SBAA531 November 2021 ADS8860 , ADS8862 , ADS8881 , ADS9110 , ADS9224R
Table 2-1 lists a short summary for each parameter. For more details on the parameters and internal model schematics see the previous sections of this application report.
Parameter | Definition |
---|---|
CSH | Sample and hold input capacitor. Typically, this internal capacitor is found in the Input Sampling Stage Equivalent Circuit section of the data sheet and also may be listed in the data sheet table. Typical values for this capacitor range from 5 pF to 100 pF. |
RSH | Parasitic resistance of sample and hold switch. Typically, this internal resistor is found in the Input Sampling Stage Equivalent Circuit section of the data sheet and also may be listed in the data sheet table. Typical values for this resistor range from 10 Ω to 200 Ω. |
CDIO | Parasitic capacitance of ESD diodes which is often in the Input Sampling Stage Equivalent Circuit section of the data sheet. This capacitance is typically 4 pF. |
CRES | Sample and hold reset capacitance. This capacitor is used to reset the sample and hold capacitor at the end of the conversion phase and it emulates the droop seen at the end of the conversion phase. Typically, this is set to 10% of the sample and hold capacitor. |
TCONV | Conversion phase time is the amount of time it takes for the internal conversion to complete. This parameter is found in the data sheet table. Always use the largest time for this parameter as this gives a worst case for the acquisition period. |
VREF | The ideal value for the voltage reference. If the Vref_ideal pin is not connected, it will float to this value. This parameter is also the specified reference voltage at which the IREF average current is defined. |
FSAMPL | The sampling rate at which the IREF average is defined. |
N | The resolution of the device which is used to generate N current transient pulses on the reference during the conversion cycle. |
IREF | The average value of the reference current. Typically, this value is in the hundreds of microamps, whereas the transient amplitude is in milliamps. This parameter works in conjunction with VREF, FSAMPL, and N to set the reference transients. For example, the ADS8860 is a 16-bit device with A 5-V reference that draws an average of 300 μA at 1 MHz. Its parameters are: IREF = 300U, N = 16, FSAMP = 1 Meg, and VREF = 5 V. |
IREF_ON | IREF_ON turns on or off the voltage reference transients. IREF_ON = 1 turns on the transients, and IREF_OFF turns off the transients. |
IL | The input leakage current of the ADC analog input pins. This parameter is found in the data sheet table. Typical values for this current range from 1 pA to 1 μA. |
EG | The gain error specification as a percentage of full-scale range. |
EO | The offset error specification in volts. Typical values range from microvolts to millivolts. |
NLF | The flicker noise density in nV/√Hz specified as frequency FLW. If the device does not have a specification for flicker noise, set this number equal to NVR and set FLW to a low value (0.01 Hz). |
NVR | The broadband noise density nV/√Hz. Derive this value based on the SNR or transition noise of the device (see section Section 2.5). |
FLW | The frequency that the flicker noise density (NLF) is defined at in Hertz. |
CREF | The reference capacitance. This capacitance sets the cutoff of the filter that the reference noise is applied to. Typically, this value is set to 0.25 CSH. |