SBAS654G June 2014 – January 2020
PRODUCTION DATA.
- 1 Features
- 2 Applications
- 3 Description
- 4 Revision History
- 5 Device Comparison Table
- 6 Pin Configuration and Functions
-
7 Specifications
- 7.1 Absolute Maximum Ratings
- 7.2 ESD Ratings
- 7.3 Recommended Operating Conditions
- 7.4 Thermal Information
- 7.5 Power Ratings
- 7.6 Insulation Specifications
- 7.7 Safety-Related Certifications
- 7.8 Safety Limiting Values
- 7.9 Electrical Characteristics: AMC1305M05
- 7.10 Electrical Characteristics: AMC1305x25
- 7.11 Switching Characteristics
- 7.12 Insulation Characteristics Curves
- 7.13 Typical Characteristics
- 8 Detailed Description
- 9 Application and Implementation
- 10Power Supply Recommendations
- 11Layout
- 12Device and Documentation Support
- 13Mechanical, Packaging, and Orderable Information
7.9 Electrical Characteristics: AMC1305M05
All minimum and maximum specifications at TA = –40°C to +125°C, AVDD = 4.5 V to 5.5 V, DVDD = 3.0 V to 5.5 V, AINP = –50 mV to 50 mV, AINN = 0 V, and sinc3 filter with OSR = 256, unless otherwise noted. Typical values are at TA = 25°C, CLKIN = 20 MHz, AVDD = 5.0 V, and DVDD = 3.3 V.| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| ANALOG INPUTS | ||||||
| VClipping | Maximum differential voltage input range
(AINP-AINN) |
±62.5 | mV | |||
| FSR | Specified linear full-scale range
(AINP-AINN) |
–50 | 50 | mV | ||
| VCM | Operating common-mode input range | –0.032 | AVDD – 2 | V | ||
| CID | Differential input capacitance | 2 | pF | |||
| IIB | Input current | Inputs shorted to AGND | –97 | –72 | -57 | μA |
| RID | Differential input resistance | 5 | kΩ | |||
| IOS | Input offset current | ±5 | nA | |||
| CMTI | Common-mode transient immunity | 15 | kV/μs | |||
| CMRR | Common-mode rejection ratio | fIN = 0 Hz,
VCM min ≤ VIN ≤ VCM max |
–104 | dB | ||
| fIN from 0.1 Hz to 50 kHz,
VCM min ≤ VIN ≤ VCM max |
–75 | |||||
| BW | Input bandwidth | 800 | kHz | |||
| DC ACCURACY | ||||||
| DNL | Differential nonlinearity | Resolution: 16 bits | –0.99 | 0.99 | LSB | |
| INL | Integral nonlinearity(3) | Resolution: 16 bits | –4 | ±1.5 | 4 | LSB |
| EO | Offset error | Initial, at 25°C | –50 | ±2.5 | 50 | µV |
| TCEO | Offset error thermal drift(1) | –1.3 | 1.3 | μV/°C | ||
| EG | Gain error | Initial, at 25°C | –0.3% | –0.02% | 0.3% | |
| TCEG | Gain error thermal drift(2) | –40 | ±20 | 40 | ppm/°C | |
| PSRR | Power-supply rejection ratio | VAVDD from 4.5 to 5.5V, at dc | 105 | dB | ||
| AC ACCURACY | ||||||
| SNR | Signal-to-noise ratio | fIN = 1 kHz | 76 | 81 | dB | |
| SINAD | Signal-to-noise + distortion | fIN = 1 kHz | 76 | 81 | dB | |
| THD | Total harmonic distortion | fIN = 1 kHz | –90 | –83 | dB | |
| SFDR | Spurious-free dynamic range | fIN = 1 kHz | 83 | 92 | dB | |
| DIGITAL INPUTS/OUTPUTS | ||||||
| External Clock | ||||||
| fCLKIN | Input clock frequency | 5 | 20 | 20.1 | MHz | |
| DutyCLKIN | Duty cycle | 5 MHz ≤ fCLKIN ≤ 20.1 MHz | 40% | 50% | 60% | |
| CMOS Logic Family, CMOS with Schmitt-Trigger | ||||||
| IIN | Input current | DGND ≤ VIN ≤ DVDD | –1 | 1 | μA | |
| CIN | Input capacitance | 5 | pF | |||
| VIH | High-level input voltage | 0.7 × DVDD | DVDD + 0.3 | V | ||
| VIL | Low-level input voltage | –0.3 | 0.3 × DVDD | V | ||
| CLOAD | Output load capacitance | fCLKIN = 20 MHz | 30 | pF | ||
| VOH | High-level output voltage | IOH = –20 µA | DVDD – 0.1 | V | ||
| IOH = –4 mA | DVDD – 0.4 | |||||
| VOL | Low-level output voltage | IOL = 20 µA | 0.1 | V | ||
| IOL = 4 mA | 0.4 | |||||
| POWER SUPPLY | ||||||
| AVDD | High-side supply voltage | 4.5 | 5.0 | 5.5 | V | |
| IAVDD | High-side supply current | 6.5 | 8.2 | mA | ||
| PAVDD | High-side power dissipation | 32.5 | 45.1 | mW | ||
| DVDD | Controller-side supply voltage | 3.0 | 3.3 | 5.5 | V | |
| IDVDD | Controller-side supply current | 3.0 V ≤ DVDD ≤ 3.6 V | 2.7 | 4.0 | mA | |
| 4.5 V ≤ DVDD ≤ 5.5 V | 3.2 | 5.5 | ||||
| PDVDD | Controller-side power dissipation | 3.0 V ≤ DVDD ≤ 3.6 V | 8.9 | 14.4 | mW | |
| 4.5 V ≤ DVDD ≤ 5.5 V | 16.0 | 30.3 | ||||
(1) Offset error drift is calculated using the box method as described by the following equation: 
(2) Gain error drift is calculated using the box method as described by the following equation: 
(3) Integral nonlinearity is defined as the maximum deviation from a straight line passing through the end-points of the ideal ADC transfer function expressed as number of LSBs or as a percent of the specified linear full-scale range FSR.