is in the normal voltage range (3.3V ± 10%) while V33D is not present or if the voltage applied is in the high voltage range (5V ± 10%) while V33D is present, there are no constraints on the lifetime of the device.
6.2 ESD Ratings
| VALUE | UNIT | |||
|---|---|---|---|---|
| V(ESD) | Electrostatic discharge | Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) | ±2000 | V |
| Charged-device model (CDM), per JEDEC specification JESD22-C101(2) | ±500 | |||
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)| MIN | NOM | MAX | UNIT | ||
|---|---|---|---|---|---|
| V33D supply voltage | 3.15 | 3.3 | 3.63 | V | |
| V33A supply voltage(1) | 2.97 | 3.3 | 3.63 | V | |
| TA | Ambient operating temperature range | –40 | – | +85 | °C |
| TC | Case operating temperature range | –40 | – | +90 | °C |
| TJ | Junction operating temperature range | –40 | – | +93 | °C |
(1) V33A and V33D should connect to the same supply. Otherwise, V33A must be powered before V33D if sourced from different supplies. There is no restriction on order for powering off.
6.4 Thermal Information
| THERMAL METRIC(1) | UCD90240 | UNIT | |
|---|---|---|---|
| BGA | |||
| 157 PINS | |||
| RθJA | Junction-to-ambient thermal resistance | 41.6 | °C/W |
| RθJC(top) | Junction-to-case (top) thermal resistance | 15.8 | |
| RθJB | Junction-to-board thermal resistance | 18.9 | |
| ψJT | Junction-to-top characterization parameter | 0.3 | |
| ψJB | Junction-to-board characterization parameter | 20.3 | |
| RθJC(bot) | Junction-to-case (bottom) thermal resistance | ||
| TJ | Junction temperature formula | TC + (P × ΨJT) TPCB +(P × ΨJB)(2) TA + (P × ΘJA)(3) TB + (P × ΘJB)(4)(5) |
°C |
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) TPCB is the temperature of the board acquired by following the steps listed in the EAI/JESD 51-8 standard summarized in the Semiconductor and IC Package Thermal Metrics Application Report (literature number SPRA953).
(3) Because ΘJA is highly variable and based on factors such as board design, chip/pad size, altitude, and external ambient temperature, it is recommended that equations containing ΨJT and ΨJB be used for best results.
(4) TB is temperature of the board.
(5) ΘJB is not a pure reflection of the internal resistance of the package because it includes the resistance of the testing board and environment. It is recommended that equations containing ΨJT and ΨJB be used for best results.
6.5 Electrical Characteristics
over operating free-air temperature range (unless otherwise noted)| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| SUPPLY CURRENT | ||||||
| IV33 | Supply current | V33D = V33A = 3.3V | – | 31.4 | 54.9 | mA |
| ON-CHIP LOW DROP-OUT (LDO) REGULATOR | ||||||
| CLDO | External filter capacitor size for internal power supply(1) | 2.5 | – | 4.0 | µF | |
| ESR | Filter capacitor equivalent series resistance | 10 | – | 100 | mΩ | |
| ESL | Filter capacitor equivalent series inductance | – | – | 0.5 | nH | |
| VLDO | LDO output voltage | 1.08 | 1.2 | 1.32 | V | |
| IINRUSH | Inrush current | 50 | – | 250 | mA | |
| ANALOG-TO-DIGITAL CONVERTER (ADC)(2) | ||||||
| V33A | ADC supply voltage | 2.97 | 3.3 | 3.63 | V | |
| AVSS | ADC ground voltage | – | 0 | – | V | |
| CV33A | Voltage reference decoupling capacitance between V33A and AVSS | – | 1.0/0.01(4) | – | ||
| VREFA+ | Positive external voltage reference on VREFA+ pin | 2.4 | – | 3 | V | |
| VREFA– | Negative external voltage reference on VREFA– pin | AVSS | AVSS | 0.3 | V | |
| CREF | Voltage reference decoupling capacitance between VREFA+ and VREFA– (if using external reference) | – | 1.0/0.01(4) | – | µF | |
| VADCIN | Analog input range, internal reference(5) | 0 | – | V33A | V | |
| Analog input range, external reference(6) | VREFA– | – | VREFA+ | |||
| IL | ADC input leakage current | – | – | 2.0 | µA | |
| RADC | ADC equivalent input resistance | 2.5 | kΩ | |||
| CADC | ADC equivalent input capacitance | 10 | pF | |||
| FCONV | ADC conversion rate (on each ADC channel)(2) | 1 | MSPS | |||
| N | ADC resolution | 12 | bits | |||
| ET | Total unadjusted error, over full input range when using internal reference(3) | ±10 | ±30 | LSB | ||
| Total unadjusted error, over full input range when using external reference(3) | ±2.5 | ±4.0 | ||||
| DIGITAL INPUTS AND OUTPUTS (GPIO, LOGIC GPO, EN, AND MARGIN PINS) | ||||||
| VIH | I/O high-level input voltage(7) | 0.65×V33D | – | 5.5V | V | |
| VIL | I/O low-level input voltage | 0 | – | 0.35×V33D | V | |
| VHYS | I/O input hysteresis | 0.2 | – | – | V | |
| VOH | I/O high-level output voltage | 2.4 | – | – | V | |
| VOL | I/O low-level output voltage | – | – | 0.4 | V | |
| IOH | High-level source current, VOH = 2.4V(8) | 4.0 | – | – | mA | |
| IOL | Low-level sink current, VOL = 0.4V(8) | 4.0 | – | – | mA | |
| RESET AND BROWNOUT | ||||||
| V33DSlew | Minimum V33D slew rate between 2.8V and 3.2V | 0.1 | – | – | V/ms | |
| VRESET | Supply voltage at which device comes out of reset | 2.85 | 3.00 | 3.15 | V | |
| VBOR | Supply voltage at which device enters brownout | 2.93 | 3.02 | 3.11 | V | |
| VSHDN | Supply voltage at which device shuts down | 2.70 | 2.78 | 2.87 | V | |
| tRESET | Minimum low-pulse width needed at RESET pin | – | 250 | – | ns | |
| tIRT | Internal Reset Time(9) | – | 9 | 11.5 | ms | |
(1) The capacitor should be connected as close as possible to pin D6.
(2) Total of two ADC channels run independently during normal operation.
(3) Total Unadjusted Error is the maximum error at any one code versus the ideal ADC curve. It includes offset error, gain error and INL at any given ADC code.
(4) Two capacitors in parallel
(5) Internal reference is connected directly between V33A and AVSS.
(6) External reference noise level must be under 12bit (–74 dB) of Full Scale input, over input bandwidth, measured at VREFA+ – VREFA–.
(7) PMBUS_CNTRL, PMBALERT#, MARGIN19 and MARGIN20 pins have V33D+0.3V as maximum input voltage rating.
(8) IO specifications reflect the maximum current where the corresponding output voltage meets the VOH/VOL thresholds.
(9) If power-loss or brown-out event occurs during an EEPROM program or erase operation, and EEPROM needs to be repaired (which is a rare case), the Internal Reset Time may be longer.
6.6 Nonvolatile Memory Characteristics
over operating free-air temperature range (unless otherwise noted)| PARAMETER | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|
| CONFIGURATION FLASH MEMORY | |||||
| PECYC | Number of program/erase cycles before failure | 100 000 | – | – | Cycles |
| TRET | Data retention, -40°C to +85°C | 20 | – | – | Years |
| FAULT AND EVENT LOGGING EEPROM | |||||
| EPECYC | Number of mass program/erase cycles of a single word before failure | 500 000 | – | – | Cycles |
| ETRET | Data retention, -40°C to +85°C | 20 | – | – | Years |
6.7 I2C/PMBUS Timing Requirements
| PARAMETER | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|
| I1 | t(HD:STA) | Start condition hold time | 450 | – | – | ns |
| I2 | t(LOW) | Clock Low period(1) | 450 | – | – | ns |
| I3 | tr | Clock/Data rise time(2) | – | – | See (2) | ns |
| I4 | t(HD:DAT) | Data hold time | – | 25 | – | ns |
| I5 | tf | Clock/Data fall time(3) | – | 112.5 | 125 | ns |
| I6 | t(HIGH) | Clock High time | 300 | – | – | ns |
| I7 | t(SU:DAT) | Data setup time | 225 | – | – | ns |
| I8 | t(SU:STA) | Start condition setup time (Repeated start only) | 450 | – | – | ns |
| I9 | t(SU:STO) | Stop condition setup time | 300 | – | – | ns |
| I10 | t(DV) | Data Valid | – | 25 | – | ns |
(1) PMBus host must support clock stretching per PMBus Power System Management Protocol Specification Part I General Requirements, Transport And Electrical Interface, Revision 1.2, Section 5.2.6.
(2) Because I2CSCL and I2CSDA operate as open-drain-type signals, which the controller can only actively drive Low, the time I2CSCL or I2CSDA takes to reach a high level depends on external signal capacitance and pullup resistor values.
(3) Specified at a nominal 50 pF load.
