ZHCSFI3B August 2016 – May 2019 UCD90320
PRODUCTION DATA.
PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
---|---|---|---|---|---|---|
CONFIGURATION FLASH MEMORY | ||||||
PECYC | Number of program and erase cycles before failure | 100,000 | Cycles | |||
TRET | Data retention | –40°C ≤ TJ ≤ 85°C | 20 | Years | ||
FAULT AND EVENT LOGGING EEPROM | ||||||
EPECYC | Number of mass program and erase cycles of a single word before failure | 500,000 | Cycles | |||
ETRET | Data retention | –40°C ≤ TJ ≤ 85°C | 20 | Years |