ZHCSC55A January 2014 – March 2014 UCD9244-EP
PRODUCTION DATA.
- 1 特性
- 2 应用范围
- 3 说明
- 4 修订历史记录
- 5 说明（继续）
- 6 Terminal Configuration and Functions
-
7 Specifications
- 7.1 Absolute Maximum Ratings
- 7.2 Handling Ratings
- 7.3 Recommended Operating Conditions
- 7.4 Thermal Information
- 7.5 Electrical Characteristics
- 7.6 Electrical Characteristics (Continued)
- 7.7 ADC Monitoring Intervals And Response Times
- 7.8 Hardware Fault Detection Latency
- 7.9 PMBus/SMBus/I2C
- 7.10 I2C/SMBus/PMBus Timing Requirements
- 7.11 Typical Characteristics
-
8 Detailed Description
- 8.1 Overview
- 8.2 Functional Block Diagram
- 8.3
Feature Description
- 8.3.1 PMBus Interface
- 8.3.2 Resistor Programmed PMBus Address Decode
- 8.3.3 VID Interface
- 8.3.4 Jtag Interface
- 8.3.5 Bias Supply Generator (Shunt Regulator Controller)
- 8.3.6 Power-On Reset
- 8.3.7 External Reset
- 8.3.8 ON_OFF_CONFIG
- 8.3.9 Output Voltage Adjustment
- 8.3.10 Calibration
- 8.3.11 Analog Front End (AFE)
- 8.3.12 Voltage Sense Filtering
- 8.3.13 DPWM Engine
- 8.3.14 Rail/Power Stage Configuration
- 8.3.15 DPWM Phase Synchronization
- 8.3.16 Output Current Measurement
- 8.3.17 Current Sense Input Filtering
- 8.3.18 Over-Current Detection
- 8.3.19 Input Voltage Monitoring
- 8.3.20 Input UV Lockout
- 8.3.21 Temperature Monitoring
- 8.3.22 Auxiliary ADC Input Monitoring
- 8.3.23 Soft Start, Soft Stop Ramp Sequence
- 8.3.24 Non-Volatile Memory Error Correction Coding
- 8.3.25 Data Logging
- 8.4 Device Functional Modes
- 9 Applications and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
12 Device and Documentation Support
12.1 Trademarks
TMS320C6670, TMS320C6678, Fusion Digital Power, Auto-ID are trademarks of Texas Instruments.
12.2 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
12.3 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms and definitions.